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Author: Volk, J.T.
Results
1997 / IEEE / 0-7803-4376-X
By: Smith, G.A.; Schlabach, P.; Ostiguy, J.F.; Nicol, T.H.; May, M.P.; Jackson, G.P.; Volk, J.T.; Harding, D.J.; Haggard, J.E.; Fowler, W.B.; Foster, G.W.; Brown, B.C.; Glass, H.D.;
By: Smith, G.A.; Schlabach, P.; Ostiguy, J.F.; Nicol, T.H.; May, M.P.; Jackson, G.P.; Volk, J.T.; Harding, D.J.; Haggard, J.E.; Fowler, W.B.; Foster, G.W.; Brown, B.C.; Glass, H.D.;
1997 / IEEE / 0-7803-4376-X
By: Brown, B.C.; Glass, H.D.; Volk, J.T.; Ostiguy, J.-F.; Jackson, G.P.; Gustafson, R.; Fowler, W.B.; Foster, G.W.;
By: Brown, B.C.; Glass, H.D.; Volk, J.T.; Ostiguy, J.-F.; Jackson, G.P.; Gustafson, R.; Fowler, W.B.; Foster, G.W.;
1997 / IEEE / 0-7803-4376-X
By: Glass, H.D.; Bertsche, K.J.; Smith, G.A.; Schlabach, P.; Ostiguy, J.F.; Nicol, T.H.; May, M.P.; Volk, J.T.; Jackson, G.P.; Harding, D.J.; Haggard, J.E.; Fowler, W.B.; Foster, G.W.; Brown, B.C.;
By: Glass, H.D.; Bertsche, K.J.; Smith, G.A.; Schlabach, P.; Ostiguy, J.F.; Nicol, T.H.; May, M.P.; Volk, J.T.; Jackson, G.P.; Harding, D.J.; Haggard, J.E.; Fowler, W.B.; Foster, G.W.; Brown, B.C.;
1997 / IEEE / 0-7803-4376-X
By: Volk, J.T.; Foster, G.W.; Brown, B.C.; Pruss, S.M.; Glass, H.D.; Ostiguy, J.-F.; May, M.p.; Jackson, G.P.; Harding, D.J.;
By: Volk, J.T.; Foster, G.W.; Brown, B.C.; Pruss, S.M.; Glass, H.D.; Ostiguy, J.-F.; May, M.p.; Jackson, G.P.; Harding, D.J.;
1999 / IEEE / 0-7803-5573-3
By: Piekarz, H.; Mazur, P.O.; McAshan, M.; Kashikhin, V.; Foster, G.W.; Walker, R.; Volk, J.T.;
By: Piekarz, H.; Mazur, P.O.; McAshan, M.; Kashikhin, V.; Foster, G.W.; Walker, R.; Volk, J.T.;
2000 / IEEE
By: Fowler, W.B.; Schlabach, P.; Foster, G.W.; Brown, C.N.; Brown, B.C.; Volk, J.T.; Glass, H.D.; Pruss, S.; Nicol, T.H.; May, M.P.; Jackson, G.P.; Harding, D.J.;
By: Fowler, W.B.; Schlabach, P.; Foster, G.W.; Brown, C.N.; Brown, B.C.; Volk, J.T.; Glass, H.D.; Pruss, S.; Nicol, T.H.; May, M.P.; Jackson, G.P.; Harding, D.J.;
2001 / IEEE / 0-7803-7191-7
By: Glass, H.D.; Brown, B.C.; Harding, D.J.; Zagel, J.R.; Volk, J.T.; Pruss, S.M.; Kozien, L.R.;
By: Glass, H.D.; Brown, B.C.; Harding, D.J.; Zagel, J.R.; Volk, J.T.; Pruss, S.M.; Kozien, L.R.;
2001 / IEEE / 0-7803-7191-7
By: Fowler, W.; Foster, G.W.; DiMarco, J.; Volk, J.T.; Wolf, Z.; Kashikhin, V.S.; Ringwall, A.; Spencer, C.M.; Rago, C.E.; Tsvetkov, V.; Makarov, A.;
By: Fowler, W.; Foster, G.W.; DiMarco, J.; Volk, J.T.; Wolf, Z.; Kashikhin, V.S.; Ringwall, A.; Spencer, C.M.; Rago, C.E.; Tsvetkov, V.; Makarov, A.;
2001 / IEEE / 0-7803-7191-7
By: Johnson, D.E.; Yang, M.J.; Volk, J.T.; Pruss, S.M.; Foster, G.W.; Mishra, C.S.; Jackson, G.P.; Gattuso, C.; Brown, B.C.;
By: Johnson, D.E.; Yang, M.J.; Volk, J.T.; Pruss, S.M.; Foster, G.W.; Mishra, C.S.; Jackson, G.P.; Gattuso, C.; Brown, B.C.;
2001 / IEEE / 0-7803-7191-7
By: Glass, H.D.; Fowler, W.; Foster, G.W.; Brown, B.C.; Volk, J.T.; Jackson, G.P.;
By: Glass, H.D.; Fowler, W.; Foster, G.W.; Brown, B.C.; Volk, J.T.; Jackson, G.P.;
2002 / IEEE
By: Makarov, A.; Kashikhin, V.S.; Fowler, W.; Foster, G.W.; DiMarco, J.; Rago, C.E.; Volk, J.T.; Wolf, Z.; Tsvetkov, V.; Spencer, C.M.; Ringwall, A.;
By: Makarov, A.; Kashikhin, V.S.; Fowler, W.; Foster, G.W.; DiMarco, J.; Rago, C.E.; Volk, J.T.; Wolf, Z.; Tsvetkov, V.; Spencer, C.M.; Ringwall, A.;
2003 / IEEE / 0-7803-7738-9
By: Volk, J.T.; Mishra, C.S.; Johnson, D.E.; Gattuso, C.; Glass, H.D.; Foster, G.W.; Yang, M.-J.;
By: Volk, J.T.; Mishra, C.S.; Johnson, D.E.; Gattuso, C.; Glass, H.D.; Foster, G.W.; Yang, M.-J.;
2005 / IEEE / 0-7803-8859-3
By: Volk, J.T.; DeHart, T.E.; Kangas, K.; Gottschalk, S.C.; Spencer, C.M.;
By: Volk, J.T.; DeHart, T.E.; Kangas, K.; Gottschalk, S.C.; Spencer, C.M.;
2005 / IEEE / 0-7803-8859-3
By: Volk, J.T.; Annala, J.; Wojcik, G.; Syphers, M.J.; Sager, T.; Stefanski, R.; Shiltsev, V.; Russell, A.D.; Nobrega, A.; Moore, C.; Martens, M.; Greenwood, J.; Gollwitzer, K.E.; Elementi, L.; Gelfand, N.;
By: Volk, J.T.; Annala, J.; Wojcik, G.; Syphers, M.J.; Sager, T.; Stefanski, R.; Shiltsev, V.; Russell, A.D.; Nobrega, A.; Moore, C.; Martens, M.; Greenwood, J.; Gollwitzer, K.E.; Elementi, L.; Gelfand, N.;
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