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Comparative SEU sensitivities to relativistic heavy ions

By: Hansel, S.J.; Crawford, K.B.; Crain, W.R.; Crain, S.H.; Koga, R.;

1998 / IEEE


This item was taken from the IEEE Periodical ' Comparative SEU sensitivities to relativistic heavy ions ' SEU sensitivity of microcircuits to relativistic heavy ions is compared to that measured with low energy ions of comparable LET values. Multiple junction charge collection in a complex circuit seems to mask the effect of varying charge generations due to different ion track structures. Heavy ions at sub-relativistic speeds may generate nuclear fragments, sometimes resulting in SEUs.