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Author: Sturm, J.C.
Results
2012 / IEEE / 978-1-4673-1164-9
By: Verma, N.; Sturm, J.C.; Wagner, S.; Sanz-Robinson, J.; Hu, Y.; Huang, L.; Rieutort-Louis, W.;
By: Verma, N.; Sturm, J.C.; Wagner, S.; Sanz-Robinson, J.; Hu, Y.; Huang, L.; Rieutort-Louis, W.;
2012 / IEEE / 978-1-4673-0849-6
By: Sturm, J.C.; Song, K.; Sanz-Robinson, J.; Rieutort-Louis, W.; Yingzhe Hu; Verma, N.; Wagner, S.;
By: Sturm, J.C.; Song, K.; Sanz-Robinson, J.; Rieutort-Louis, W.; Yingzhe Hu; Verma, N.; Wagner, S.;
2012 / IEEE / 978-1-4673-1164-9
By: Wagner, S.; Verma, N.; Rieutort-Louis, W.; Sanz-Robinson, J.; Sturm, J.C.;
By: Wagner, S.; Verma, N.; Rieutort-Louis, W.; Sanz-Robinson, J.; Sturm, J.C.;
1989 / IEEE
By: Trimble, L.E.; Lindenberger, W.S.; Hillenius, S.J.; Field, R.L.; Sturm, J.C.; Kamgar, A.; Celler, G.K.; Cong, H.-I.;
By: Trimble, L.E.; Lindenberger, W.S.; Hillenius, S.J.; Field, R.L.; Sturm, J.C.; Kamgar, A.; Celler, G.K.; Cong, H.-I.;
1989 / IEEE / 0-7803-0817-4
By: Lindenberger, W.S.; Field, R.L.; Trimble, L.E.; Sturm, J.C.; Celler, G.K.; Cong, H.-I.; Hillenius, S.J.; Kamgar, A.;
By: Lindenberger, W.S.; Field, R.L.; Trimble, L.E.; Sturm, J.C.; Celler, G.K.; Cong, H.-I.; Hillenius, S.J.; Kamgar, A.;
1993 / IEEE
By: Sturm, J.C.; Xiao, X.; Shallcross, F.V.; Palfrey, S.; Meyerhofer, D.; Lyon, S.A.; Parihar, S.R.;
By: Sturm, J.C.; Xiao, X.; Shallcross, F.V.; Palfrey, S.; Meyerhofer, D.; Lyon, S.A.; Parihar, S.R.;
1992 / IEEE / 0-7803-0817-4
By: Meyerhofer, D.; Lyon, S.A.; Parihar, S.R.; Sturm, J.C.; Xiao, X.; Palfrey, S.;
By: Meyerhofer, D.; Lyon, S.A.; Parihar, S.R.; Sturm, J.C.; Xiao, X.; Palfrey, S.;
1993 / IEEE / 0-7803-1450-6
By: Sturm, J.C.; Prinz, E.J.; Venkataraman, V.; Matutinovic-Krstelj, Z.; Magee, C.W.;
By: Sturm, J.C.; Prinz, E.J.; Venkataraman, V.; Matutinovic-Krstelj, Z.; Magee, C.W.;
1996 / IEEE
By: Watanabe, J.K.; Sturm, J.C.; Liu, C.W.; St. Amour, A.; Lanzerotti, L.D.; Theodore, D.;
By: Watanabe, J.K.; Sturm, J.C.; Liu, C.W.; St. Amour, A.; Lanzerotti, L.D.; Theodore, D.;
1996 / IEEE / 0-7803-3393-4
By: Stach, E.; Sturm, J.C.; Lanzerotti, L.D.; Magee, C.; Buyuklimanli, T.; Hull, R.;
By: Stach, E.; Sturm, J.C.; Lanzerotti, L.D.; Magee, C.; Buyuklimanli, T.; Hull, R.;
1998 / IEEE / 0-7803-4947-4
By: Stewart, R.G.; Ipri, A.; Connor, S.; Hsu, J.; Furst, D.A.; Shen, Z.; Kane, M.G.; Dawson, R.M.A.; Lu, M.H.; Sturm, J.C.; Shi, J.; Chen, F.; Van Slyke, S.; Tang, C.W.; Robinson, S.; Ping, K.; Dickey, E.; Barrow, W.A.; Pearson, S.; Flegal, R.T.; Green, P.J.; King, C.N.;
By: Stewart, R.G.; Ipri, A.; Connor, S.; Hsu, J.; Furst, D.A.; Shen, Z.; Kane, M.G.; Dawson, R.M.A.; Lu, M.H.; Sturm, J.C.; Shi, J.; Chen, F.; Van Slyke, S.; Tang, C.W.; Robinson, S.; Ping, K.; Dickey, E.; Barrow, W.A.; Pearson, S.; Flegal, R.T.; Green, P.J.; King, C.N.;
1998 / IEEE / 0-7803-4774-9
By: Stewart, R.G.; Ipri, A.; Hsu, J.; Kane, M.G.; Connor, S.; Furst, D.A.; Shen, Z.; Dawson, R.M.A.; Sturm, J.C.; Lu, M.H.; Shi, J.; Chen, F.; Van Slyke, S.; Tang, C.W.; Robinson, S.; Ping, K.; Dickey, E.; Barrow, W.A.; Pearson, S.; Flegal, R.T.; Green, P.J.; King, C.N.;
By: Stewart, R.G.; Ipri, A.; Hsu, J.; Kane, M.G.; Connor, S.; Furst, D.A.; Shen, Z.; Dawson, R.M.A.; Sturm, J.C.; Lu, M.H.; Shi, J.; Chen, F.; Van Slyke, S.; Tang, C.W.; Robinson, S.; Ping, K.; Dickey, E.; Barrow, W.A.; Pearson, S.; Flegal, R.T.; Green, P.J.; King, C.N.;
2002 / IEEE / 0-7803-7462-2
By: Tegenfeldt, J.O.; Huang, L.R.; Cox, E.C.; Austin, R.H.; Sturm, J.C.;
By: Tegenfeldt, J.O.; Huang, L.R.; Cox, E.C.; Austin, R.H.; Sturm, J.C.;
1985 / IEEE
By: Hwa, T.L.; Gibbons, J.F.; Sturm, J.C.; Baerg, W.; Lin, H.Y.; Tzeng, J.C.; Ting, C.H.; Siu, B.B.;
By: Hwa, T.L.; Gibbons, J.F.; Sturm, J.C.; Baerg, W.; Lin, H.Y.; Tzeng, J.C.; Ting, C.H.; Siu, B.B.;
2005 / IEEE / 0-7803-9040-7
By: Wagner, S.; Gleskova, H.; Cheng, I.-C.; Kattamis, A.; Long, K.; Sturm, J.C.;
By: Wagner, S.; Gleskova, H.; Cheng, I.-C.; Kattamis, A.; Long, K.; Sturm, J.C.;
2006 / IEEE
By: Holmes, R.J.; Kattamis, A.Z.; Wagner, S.; Forrest, S.R.; Sturm, J.C.; Long, K.; I-Chun Cheng;
By: Holmes, R.J.; Kattamis, A.Z.; Wagner, S.; Forrest, S.R.; Sturm, J.C.; Long, K.; I-Chun Cheng;
2006 / IEEE
By: Long, K.; O'Regan, M.; Yu, G.; Stevenson, M.; Sturm, J.C.; Wagner, S.; Gleskova, H.; Cheng, I.-C.; Kattamis, A.Z.;
By: Long, K.; O'Regan, M.; Yu, G.; Stevenson, M.; Sturm, J.C.; Wagner, S.; Gleskova, H.; Cheng, I.-C.; Kattamis, A.Z.;
2006 / IEEE / 1-4244-0461-4
By: Denker, M.S.; Marino, J.; Buyuklimanli, T.; Gmachl, C.F.; Sturm, J.C.; Zheng, W.; Mayer, J.T.;
By: Denker, M.S.; Marino, J.; Buyuklimanli, T.; Gmachl, C.F.; Sturm, J.C.; Zheng, W.; Mayer, J.T.;
2007 / IEEE
By: Hekmatshoar, B.; Cherenack, K.H.; Kattamis, A.Z.; Wagner, S.; Sturm, J.C.; Gleskova, H.; I-Chun Cheng;
By: Hekmatshoar, B.; Cherenack, K.H.; Kattamis, A.Z.; Wagner, S.; Sturm, J.C.; Gleskova, H.; I-Chun Cheng;
2007 / IEEE
By: Cheng, I.-C.; Kattamis, A.Z.; Allee, D.R.; O'Rourke, S.M.; Loy, D.E.; Venugopal, S.M.; Sturm, J.C.; Wagner, S.; Cherenack, K.H.; Hekmatshoar, B.; Ke Long;
By: Cheng, I.-C.; Kattamis, A.Z.; Allee, D.R.; O'Rourke, S.M.; Loy, D.E.; Venugopal, S.M.; Sturm, J.C.; Wagner, S.; Cherenack, K.H.; Hekmatshoar, B.; Ke Long;
2007 / IEEE / 978-1-4244-1101-6
By: Kattamis, A.Z.; Hekmatshoar, B.; Sturm, J.C.; Wagner, S.; Cherenack, K.;
By: Kattamis, A.Z.; Hekmatshoar, B.; Sturm, J.C.; Wagner, S.; Cherenack, K.;
2008 / IEEE
By: Ke Long; Hekmatshoar, B.; Cherenack, K.H.; Kattamis, A.Z.; Jian-Zhang Chen; Hack, M.; Rajan, K.; Sturm, J.C.; Wagner, S.;
By: Ke Long; Hekmatshoar, B.; Cherenack, K.H.; Kattamis, A.Z.; Jian-Zhang Chen; Hack, M.; Rajan, K.; Sturm, J.C.; Wagner, S.;
2008 / IEEE / 978-1-4244-1942-5
By: Kattamis, A.; Ke Long; Cherenack, K.; Hekmatshoar, B.; Sturm, J.C.; Wagner, S.;
By: Kattamis, A.; Ke Long; Cherenack, K.; Hekmatshoar, B.; Sturm, J.C.; Wagner, S.;