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Optimal multiple syndrome probabilistic diagnosis

By: Shin, K.G.; Lee, S.;

1990 / IEEE / 0-8186-2051-X

Description

This item was taken from the IEEE Periodical ' Optimal multiple syndrome probabilistic diagnosis ' The authors discuss the distributed self-diagnosis of a multiprocessor/multicomputer system based on interprocessor tests with imperfect fault coverage (thus also permitting intermittently fault processors). It is shown that by using multiple fault syndromes, it is possible to achieve significantly better diagnosis than by using a single fault syndrome, even when the amount of time devoted to testing is the same. The authors derive a multiple syndrome diagnosis algorithm that is optimal in the level of diagnostic accuracy achieved (among diagnosis algorithms of a certain type to be defined) and produces good results even with sparse interconnection networks and interprocessor test with low fault coverage. Furthermore, they prove upper and lower bounds are proved on the number of fault syndromes required to produce asymptotically a 100% correct diagnostic as N to infinity . Their solution and another multiple syndrome diagnosis solution by D. Fussell and S. Rangarajan are evaluated both analytically and with simulations.<>