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Author: Trzcinski, R.
Results
2003 / IEEE / 1-58113-682-X
By: Ray, A.; Safran, J.; Talbi, M.; Trzcinski, R.; Meeyoung Yoon; Wagner, L.; Sherony, M.; Zamdmer, N.; Plouchart, J.-O.; Jonghae Kim; Yue Tan;
By: Ray, A.; Safran, J.; Talbi, M.; Trzcinski, R.; Meeyoung Yoon; Wagner, L.; Sherony, M.; Zamdmer, N.; Plouchart, J.-O.; Jonghae Kim; Yue Tan;
2003 / IEEE / 0-7803-7842-3
By: Trzcinski, R.; Groves, R.; Yue Tan; Sherony, M.; Liang-Hung Lu; Talbi, M.; Jonghae Kim; Plouchart, J.-O.; Wagner, L.; Zamdmer, N.; Ray, A.;
By: Trzcinski, R.; Groves, R.; Yue Tan; Sherony, M.; Liang-Hung Lu; Talbi, M.; Jonghae Kim; Plouchart, J.-O.; Wagner, L.; Zamdmer, N.; Ray, A.;
2004 / IEEE
By: Ray, A.; Talbi, M.; Trzcinski, R.; Groves, R.A.; Tan, Y.; Wagner, L.F.; Liang-Hung Lu; Zamdmer, N.; Jonghae Kim; Plouchart, J.-O.; Sherony, M.;
By: Ray, A.; Talbi, M.; Trzcinski, R.; Groves, R.A.; Tan, Y.; Wagner, L.F.; Liang-Hung Lu; Zamdmer, N.; Jonghae Kim; Plouchart, J.-O.; Sherony, M.;
2004 / IEEE / 0-7803-8289-7
By: Plouchart, J.-O.; Trzcinski, R.; Jonghae Kim; Zamdmer, N.; Narasimha, S.; Chaloux, S.; Wagner, L.; Khare, M.;
By: Plouchart, J.-O.; Trzcinski, R.; Jonghae Kim; Zamdmer, N.; Narasimha, S.; Chaloux, S.; Wagner, L.; Khare, M.;
2005 / IEEE
By: Sweeney, S.L.; Wagner, L.F.; Khare, M.; Narasimha, S.; Chaloux, S.; Trzcinski, R.; Jonghae Kim; Zamdmer, N.; Plouchart, J.-O.;
By: Sweeney, S.L.; Wagner, L.F.; Khare, M.; Narasimha, S.; Chaloux, S.; Trzcinski, R.; Jonghae Kim; Zamdmer, N.; Plouchart, J.-O.;
2005 / IEEE / 0-7803-8904-2
By: Kun Wu; Trzcinski, R.; Zamdmer, N.; Plouchart, J.-O.; Jonghae Kim; Moon Kim; Gross, B.J.;
By: Kun Wu; Trzcinski, R.; Zamdmer, N.; Plouchart, J.-O.; Jonghae Kim; Moon Kim; Gross, B.J.;
2005 / IEEE / 0-7803-9268-X
By: Williams, R.; Hyde, P.; Karam, V.; Trzcinski, R.; Kun Wu; Myung-Hee Na; Jonghae Kim; Plouchart, J.-O.; Clark, W.; Gross, B.J.; Mc Cullen, J.;
By: Williams, R.; Hyde, P.; Karam, V.; Trzcinski, R.; Kun Wu; Myung-Hee Na; Jonghae Kim; Plouchart, J.-O.; Clark, W.; Gross, B.J.; Mc Cullen, J.;
2006 / IEEE / 1-4244-0076-7
By: Ahlgren, D.; Trzcinski, R.; Plouchart, J.-O.; Jonghae Kim; Choongyeun Cho; Daeik Kim;
By: Ahlgren, D.; Trzcinski, R.; Plouchart, J.-O.; Jonghae Kim; Choongyeun Cho; Daeik Kim;
2007 / IEEE / 0-7695-2795-7
By: Choongyeun Cho; Trzcinski, R.; Sangyeun Cho; Daihyun Lim; Plouchart, J.-O.; Jonghae Kim; Daeik Kim;
By: Choongyeun Cho; Trzcinski, R.; Sangyeun Cho; Daihyun Lim; Plouchart, J.-O.; Jonghae Kim; Daeik Kim;
2007 / IEEE
By: Norris, C.; Kumar, M.; Sungjae Lee; Trzcinski, R.; Choongyeun Cho; Jae-Sung Rieh; Jonghae Kim; Daeik Kim; Ahlgren, D.; Plouchart, J.-O.; Freeman, G.;
By: Norris, C.; Kumar, M.; Sungjae Lee; Trzcinski, R.; Choongyeun Cho; Jae-Sung Rieh; Jonghae Kim; Daeik Kim; Ahlgren, D.; Plouchart, J.-O.; Freeman, G.;
2007 / IEEE / 1-4244-0852-0
By: Weipeng Li; Choongyeun Cho; Plouchart, J.-O.; Jonghae Kim; Kim, D.D.; Daihyun Lim; Norris, C.; Ahlgren, D.; Kumar, M.; Trzcinski, R.;
By: Weipeng Li; Choongyeun Cho; Plouchart, J.-O.; Jonghae Kim; Kim, D.D.; Daihyun Lim; Norris, C.; Ahlgren, D.; Kumar, M.; Trzcinski, R.;
2007 / IEEE / 1-4244-0852-0
By: Plouchart, J.-O.; Jonghae Kim; Lim, D.; Boning, D.; Trzcinski, R.; Daeik Kim; Choongyeun Cho;
By: Plouchart, J.-O.; Jonghae Kim; Lim, D.; Boning, D.; Trzcinski, R.; Daeik Kim; Choongyeun Cho;
2007 / IEEE
By: Plouchart, J.-O.; Jonghae Kim; Daeik Kim; Norris, C.; Kumar, M.; Trzcinski, R.; Choongyeun Cho;
By: Plouchart, J.-O.; Jonghae Kim; Daeik Kim; Norris, C.; Kumar, M.; Trzcinski, R.; Choongyeun Cho;
2007 / IEEE / 978-1-59593-627-1
By: Choongyeun Cho; Trzcinski, R.; Plouchart, J.-O.; Jonghae Kim; Daeik Kim;
By: Choongyeun Cho; Trzcinski, R.; Plouchart, J.-O.; Jonghae Kim; Daeik Kim;
2007 / IEEE / 978-4-900784-04-8
By: Jonghae Kim; Daeik Kim; Trzcinski, R.; Weipeng Li; Daihyun Lim; Choongyeun Cho; Plouchart, J.-O.;
By: Jonghae Kim; Daeik Kim; Trzcinski, R.; Weipeng Li; Daihyun Lim; Choongyeun Cho; Plouchart, J.-O.;
2007 / IEEE / 1-4244-1022-3
By: Daiek Kim; Plouchart, J.-O.; Trzcinski, R.; Choongyeun Cho; Plett, C.; Karam, V.; Jonghae Kim;
By: Daiek Kim; Plouchart, J.-O.; Trzcinski, R.; Choongyeun Cho; Plett, C.; Karam, V.; Jonghae Kim;
2008 / IEEE / 978-1-4244-1855-8
By: Jonghae Kim; Kim, D.D.; Trzcinski, R.; Plouchart, J.-O.; Choongyeun Cho;
By: Jonghae Kim; Kim, D.D.; Trzcinski, R.; Plouchart, J.-O.; Choongyeun Cho;
2008 / IEEE
By: Daihyun Lim; Plouchart, J.-O.; Jonghae Kim; Kim, D.D.; Choongyeun Cho; Trzcinski, R.; Sangyeun Cho;
By: Daihyun Lim; Plouchart, J.-O.; Jonghae Kim; Kim, D.D.; Choongyeun Cho; Trzcinski, R.; Sangyeun Cho;
2010 / IEEE / 978-1-4244-6412-8
By: Bing Dang; Knickerbocker, J.; Prabhakar, A.; Trzcinski, R.; Polastre, R.; Maria, J.; Tsang, C.; Andry, P.;
By: Bing Dang; Knickerbocker, J.; Prabhakar, A.; Trzcinski, R.; Polastre, R.; Maria, J.; Tsang, C.; Andry, P.;