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A time-domain method for characterizing the reflection coefficient of absorbing materials from 30 to 1000 MHz

By: Tofani, S.; Kanda, M.; Ondrejka, A.;

1991 / IEEE

Description

This item was taken from the IEEE Periodical ' A time-domain method for characterizing the reflection coefficient of absorbing materials from 30 to 1000 MHz ' A wideband time-domain reflectometer is used to evaluate the reflection characteristics of RF/microwave absorbers. The reflectometer uses an array of two identical broadband antennas (both transmitting and receiving). The two antennas are used in a difference mode to remove the undesired signals and enhance the small reflections being measured. Using this technique, one can separate the target surface reflection from those generated outside the target area. The bandwidth of the pulses is 30 to 1000 MHz, and the reflection coefficient is measured over this range. The method has been used to characterize the reflectivity of three different types of absorber placed in an anechoic chamber. The results are reported together with a discussion of the main sources of errors.<>