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Complex permittivity measurements of extremely low loss dielectric materials using whispering gallery modes

By: Geyer, R.G.; Tobar, M.; Abramowicz, A.; Derzakowski, K.; Krupka, J.;

1997 / IEEE / 0-7803-3814-6

Description

This item was taken from the IEEE Periodical ' Complex permittivity measurements of extremely low loss dielectric materials using whispering gallery modes ' Whispering-gallery modes are used for very accurate complex permittivity measurements of both isotropic and uniaxially anisotropic dielectric materials. A mode-matching technique is used to find the relationship between the complex permittivity, resonant frequency, and the dimensions of a resonant structure. The total uncertainty in permittivity is smaller than 0.05 percent and is limited principally by uncertainty in sample dimensions.