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Limiting Upset Cross Sections of SEU Hardened SOI SRAMs

By: Campbell, A.; Hughes, H.L.; Kirchner, G.; Golke, K.W.; Ziegler, J.F.; Brewster, N.; Liu, H.Y.; Liu, M.S.; Nelson, D.;

2006 / IEEE

Description

This item was taken from the IEEE Periodical ' Limiting Upset Cross Sections of SEU Hardened SOI SRAMs ' This paper discusses the practical limits of proton and heavy ion induced single event upset cross sections in SEU hardened deep submicron SOI SRAMs. Non-conventional ""double-hit"" mechanisms are hypothesized to explain test results