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Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions

By: LaLumondiere, S.D.; Pinkerton, S.D.; Moss, S.C.; Crain, W.R.; Maher, M.C.; Penzin, S.H.; Koga, R.; Crawford, K.B.;

1997 / IEEE

Description

This item was taken from the IEEE Periodical ' Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions ' The single event upset (SEU) sensitivity of certain types of linear microcircuits is strongly affected by bias conditions. For these devices, a model of upset mechanism and a method for SEU control have been suggested.