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Author: Wang, J.
Results
2012 / IEEE
By: Jing-Lin Kuo; Huei Wang; Ting-Yi Huang; Yi-Long Chang; Yi-Keng Hsieh; Pen-Jui Peng; I-Chih Chang; Tzung-Chuen Tsai; Kun-Yao Kao; Wei-Yuan Hsiung; Wang, J.; Hsu, Y.A.; Kun-You Lin; Hsin-Chia Lu; Yi-Cheng Lin; Liang-Hung Lu; Tian-Wei Huang; Ruey-Beei Wu; Yi-Fong Lu;
By: Jing-Lin Kuo; Huei Wang; Ting-Yi Huang; Yi-Long Chang; Yi-Keng Hsieh; Pen-Jui Peng; I-Chih Chang; Tzung-Chuen Tsai; Kun-Yao Kao; Wei-Yuan Hsiung; Wang, J.; Hsu, Y.A.; Kun-You Lin; Hsin-Chia Lu; Yi-Cheng Lin; Liang-Hung Lu; Tian-Wei Huang; Ruey-Beei Wu; Yi-Fong Lu;
2012 / IEEE
By: Zhang, Y.Y.; Yan, Q.; Yu, J.; Chen, Y.; Wu, K.; Duan, R.; Li, J.M.; Wei, T.B.; Zeng, Y.; Wang, J.;
By: Zhang, Y.Y.; Yan, Q.; Yu, J.; Chen, Y.; Wu, K.; Duan, R.; Li, J.M.; Wei, T.B.; Zeng, Y.; Wang, J.;
2011 / IEEE / 978-1-4244-9949-6
By: Yamashita, T.; Basker, V.S.; Standaert, T.; Yeh, C.-C.; Yamamoto, T.; Maitra, K.; Lin, C.-H.; Faltermeier, J.; Kanakasabapathy, S.; Wang, M.; Sunamura, H.; Jagannathan, H.; Reznicek, A.; Schmitz, S.; Inada, A.; Wang, J.; Adhikari, H.; Berliner, N.; Lee, K.-L.; Kulkarni, P.; Zhu, Y.; Kumar, A.; Bryant, A.; Wu, S.; Kanarsky, T.; Cho, J.; Mclellan, E.; Holmes, S.J.; Johnson, R.C.; Levin, T.; Demarest, J.; Li, J.; Oldiges, P.; Arnold, J.; Colburn, M.; Hane, M.; Mcherron, D.; Paruchuri, V.K.; Doris, B.; Miller, R.J.; Bu, H.; Khare, M.; O'Neill, J.; Leobandung, E.;
By: Yamashita, T.; Basker, V.S.; Standaert, T.; Yeh, C.-C.; Yamamoto, T.; Maitra, K.; Lin, C.-H.; Faltermeier, J.; Kanakasabapathy, S.; Wang, M.; Sunamura, H.; Jagannathan, H.; Reznicek, A.; Schmitz, S.; Inada, A.; Wang, J.; Adhikari, H.; Berliner, N.; Lee, K.-L.; Kulkarni, P.; Zhu, Y.; Kumar, A.; Bryant, A.; Wu, S.; Kanarsky, T.; Cho, J.; Mclellan, E.; Holmes, S.J.; Johnson, R.C.; Levin, T.; Demarest, J.; Li, J.; Oldiges, P.; Arnold, J.; Colburn, M.; Hane, M.; Mcherron, D.; Paruchuri, V.K.; Doris, B.; Miller, R.J.; Bu, H.; Khare, M.; O'Neill, J.; Leobandung, E.;
2011 / IEEE / 978-1-4244-9949-6
By: Yang, S.; Ying Chen; Deshmukh, P.; Yandong Gao; Ping Liu; Wang, J.; Yeap, G.; Sani, M.; Han, M.; Sei Seung Yoon; Garg, M.; Abu-Rahma, M.; Terzioglu, E.; Lixin Ge; Wing Sy;
By: Yang, S.; Ying Chen; Deshmukh, P.; Yandong Gao; Ping Liu; Wang, J.; Yeap, G.; Sani, M.; Han, M.; Sei Seung Yoon; Garg, M.; Abu-Rahma, M.; Terzioglu, E.; Lixin Ge; Wing Sy;
2011 / IEEE / 978-1-4244-9563-4
By: Weller, T.; Sakamuri, V.; Frolik, J.; Davidova, R.; Dewney, J.; Nassar, I.; Wang, J.;
By: Weller, T.; Sakamuri, V.; Frolik, J.; Davidova, R.; Dewney, J.; Nassar, I.; Wang, J.;
2011 / IEEE / 978-1-61284-777-1
By: Junkin, M.; Pak Kin Wong; Jin-Woo Kim; Yeow, J.T.W.; Huang, A.; Yong-Sang Kim; Jha, S.K.; You-Cheol Jang; Mai, J.D.H.; Breaux, J.; Baudoin, M.; Brunet, P.; Bou-Matar, O.; Zoueshtiagh, F.; Friend, J.; Yeo, L.Y.; Versluis, M.; Renaudin, A.; Chabot, V.; Grondin, E.; Aimez, V.; Charette, P.G.; Lal, A.; Schmidt, H.; Kong, X.H.; Deneke, C.; Schmidt, O.G.; Wang, J.; Yi-Kuen Lee; Dean Ho; Yen-Wen Lu; Chen, M.; Dongping Zhan; Lianhuan Han; Liming Jiang; Kang Shi; Jianzhang Zhou; Zhao-Wu Tian; Zhong-Qun Tian; Ping-Hei Chen; Tsung-Han Tsai; Jian-Fu Shih; Ying-Zong Juang; Shuai Zhang; Shuying Cheng; Huilan Liu; Lishuang Feng; Zhichao Jiao; Li, R.; Jaw-Ji Tsai; He-Tsing Chen; Yu-Ta Lin; Gou-Jen Wang; Shiyuan Liu; Wen-Pin Shih; Yao-Joe Yang; Jung-Tang Huang; Ming-Jhe Lin; Hou-Jun Hsu; Ting-Chiang Tsai; Haixiong Ge; Zhiwei Li; Changsheng Yuan; Minghui Lu; Yanfeng Chen; Wei Wu; Qiangfei Xia; Qing Zhou; Wei Wang; Wengang Wu; Zhihong Li; Lei Liu; Wei Tang; Baixiang Zheng; Haixia Zhang; Thundat, Z.H.T.; Wun-Jie Chen; Wen-Hsin Hsieh; Pan, C.T.; Junbo Wang; Sheng Tu; Lei Liu; Deyong Chen; Xin Zhao; Xin Li; Guizhang Lu; Ray-Hua Horng; Yi Chiu; Che-Hsin Lin; Da-Jeng Yao; Hocheng, H.; Hsu, W.H.; Zhaoying Zhou; Xing Yang; Jiaorong Fan; Rong Zhu; Yeh, J.A.; Yeh, C.G.T.; Chih-Cheng Yang; Chung-Yao Yang; Zewen Liu; Rong Zhang; Cangran Guo; Jian Qin; Hao Tian; Weihua Si; Taihong Wang;
By: Junkin, M.; Pak Kin Wong; Jin-Woo Kim; Yeow, J.T.W.; Huang, A.; Yong-Sang Kim; Jha, S.K.; You-Cheol Jang; Mai, J.D.H.; Breaux, J.; Baudoin, M.; Brunet, P.; Bou-Matar, O.; Zoueshtiagh, F.; Friend, J.; Yeo, L.Y.; Versluis, M.; Renaudin, A.; Chabot, V.; Grondin, E.; Aimez, V.; Charette, P.G.; Lal, A.; Schmidt, H.; Kong, X.H.; Deneke, C.; Schmidt, O.G.; Wang, J.; Yi-Kuen Lee; Dean Ho; Yen-Wen Lu; Chen, M.; Dongping Zhan; Lianhuan Han; Liming Jiang; Kang Shi; Jianzhang Zhou; Zhao-Wu Tian; Zhong-Qun Tian; Ping-Hei Chen; Tsung-Han Tsai; Jian-Fu Shih; Ying-Zong Juang; Shuai Zhang; Shuying Cheng; Huilan Liu; Lishuang Feng; Zhichao Jiao; Li, R.; Jaw-Ji Tsai; He-Tsing Chen; Yu-Ta Lin; Gou-Jen Wang; Shiyuan Liu; Wen-Pin Shih; Yao-Joe Yang; Jung-Tang Huang; Ming-Jhe Lin; Hou-Jun Hsu; Ting-Chiang Tsai; Haixiong Ge; Zhiwei Li; Changsheng Yuan; Minghui Lu; Yanfeng Chen; Wei Wu; Qiangfei Xia; Qing Zhou; Wei Wang; Wengang Wu; Zhihong Li; Lei Liu; Wei Tang; Baixiang Zheng; Haixia Zhang; Thundat, Z.H.T.; Wun-Jie Chen; Wen-Hsin Hsieh; Pan, C.T.; Junbo Wang; Sheng Tu; Lei Liu; Deyong Chen; Xin Zhao; Xin Li; Guizhang Lu; Ray-Hua Horng; Yi Chiu; Che-Hsin Lin; Da-Jeng Yao; Hocheng, H.; Hsu, W.H.; Zhaoying Zhou; Xing Yang; Jiaorong Fan; Rong Zhu; Yeh, J.A.; Yeh, C.G.T.; Chih-Cheng Yang; Chung-Yao Yang; Zewen Liu; Rong Zhang; Cangran Guo; Jian Qin; Hao Tian; Weihua Si; Taihong Wang;
2011 / IEEE / 978-986-02-8974-9
By: Wang, J.; Ji-hung Chang; Jyun-Sian Liou; Chun-Chin Tsai; Shun-Yuan Huang; Wei-Chih Cheng; Wood-Hi Cheng;
By: Wang, J.; Ji-hung Chang; Jyun-Sian Liou; Chun-Chin Tsai; Shun-Yuan Huang; Wei-Chih Cheng; Wood-Hi Cheng;
2011 / IEEE / 978-986-02-8974-9
By: Jyun-Sian Liou; Cheng, W.-H.; Wang, J.; Jin-Kai Chang; Chun-Chin Tsai; Gi-Hung Cheng; Shun-Yuan Huang; Wei-Chih Cheng;
By: Jyun-Sian Liou; Cheng, W.-H.; Wang, J.; Jin-Kai Chang; Chun-Chin Tsai; Gi-Hung Cheng; Shun-Yuan Huang; Wei-Chih Cheng;
2011 / IEEE / 978-986-02-8974-9
By: Ta-Lung Chou; Wei-Lun Wang; Wang, J.; Chun-Nien Liu; Hsin-Hui Kuo; Yi-Chung Huang; Kuei-Ming Chu; Wood-Hi Cheng; Sheng-Lung Huang;
By: Ta-Lung Chou; Wei-Lun Wang; Wang, J.; Chun-Nien Liu; Hsin-Hui Kuo; Yi-Chung Huang; Kuei-Ming Chu; Wood-Hi Cheng; Sheng-Lung Huang;
2011 / IEEE / 978-986-02-8974-9
By: Cheng, W.-H.; Yung Sing Tseng; Wang, J.; Wei-Lun Wang; Yu-Hang Juang;
By: Cheng, W.-H.; Yung Sing Tseng; Wang, J.; Wei-Lun Wang; Yu-Hang Juang;
2011 / IEEE / 978-986-02-8974-9
By: Yu-Chia Chen; Feng-Hsi Shen; Wang, J.; Chih-Wei Huang; Yung-Sing Tseng;
By: Yu-Chia Chen; Feng-Hsi Shen; Wang, J.; Chih-Wei Huang; Yung-Sing Tseng;
2011 / IEEE / 978-1-4244-8418-8
By: Miranda, V.; Keko, H.; Bessa, R.J.; Sumaili, J.; Botterud, A.; Wang, J.; Zhou, Z.; Valenzuela, J.;
By: Miranda, V.; Keko, H.; Bessa, R.J.; Sumaili, J.; Botterud, A.; Wang, J.; Zhou, Z.; Valenzuela, J.;
2011 / IEEE / 978-1-4244-8418-8
By: Bessa, R.J.; Zhou, Z.; Wang, J.; Botterud, A.; Miranda, V.; Mendes, J.;
By: Bessa, R.J.; Zhou, Z.; Wang, J.; Botterud, A.; Miranda, V.; Mendes, J.;
2011 / IEEE / 978-1-4577-1002-5
By: Keko, H.; Bessa, R.J.; Wang, J.; Zhou, Z.; Botterud, A.; Miranda, V.; Sumaili, J.;
By: Keko, H.; Bessa, R.J.; Wang, J.; Zhou, Z.; Botterud, A.; Miranda, V.; Sumaili, J.;
2011 / IEEE / 978-1-4577-0509-0
By: Luhmann, N.C.; Wang, J.; Barnett, L.; Baig, A.; Gamzina, D.; Jinfeng Zhao;
By: Luhmann, N.C.; Wang, J.; Barnett, L.; Baig, A.; Gamzina, D.; Jinfeng Zhao;
2011 / IEEE / 978-1-4577-1151-0
By: Wang, J.; Zhao, X.; Sun, J.; Chiu, B.; Balu, N.; Xu, J.; Chi, J.; Kerwin, W.S.; Yuan, C.;
By: Wang, J.; Zhao, X.; Sun, J.; Chiu, B.; Balu, N.; Xu, J.; Chi, J.; Kerwin, W.S.; Yuan, C.;
2011 / IEEE / 978-0-8194-8961-6
By: Grote, N.; Keil, N.; de Felipe, D.; Zhang, Z.; Brinker, W.; Zawadzki, C.; Lauermann, M.; Wang, J.; Schell, M.;
By: Grote, N.; Keil, N.; de Felipe, D.; Zhang, Z.; Brinker, W.; Zawadzki, C.; Lauermann, M.; Wang, J.; Schell, M.;
2012 / IEEE / 978-1-4673-1142-7
By: Mejia, C.; Molina, D.; Paparella, C.; Hall, C.; Wang, J.; Levitsky, A.; Van Ness, G.;
By: Mejia, C.; Molina, D.; Paparella, C.; Hall, C.; Wang, J.; Levitsky, A.; Van Ness, G.;
2012 / IEEE / 978-1-4577-1829-8
By: Zhang, B.H.; Bo, Z.Q.; Wang, X.L.; Liu, Z.Y.; Hao, Z.G.; Wang, J.; Guo, D.Y.;
By: Zhang, B.H.; Bo, Z.Q.; Wang, X.L.; Liu, Z.Y.; Hao, Z.G.; Wang, J.; Guo, D.Y.;
2012 / IEEE / 978-1-4673-1164-9
By: Katine, J.A.; Huai, Y.M.; Rahman, T.; Rowlands, G.E.; Krivorotov, I.N.; Wang, J.; Wang, K.L.; Amiri, P.K.; Langer, J.; Galatsis, K.; Jiang, H.W.; Zeng, Z.M.; Tserkovnyak, Y.; Kovalev, A.A.; Alzate, J.G.; Zhao, H.; Lyle, A.;
By: Katine, J.A.; Huai, Y.M.; Rahman, T.; Rowlands, G.E.; Krivorotov, I.N.; Wang, J.; Wang, K.L.; Amiri, P.K.; Langer, J.; Galatsis, K.; Jiang, H.W.; Zeng, Z.M.; Tserkovnyak, Y.; Kovalev, A.A.; Alzate, J.G.; Zhao, H.; Lyle, A.;
2012 / IEEE / 978-1-4673-0442-9
By: Hale, P.D.; Bieler, M.; Fuser, H.; Harper, M.; Humphreys, D.; Jargon, J.; Wang, J.; Dienstfrey, A.; Williams, D.F.;
By: Hale, P.D.; Bieler, M.; Fuser, H.; Harper, M.; Humphreys, D.; Jargon, J.; Wang, J.; Dienstfrey, A.; Williams, D.F.;
2012 / IEEE / 978-1-4673-0978-3
By: Wang, J.; Dittmann, L.; Careglio, D.; Ruepp, S.; Manolova, A. V.; Ricciardi, S.;
By: Wang, J.; Dittmann, L.; Careglio, D.; Ruepp, S.; Manolova, A. V.; Ricciardi, S.;
2013 / IEEE
By: Zhu, M.; Liu, C.; Yan, L.-S.; Yi, A.-L.; Chang, G.-K.; Ye, C.-H.; Zhang, L.; Wang, J.;
By: Zhu, M.; Liu, C.; Yan, L.-S.; Yi, A.-L.; Chang, G.-K.; Ye, C.-H.; Zhang, L.; Wang, J.;
2013 / IEEE
By: Chavez-Santiago, R.; Li, H.-B.; Balasingham, I.; Wang, J.; Takizawa, K.; Khaleghi, A.; Sayrafian-Pour, K.;
By: Chavez-Santiago, R.; Li, H.-B.; Balasingham, I.; Wang, J.; Takizawa, K.; Khaleghi, A.; Sayrafian-Pour, K.;
2013 / IEEE
By: Xu, Z.; Wang, J.; Zhang, J.; Ma, X.; Wu, W.; Xie, B.; Yu, M.; Wang, M.; Liu, Y.; Cai, J.; Liu, J.;
By: Xu, Z.; Wang, J.; Zhang, J.; Ma, X.; Wu, W.; Xie, B.; Yu, M.; Wang, M.; Liu, Y.; Cai, J.; Liu, J.;
2012 / IEEE
By: Burr, K. C.; Wang, G.-C. J.; Gagnon, D.; Wang, Z.; Ivanov, O.; Canzolino, M.; Karr, A.; Du, H.; Mann, G.; Balakrishnan, K.; Wang, J.; Li, X.; Rollet, C.; Kundro, E.; Buhin, M.; McGowan, D.; Jedrzejewski, J.;
By: Burr, K. C.; Wang, G.-C. J.; Gagnon, D.; Wang, Z.; Ivanov, O.; Canzolino, M.; Karr, A.; Du, H.; Mann, G.; Balakrishnan, K.; Wang, J.; Li, X.; Rollet, C.; Kundro, E.; Buhin, M.; McGowan, D.; Jedrzejewski, J.;
2013 / IEEE
By: Sum, C.-S.; Baykas, T.; Rahman, M.A.; Villardi, G.P.; Harada, H.; Filin, S.; Pyo, C.-W.; Song, C.; Wang, J.; Alemseged, Y.; Tran, H.N.; Lan, Z.; Sun, C.;
By: Sum, C.-S.; Baykas, T.; Rahman, M.A.; Villardi, G.P.; Harada, H.; Filin, S.; Pyo, C.-W.; Song, C.; Wang, J.; Alemseged, Y.; Tran, H.N.; Lan, Z.; Sun, C.;
2014 / IEEE
By: Wang, S. K.; Yang, X.; Gong, Z.; Liang, R.; Sun, B.; Zhao, W.; Liu, H. G.; Chang, H.; Wang, J.;
By: Wang, S. K.; Yang, X.; Gong, Z.; Liang, R.; Sun, B.; Zhao, W.; Liu, H. G.; Chang, H.; Wang, J.;
Dam-Break Flood Routing Simulation and Scale Effect Analysis Based on Virtual Geographic Environment
2015 / IEEEBy: Wang, J.; Yin, L.; Zhu, J.; Liu, Z.; Hu, Y.; Zhang, H.;