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Phase-Noise Measurement System for the Terahertz-Band
By: Hati, A.; DeSalvo, J.A.; Howe, D.A.; Nelson, C.;
2012 / IEEE
Description
This item was taken from the IEEE Periodical ' Phase-Noise Measurement System for the Terahertz-Band ' We present phase-noise measurements in support of terahertz electronics. By combining even-harmonic mixers with a 2.5 GHz frequency comb, we achieve a phase-noise measurement system in waveguide (WR1.5) by use of cross-spectral and digital phase-noise measurement techniques. At 670 GHz an upper bound of this system's noise floor is found to be -20, -40, and -60 dBc/Hz at 1, 100, and 10000 Hz offsets, respectively. In addition, a commercial, low-phase-noise, 670 GHz source is measured at offset frequencies from 0.1 Hz to 1 MHz.
Related Topics
Phase-noise Measurement System
Terahertz-band
Terahertz Electronics
Even-harmonic Mixers
Frequency Comb
Low-phase-noise
Frequency 2.5 Ghz
Frequency 670 Ghz
Submillimeter Wave Measurements
Frequency Control
Mixers
Noise Measurement
Phase Noise
Metrology
Submillimeter Wave Measurements
Frequency Control
Harmonic Mixers
Metrology
Phase Noise
Frequency 0.1 Hz To 1 Mhz
Millimetre Wave Mixers
Phase Noise
Fields, Waves And Electromagnetics
Engineering
Digital Phase-noise Measurement Techniques
