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Observation of single event upsets in analog microcircuits
By: Koga, R.; Crain, W.R.; Crawford, K.B.; Hansel, S.J.; LaLumondiere, S.; Mayer, D.C.; Moss, S.C.; Pinkerton, S.D.;
1993 / IEEE
This item was taken from the IEEE Periodical ' Observation of single event upsets in analog microcircuits ' Selected analog devices were tested for heavy-ion-induced single event upset (SEU). The results of these tests are presented, likely upset mechanisms are discussed, and standards for the characterization of analog upsets are suggested. The OP-15 operational amplifier, which was found to be susceptible to SEU in the laboratory, has also experienced upset in space. Possible strategies for mitigating the occurrence of analog SEUs in space are also discussed.<
Heavy Ion Induced Seu
Single Event Upsets
Op-15 Operational Amplifier
Single Event Transient
Single Event Upset
Mos Integrated Circuits
Linear Integrated Circuits
Ion Beam Effects
Integrated Circuit Testing
Radiation Hardening (electronics)