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Dielectric characterization of low-loss materials a comparison of techniques

By: Jones, C.A.; Janezic, M.D.; Grosvenor, J.H., Jr.; Geyer, R.G.; Riddle, B.; Krupka, J.; Baker-Jarvis, J.; Weil, C.M.;

1998 / IEEE

Description

This item was taken from the IEEE Periodical ' Dielectric characterization of low-loss materials a comparison of techniques ' Measurements on low-loss materials using closed and open cavity resonators, and dielectric resonator methods are presented. Results indicate that consistent measurement results can be obtained with a number of well-characterized fixtures. Uncertainties associated with each method are addressed. Measurements also were performed on materials used in previous intercomparisons.