Your Search Results

Use this resource - and many more! - in your textbook!

AcademicPub holds over eight million pieces of educational content for you to mix-and-match your way.

Experience the freedom of customizing your course pack with AcademicPub!
Not an educator but still interested in using this content? No problem! Visit our provider's page to contact the publisher and get permission directly.

A coplanar waveguide probe with applications to thin film dielectric measurements

By: Smith, K.; Laskar, J.; Seltmann, E.W.; Gleason, R.;

1995 / IEEE / 0-7803-3034-X

Description

This item was taken from the IEEE Periodical ' A coplanar waveguide probe with applications to thin film dielectric measurements ' A novel approach to thin film dielectric measurements at microwave and millimeter wave frequencies is investigated using a coplanar waveguide (CPW) probe. Using the spectral-domain technique, an admittance model describing the CPW thin film interface system is determined for reflection measurement techniques, and delay measurement analysis is performed for thru measurement techniques. To validate the model, an error analysis is performed with 3D electromagnetic simulators and CPW S-parameter data from materials with known dielectric properties.