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Author: Yoshimasu, T.
Results
1991 / IEEE / 0-7803-0196-X
By: Matsumoto, N.; Sakuno, K.; Yoshimasu, T.; Tomita, T.; Tsukao, T.; Suematsu, E.;
By: Matsumoto, N.; Sakuno, K.; Yoshimasu, T.; Tomita, T.; Tsukao, T.; Suematsu, E.;
1992 / IEEE / 0-7803-0677-5
By: Nakagawa, Y.; Tsukao, T.; Matsumoto, N.; Yoshimasu, T.; Sakuno, K.; Tomita, T.; Suematsu, E.;
By: Nakagawa, Y.; Tsukao, T.; Matsumoto, N.; Yoshimasu, T.; Sakuno, K.; Tomita, T.; Suematsu, E.;
1993 / IEEE / 0-7803-1322-4
By: Twynam, J.K.; Akagi, M.; Hara, S.; Tomita, T.; Miyajima, T.; Yoshimasu, T.; Shinozaki, T.; Tsuji, H.; Sato, H.; Yagura, M.; Kinosada, T.; Yoshikawa, K.; Tanba, N.; Nambu, N.;
By: Twynam, J.K.; Akagi, M.; Hara, S.; Tomita, T.; Miyajima, T.; Yoshimasu, T.; Shinozaki, T.; Tsuji, H.; Sato, H.; Yagura, M.; Kinosada, T.; Yoshikawa, K.; Tanba, N.; Nambu, N.;
1994 / IEEE / 0-7803-1418-2
By: Sakuno, K.; Hara, S.; Yoshimasu, T.; Hasegawa, M.; Miyauchi, M.; Sato, H.; Akagi, M.;
By: Sakuno, K.; Hara, S.; Yoshimasu, T.; Hasegawa, M.; Miyauchi, M.; Sato, H.; Akagi, M.;
2002 / IEEE / 0-7803-7239-5
By: Yoshimasu, T.; Tanba, N.; Fukumi, M.; Adan, A.O.; Higashi, K.; Hayashi, M.;
By: Yoshimasu, T.; Tanba, N.; Fukumi, M.; Adan, A.O.; Higashi, K.; Hayashi, M.;
2002 / IEEE / 0-7803-7246-8
By: Hayashi, M.; Yoshimasu, T.; Tanba, N.; Fukumi, M.; Adan, A.O.; Higashi, K.;
By: Hayashi, M.; Yoshimasu, T.; Tanba, N.; Fukumi, M.; Adan, A.O.; Higashi, K.;
2005 / IEEE / 0-7803-9015-6
By: Haiwen Liu; Xiaowei Sun; Zhengfan Li; Jia Chen; Kurachi, S.; Yoshimasu, T.;
By: Haiwen Liu; Xiaowei Sun; Zhengfan Li; Jia Chen; Kurachi, S.; Yoshimasu, T.;
2005 / IEEE / 0-7803-9538-7
By: Jia Chen; Yong Ju Suh; Yoshimasu, T.; Haiwen Liu; Shimin Shen; Kurachi, S.;
By: Jia Chen; Yong Ju Suh; Yoshimasu, T.; Haiwen Liu; Shimin Shen; Kurachi, S.;
2006 / IEEE / 0-7803-9584-0
By: Haiwen Liu; WeiLiang Hu; Yoshimasu, T.; Jia Chen; Yonemura, K.; Itoh, N.;
By: Haiwen Liu; WeiLiang Hu; Yoshimasu, T.; Jia Chen; Yonemura, K.; Itoh, N.;
2011 / IEEE / 978-1-4244-8415-7
By: YongJu Shu; Sun Jiangtao; Qing Liu; Yoshimasu, T.; Itoh, N.; Horie, K.;
By: YongJu Shu; Sun Jiangtao; Qing Liu; Yoshimasu, T.; Itoh, N.; Horie, K.;
2011 / IEEE / 978-7-308-08555-7
By: Yoshimasu, T.; Hai-wen Liu; Qing Liu; Shi-hai He; Jiang-tao Sun;
By: Yoshimasu, T.; Hai-wen Liu; Qing Liu; Shi-hai He; Jiang-tao Sun;