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Author: Stewart, J.A.C.
Results
1996 / IEEE / 0-7803-3246-6
By: Gamble, H.G.; Wu, Y.; Fusco, V.F.; Hu, Z.R.; Stewart, J.A.C.; Armstrong, B.M.;
By: Gamble, H.G.; Wu, Y.; Fusco, V.F.; Hu, Z.R.; Stewart, J.A.C.; Armstrong, B.M.;
1996 / IEEE / 0-7803-3130-3
By: Robertson, I.D.; Nam, S.; Baree, A.H.; Stewart, J.A.C.; Plews, A.D.; Patterson, A.D.; Leckey, J.G.; Snowden, C.M.; Howes, M.J.;
By: Robertson, I.D.; Nam, S.; Baree, A.H.; Stewart, J.A.C.; Plews, A.D.; Patterson, A.D.; Leckey, J.G.; Snowden, C.M.; Howes, M.J.;
1997 / IEEE / 0-7803-3814-6
By: Wu, Y.; Stewart, J.A.C.; Fusco, V.F.; Bu, Z.R.; Buchanan, N.B.; Armstrong, B.M.; Gamble, H.S.;
By: Wu, Y.; Stewart, J.A.C.; Fusco, V.F.; Bu, Z.R.; Buchanan, N.B.; Armstrong, B.M.; Gamble, H.S.;
1997 / IEEE / 0-7803-3951-7
By: Patterson, A.D.; Leckey, J.G.; Greer, A.; Stewart, J.A.C.; Fusco, V.F.;
By: Patterson, A.D.; Leckey, J.G.; Greer, A.; Stewart, J.A.C.; Fusco, V.F.;
1998 / IEEE
By: Fusco, V.F.; Buchanan, N.B.; Zhirun Hu; Suidong Yang; Stewart, J.A.C.; Gamble, H.S.; Armstrong, G.A.; Armstrong, B.M.; Yunhong Wu;
By: Fusco, V.F.; Buchanan, N.B.; Zhirun Hu; Suidong Yang; Stewart, J.A.C.; Gamble, H.S.; Armstrong, G.A.; Armstrong, B.M.; Yunhong Wu;
1998 / IEEE
By: Stewart, J.A.C.; Fusco, V.F.; Suidong Yang; Qiang Chen; Yunghong Wu; Zhirun Hu; Gamble, H.S.; Armstrong, B.M.;
By: Stewart, J.A.C.; Fusco, V.F.; Suidong Yang; Qiang Chen; Yunghong Wu; Zhirun Hu; Gamble, H.S.; Armstrong, B.M.;
1998 / IEEE / 0-7803-4439-1
By: Robertson, I.D.; Baree, A.H.; Gokdemir, T.; Nam, S.; Stewart, J.A.C.; Plews, A.D.; Patterson, A.D.; Leckey, K.G.; Snowden, C.M.; Howes, M.J.;
By: Robertson, I.D.; Baree, A.H.; Gokdemir, T.; Nam, S.; Stewart, J.A.C.; Plews, A.D.; Patterson, A.D.; Leckey, K.G.; Snowden, C.M.; Howes, M.J.;
1998 / IEEE / 0-7803-4471-5
By: Gokdemir, T.; Nam, S.; Stewart, J.A.C.; Patterson, A.D.; Robertson, I.D.; Baree, A.H.; Snowden, C.M.; Howes, M.J.; Plews, A.D.; Leckey, J.G.;
By: Gokdemir, T.; Nam, S.; Stewart, J.A.C.; Patterson, A.D.; Robertson, I.D.; Baree, A.H.; Snowden, C.M.; Howes, M.J.; Plews, A.D.; Leckey, J.G.;
1999 / IEEE
By: Armstrong, B.M.; Gamble, H.S.; Stewart, J.A.C.; Fusco, V.F.; Wu, Y.; Mitchell, S.J.N.;
By: Armstrong, B.M.; Gamble, H.S.; Stewart, J.A.C.; Fusco, V.F.; Wu, Y.; Mitchell, S.J.N.;
2001 / IEEE / 0-7803-7129-1
By: Bain, M.; Baine, P.; Gamble, H.S.; Stewart, J.A.C.; Fusco, V.F.; Mitchell, S.J.N.; Armstrong, B.M.;
By: Bain, M.; Baine, P.; Gamble, H.S.; Stewart, J.A.C.; Fusco, V.F.; Mitchell, S.J.N.; Armstrong, B.M.;
1970 / IEEE
By: Berson, B.E.; Bosch, B.G.; Weisbrod, S.; Upadhyayula, C.L.; Bowers, H.C.; Cawsey, D.; Kern K. N. Chang; Conn, D.R.; Decker, D.R.; Dunn, C.N.; Engelmann, R.W.H.; Enstrom, R.E.; Evans, W.J.; Frank, R.L.; Fray, S.J.; Frey, W.; Gibbs, S.E.; Greifing, P.T.; Haddad, G.I.; Isobe, T.; Ito, Y.; Khan, P.J.; Komizo, H.; Kondo, H.; Walter H. Ku; Lee A. MacKenzie; Marx, R.E.; Midford, T.A.; Mitchell, H.R.; Mouthaan, K.; Nagano, S.; Narayan, S.Y.; Osborne, T.L.; Owens, R.P.; Pence, I.W.; Perlman, B.S.; Plants, S.T.; Pollmann, H.; Prager, H.J.; Reynolds, J.F.; Rosenbaum, F.J.; Sasagawa, S.; Scherer, E.F.; Schroeder, W.E.; Steinbrecher, D.H.; Sterzer, F.; Stewart, J.A.C.; Taylor, B.C.; Tokida, M.; Wei Ching Tsai;
By: Berson, B.E.; Bosch, B.G.; Weisbrod, S.; Upadhyayula, C.L.; Bowers, H.C.; Cawsey, D.; Kern K. N. Chang; Conn, D.R.; Decker, D.R.; Dunn, C.N.; Engelmann, R.W.H.; Enstrom, R.E.; Evans, W.J.; Frank, R.L.; Fray, S.J.; Frey, W.; Gibbs, S.E.; Greifing, P.T.; Haddad, G.I.; Isobe, T.; Ito, Y.; Khan, P.J.; Komizo, H.; Kondo, H.; Walter H. Ku; Lee A. MacKenzie; Marx, R.E.; Midford, T.A.; Mitchell, H.R.; Mouthaan, K.; Nagano, S.; Narayan, S.Y.; Osborne, T.L.; Owens, R.P.; Pence, I.W.; Perlman, B.S.; Plants, S.T.; Pollmann, H.; Prager, H.J.; Reynolds, J.F.; Rosenbaum, F.J.; Sasagawa, S.; Scherer, E.F.; Schroeder, W.E.; Steinbrecher, D.H.; Sterzer, F.; Stewart, J.A.C.; Taylor, B.C.; Tokida, M.; Wei Ching Tsai;
1980 / IEEE
By: Adelseck, B.; Armstrong, B.M.; Yamashita, S.; Witters, D.M.; Ashiki, M.; Bahl, I.J.; Baird, J.M.; Barnett, L.R.; Bert, A.G.; Brown, R.; Chatterjee, I.; Engen, G.F.; Fliflet, A.W.; Gandhi, O.P.; Granatstein, V.L.; Hagmann, M.J.; Hoefer, W.J.R.; Hoppe, W.; Chia-lun J. Hu; Itoh, T.; Kaminsky, D.; Kantor, G.; Young-El Ma; Makimoto, M.; Meyer, W.; Mizushina, S.; Rix, F.; Schilz, W.M.; Yi-Chi Shih; Stewart, J.A.C.; Stuchly, M.A.; Stuchly, S.S.; Cheng Sun;
By: Adelseck, B.; Armstrong, B.M.; Yamashita, S.; Witters, D.M.; Ashiki, M.; Bahl, I.J.; Baird, J.M.; Barnett, L.R.; Bert, A.G.; Brown, R.; Chatterjee, I.; Engen, G.F.; Fliflet, A.W.; Gandhi, O.P.; Granatstein, V.L.; Hagmann, M.J.; Hoefer, W.J.R.; Hoppe, W.; Chia-lun J. Hu; Itoh, T.; Kaminsky, D.; Kantor, G.; Young-El Ma; Makimoto, M.; Meyer, W.; Mizushina, S.; Rix, F.; Schilz, W.M.; Yi-Chi Shih; Stewart, J.A.C.; Stuchly, M.A.; Stuchly, S.S.; Cheng Sun;
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