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Power MOSFETs hardened for single event effects (SEE) in space
1995 / IEEE / 0-7803-3093-5
This item was taken from the IEEE Periodical ' Power MOSFETs hardened for single event effects (SEE) in space ' Measurements are presented for the single event effects and total dose responses of the newly introduced Harris ""FS"" series of space hardened power MOSFETs. The hardness appears to offer a breakthrough for commercial space requirements.
Single Event Effects
Total Dose Responses
Space Hardened Devices
Commercial Space Requirements
Radiation Hardening (electronics)
Space Vehicle Electronics
Harris Fs Series