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Power MOSFETs hardened for single event effects (SEE) in space

By: Carley, D.R.; Burton, D.I.; Titus, J.L.; Wheatley, C.F.;

1995 / IEEE / 0-7803-3093-5

Description

This item was taken from the IEEE Periodical ' Power MOSFETs hardened for single event effects (SEE) in space ' Measurements are presented for the single event effects and total dose responses of the newly introduced Harris ""FS"" series of space hardened power MOSFETs. The hardness appears to offer a breakthrough for commercial space requirements.