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Dielectric characterization of low-loss materials a comparison of techniques
By: Jones, C.A.; Janezic, M.D.; Grosvenor, J.H., Jr.; Geyer, R.G.; Riddle, B.; Krupka, J.; Baker-Jarvis, J.; Weil, C.M.;
1998 / IEEE
Description
This item was taken from the IEEE Periodical ' Dielectric characterization of low-loss materials a comparison of techniques ' Measurements on low-loss materials using closed and open cavity resonators, and dielectric resonator methods are presented. Results indicate that consistent measurement results can be obtained with a number of well-characterized fixtures. Uncertainties associated with each method are addressed. Measurements also were performed on materials used in previous intercomparisons.
Related Topics
Closed Cavity Resonators
Open Cavity Resonators
Dielectric Resonator Methods
Dielectric Materials
Dielectric Measurements
Fixtures
Permittivity Measurement
Crystalline Materials
Polarization
Electric Variables Measurement
Anisotropic Magnetoresistance
Air Gaps
Frequency
Low-loss Materials
Dielectric Characterization
Cavity Resonators
Dielectric Resonators
Dielectric Measurement
Measurement Errors
Engineered Materials, Dielectrics And Plasmas
Fields, Waves And Electromagnetics
Engineering
Measurement Uncertainties
