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Author: Walls, F.L.
Results
1992 / IEEE / 0-7803-0476-4
By: Riley, W.J.; Gagnepain, J.J.; Vanier, J.; Granveaud, M.; Walls, F.L.;
By: Riley, W.J.; Gagnepain, J.J.; Vanier, J.; Granveaud, M.; Walls, F.L.;
1994 / IEEE / 0-7803-1984-2
By: Lee, W.D.; Drullinger, R.E.; Shirley, J.H.; Glaze, D.J.; Walls, F.L.; Lowe, J.P.;
By: Lee, W.D.; Drullinger, R.E.; Shirley, J.H.; Glaze, D.J.; Walls, F.L.; Lowe, J.P.;
1996 / IEEE / 0-7803-3309-8
By: Mourey, M.; Boy, J.J.; Besson, R.J.; Walls, F.L.; Ferre-Pikal, E.S.;
By: Mourey, M.; Boy, J.J.; Besson, R.J.; Walls, F.L.; Ferre-Pikal, E.S.;
1996 / IEEE / 0-7803-3309-8
By: Lee, W.D.; Shirley, J.H.; Walls, F.L.; Garcia Nava, J.F.; Delgado Aramburo, M.C.;
By: Lee, W.D.; Shirley, J.H.; Walls, F.L.; Garcia Nava, J.F.; Delgado Aramburo, M.C.;
1997 / IEEE / 0-7803-3728-X
By: Walls, F.L.; Thomas, C.; Stein, S.R.; Riley, W.J.; Maleki, L.; White, J.D.; Camparo, J.C.; Vig, J.R.; Ferre-Pikal, E.S.; Cutler, L.S.;
By: Walls, F.L.; Thomas, C.; Stein, S.R.; Riley, W.J.; Maleki, L.; White, J.D.; Camparo, J.C.; Vig, J.R.; Ferre-Pikal, E.S.; Cutler, L.S.;
1997 / IEEE / 0-7803-3728-X
By: Deng, J.Q.; Walls, F.L.; Drullinger, R.E.; Jennings, D.A.; Mileti, G.;
By: Deng, J.Q.; Walls, F.L.; Drullinger, R.E.; Jennings, D.A.; Mileti, G.;
1998 / IEEE / 0-7803-4373-5
By: Drullinger, R.E.; Lee, D.; Nelson, C.; Levi, F.; Parker, T.E.; Walls, F.L.; Hollberg, L.W.; Meekhof, D.M.; Jefferts, S.R.;
By: Drullinger, R.E.; Lee, D.; Nelson, C.; Levi, F.; Parker, T.E.; Walls, F.L.; Hollberg, L.W.; Meekhof, D.M.; Jefferts, S.R.;
1998 / IEEE / 0-7803-4373-5
By: Ashby, N.; Hollberg, L.W.; Sullivan, D.B.; Jefferts, S.R.; Heavner, T.; Drullinger, R.E.; Robinson, H.G.; Walls, F.L.; Shirley, J.H.;
By: Ashby, N.; Hollberg, L.W.; Sullivan, D.B.; Jefferts, S.R.; Heavner, T.; Drullinger, R.E.; Robinson, H.G.; Walls, F.L.; Shirley, J.H.;
1998 / IEEE / 0-7803-4373-5
By: Drullinger, R.; Walls, F.L.; Shirley, J.H.; Mullen, L.; Jennings, D.A.; Nelson, C.; Hasegawa, A.; Lee, W.D.; Morikawa, T.; Kajita, M.; Kotake, N.; Fukuda, K.;
By: Drullinger, R.; Walls, F.L.; Shirley, J.H.; Mullen, L.; Jennings, D.A.; Nelson, C.; Hasegawa, A.; Lee, W.D.; Morikawa, T.; Kajita, M.; Kotake, N.; Fukuda, K.;
1999 / IEEE / 0-7803-5400-1
By: Parker, T.E.; Walls, F.L.; Mullen, L.O.; Shirley, J.H.; Jennings, D.A.; Nelson, C.; Hasegawa, A.; Drullinger, R.E.; Lee, W.D.; Morikawa, T.; Kajita, M.; Kotake, N.; Fukuda, K.;
By: Parker, T.E.; Walls, F.L.; Mullen, L.O.; Shirley, J.H.; Jennings, D.A.; Nelson, C.; Hasegawa, A.; Drullinger, R.E.; Lee, W.D.; Morikawa, T.; Kajita, M.; Kotake, N.; Fukuda, K.;
1999 / IEEE / 0-7803-5400-1
By: Robinson, H.G.; Kitching, J.; Walls, F.L.; Hollberg, L.; Zibrov, A.S.; Vukicevic, N.;
By: Robinson, H.G.; Kitching, J.; Walls, F.L.; Hollberg, L.; Zibrov, A.S.; Vukicevic, N.;
1999 / IEEE / 0-7803-5400-1
By: Ashby, N.; Klipstein, W.M.; Sullivan, D.B.; Shirley, J.H.; Robinson, H.G.; Rolston, S.; Walls, F.L.; Phillips, W.; Parker, T.E.; Meekhof, D.M.; Kitching, J.; Hollberg, L.W.; Heavner, T.P.; Jefferts, S.R.; DeMarchi, A.; Vessot, R.F.C.; Young, L.; Wu, S.; Thompson, R.; Seidel, D.; Maleki, L.;
By: Ashby, N.; Klipstein, W.M.; Sullivan, D.B.; Shirley, J.H.; Robinson, H.G.; Rolston, S.; Walls, F.L.; Phillips, W.; Parker, T.E.; Meekhof, D.M.; Kitching, J.; Hollberg, L.W.; Heavner, T.P.; Jefferts, S.R.; DeMarchi, A.; Vessot, R.F.C.; Young, L.; Wu, S.; Thompson, R.; Seidel, D.; Maleki, L.;
1999 / IEEE / 0-7803-5400-1
By: Ferre-Pikal, E.S.; Walls, F.L.; Ascarrunz, H.; Vig, J.; Tsarapkin, D.;
By: Ferre-Pikal, E.S.; Walls, F.L.; Ascarrunz, H.; Vig, J.; Tsarapkin, D.;
2000 / IEEE
By: Zibrov, A.S.; Vukicevic, N.; Robinson, H.G.; Kitching, J.; Walls, F.L.; Hollberg, L.;
By: Zibrov, A.S.; Vukicevic, N.; Robinson, H.G.; Kitching, J.; Walls, F.L.; Hollberg, L.;
2002 / IEEE / 0-7803-7082-1
By: Sengupta, A.; Garcia Nava, J.F.; Walls, F.L.; Nelson, C.; Hatt, A.; Howe, D.A.;
By: Sengupta, A.; Garcia Nava, J.F.; Walls, F.L.; Nelson, C.; Hatt, A.; Howe, D.A.;
2002 / IEEE / 0-7803-7082-1
By: Nelson, C.; Howe, D.A.; Sen Gupta, A.; Hati, A.; Garcia Nava, J.F.; Walls, F.L.;
By: Nelson, C.; Howe, D.A.; Sen Gupta, A.; Hati, A.; Garcia Nava, J.F.; Walls, F.L.;
2003 / IEEE / 0-7803-7688-9
By: Howe, D.A.; Sen Gupta, A.; Nava, J.F.; Walls, F.L.; Hati, A.; Nelson, C.;
By: Howe, D.A.; Sen Gupta, A.; Nava, J.F.; Walls, F.L.; Hati, A.; Nelson, C.;
2003 / IEEE / 0-7803-7688-9
By: Nelson, C.W.; Hati, A.; Nava, J.F.G.; Tasset, T.N.; Walls, F.L.; Gupta, A.S.;
By: Nelson, C.W.; Hati, A.; Nava, J.F.G.; Tasset, T.N.; Walls, F.L.; Gupta, A.S.;
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