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Total Stuck-at-Fault Testing by Circuit Transformation

By: Lipton, R.J.; LaPaugh, A.S.;

1983 / IEEE / 0-8186-0026-8

Description

This item was taken from the IEEE Periodical ' Total Stuck-at-Fault Testing by Circuit Transformation ' We present a new approach to the production testing of VLSI circuits. By using very structured design for testability, we achieve 100% single stuck-at fault coverage with under 20 test vectors and no search. The approach also detects most multiple faults.