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Heavy ion and proton induced single event transients in comparators

By: Miyahira, T.F.; Coss, J.R.; Nichols, D.K.; Schwartz, H.R.;

1996 / IEEE

Description

This item was taken from the IEEE Periodical ' Heavy ion and proton induced single event transients in comparators ' This paper presents a display of heavy-ion- and proton-induced single event transients for three comparators. The transient vital signs are serious: low LET threshold, very high voltage amplitude and extended pulse duration (microsecs.).