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Efficient image generation for EO system simulation
By: Webb, D.L.; Hung, L.L.; Elliott, D.F.;
1994 / IEEE / 0-8186-6405-3
Description
This item was taken from the IEEE Periodical ' Efficient image generation for EO system simulation ' Efficient image generation techniques for electro-optical (EO) system simulation are presented. The techniques reduce computation time by orders of magnitude so Monte Carlo simulations become practical. Ray tracing to project signals onto a focal plane and convolution to blur projected images are time consuming so methods that minimize this time are most important. Methods for efficient simulation of detector characteristics, including noise, are also described.<
Related Topics
Image Processing
Convolution
Ray Tracing
Monte Carlo Methods
Electro-optical Sensors
Eo System Simulation
Image Generation
Electro-optical System Simulation
Monte Carlo Simulations
Focal Plane
Convolution
Projected Images
Detector Characteristics
Noise
Image Generation
Detectors
Computational Modeling
Background Noise
Ray Tracing
Optical Noise
Equations
Convolution
Electrooptic Devices
Sensor Phenomena And Characterization
Sensors
Electro-optical Devices
Simulation
Engineering
Ray Tracing