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Stability of Injection of a Subnanosecond High-Current Electron Beam and Dynamic Effects Within Its Rise Time

By: Sharypov, K.A.; Reutova, A.G.; Yalandin, M.I.; Mesyats, G.A.; Shpak, V.G.; Rostov, V.V.; Ul'masculov, M.R.; Shunailov, S.A.;

2010 / IEEE

Description

This item was taken from the IEEE Periodical ' Stability of Injection of a Subnanosecond High-Current Electron Beam and Dynamic Effects Within Its Rise Time ' The stability of the injection of short electron beams and the dynamic processes that occur during their transport were experimentally studied. Beams of energy 200-300 keV, current of 1-1500 A, and duration of 0.05-3 ns with a current rise time of 30-300 ps were formed in a cold-cathode electrode gap. The distribution of the accelerating electric field was highly nonuniform. The cases of vacuum and air insulation of the electron diode were considered. The shortest beams with currents of a few amperes were generated in the mode of continuous acceleration of electrons in atmospheric air. For measuring beam currents, special collector probes were used which ensured a picosecond resolution.