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Author: Srinivasan, S.
Results
2012 / IEEE
By: Kaul, H.; Anders, M.A.; Srinivasan, S.; Mathew, S.K.; Hsu, S.K.; Krishnamurthy, R.K.; Satpathy, S.; Agarwal, A.; Sheikh, F.;
By: Kaul, H.; Anders, M.A.; Srinivasan, S.; Mathew, S.K.; Hsu, S.K.; Krishnamurthy, R.K.; Satpathy, S.; Agarwal, A.; Sheikh, F.;
2012 / IEEE
By: Srinivasan, V.S.S.; Ganguly, U.; Lodha, S.; Kuppurao, S.; Srinivasan, S.; Kim, Y.; Kumbhare, P.; Lashkare, S.; Bafna, P.; Karkare, P.; Chopra, S.;
By: Srinivasan, V.S.S.; Ganguly, U.; Lodha, S.; Kuppurao, S.; Srinivasan, S.; Kim, Y.; Kumbhare, P.; Lashkare, S.; Bafna, P.; Karkare, P.; Chopra, S.;
2012 / IEEE
By: Bowers, J.E.; Spencer, D.T.; Zhihong Huang; Fiorentino, M.; Beausoleil, R.G.; Srinivasan, S.; Di Liang; Fattal, D.A.;
By: Bowers, J.E.; Spencer, D.T.; Zhihong Huang; Fiorentino, M.; Beausoleil, R.G.; Srinivasan, S.; Di Liang; Fattal, D.A.;
2011 / IEEE / 978-1-4577-0081-1
By: Rier, T.; Rappe, A.M.; Grady, M.C.; Kalfas, G.A.; Soroush, M.; Srinivasan, S.;
By: Rier, T.; Rappe, A.M.; Grady, M.C.; Kalfas, G.A.; Soroush, M.; Srinivasan, S.;
2011 / IEEE / 978-1-4577-0953-1
By: Culnane, C.; Llewellyn, M.; Schneider, S.; Zhe Xia; Srinivasan, S.; Heather, J.;
By: Culnane, C.; Llewellyn, M.; Schneider, S.; Zhe Xia; Srinivasan, S.; Heather, J.;
2011 / IEEE / 978-1-4577-2109-0
By: Edwards, D.J.; Brooks, J.P.; Diehl, R.L.; Srinivasan, S.; Sorrell, T.P.;
By: Edwards, D.J.; Brooks, J.P.; Diehl, R.L.; Srinivasan, S.; Sorrell, T.P.;
2011 / IEEE / 978-1-4673-0074-2
By: Srinivasan, S.; Veeramani, P.; Vivekanandan, G.; Silaimani, S.M.;
By: Srinivasan, S.; Veeramani, P.; Vivekanandan, G.; Silaimani, S.M.;
2012 / IEEE / 978-1-4577-1619-5
By: Di Liang; Beausoleil, R.G.; Bowers, J.E.; Kurczveil, G.; Fiorentino, M.; Srinivasan, S.;
By: Di Liang; Beausoleil, R.G.; Bowers, J.E.; Kurczveil, G.; Fiorentino, M.; Srinivasan, S.;
2012 / IEEE / 978-1-4577-1619-5
By: Srinivasan, S.; Bowers, J.E.; Beausoleil, R.G.; Fiorentino, M.; Di Liang;
By: Srinivasan, S.; Bowers, J.E.; Beausoleil, R.G.; Fiorentino, M.; Di Liang;
2015 / IEEE
By: Theogarajan, L.; Bowers, J. E.; Guerra, D.; Srinivasan, S.; Spencer, D. T.; Bluestone, A.;
By: Theogarajan, L.; Bowers, J. E.; Guerra, D.; Srinivasan, S.; Spencer, D. T.; Bluestone, A.;
1989 / IEEE
By: Enayetullah, M.A.; Srinivasan, S.; Appleby, A.J.; Koch, H.; Manko, D.; Swan, D.H.; Somasundaram, S.;
By: Enayetullah, M.A.; Srinivasan, S.; Appleby, A.J.; Koch, H.; Manko, D.; Swan, D.H.; Somasundaram, S.;
1996 / IEEE / 0-7803-2994-5
By: Johnson, J.R.; Adzic, G.; McBreen, J.; Mukerjee, S.; Visintin, A.; Kumar, M.P.S.; Reilly, J.J.; Srinivasan, S.; Lim, H.S.; Zhang, W.; Wasz, M.L.; Schwarz, R.B.;
By: Johnson, J.R.; Adzic, G.; McBreen, J.; Mukerjee, S.; Visintin, A.; Kumar, M.P.S.; Reilly, J.J.; Srinivasan, S.; Lim, H.S.; Zhang, W.; Wasz, M.L.; Schwarz, R.B.;
1997 / IEEE / 0-7803-3631-3
By: Stockel, J.F.; Srinivasan, S.; Reilly, J.J.; Allison, D.U.; Zelter, G.R.; Lim, N.S.;
By: Stockel, J.F.; Srinivasan, S.; Reilly, J.J.; Allison, D.U.; Zelter, G.R.; Lim, N.S.;
1997 / IEEE / 4-930813-75-1
By: Alsmeier, J.; Kelleher, K.H.; Beintner, J.; Haensch, W.; Mandelman, J.A.; Hoh, P.; Bronner, G.; Ninomiya, Y.L.; Srinivasan, S.;
By: Alsmeier, J.; Kelleher, K.H.; Beintner, J.; Haensch, W.; Mandelman, J.A.; Hoh, P.; Bronner, G.; Ninomiya, Y.L.; Srinivasan, S.;
1997 / IEEE / 0-7803-4178-3
By: Huang, W.; Cheung, S.; Srinivasan, S.; Parent, D.; Zappone, W.; Wang, H.; Bansal, R.; Heller, E.; Jain, F.; Russell, M.; Marinilli, A.; Green, L.; Preiss, J.;
By: Huang, W.; Cheung, S.; Srinivasan, S.; Parent, D.; Zappone, W.; Wang, H.; Bansal, R.; Heller, E.; Jain, F.; Russell, M.; Marinilli, A.; Green, L.; Preiss, J.;
1998 / IEEE / 1-55752-521-8
By: Caffey, D.; Boggavarapu, D.; Patel, R.; Pleak, R.; Srinivasan, S.; Gupta, S.; He, X.;
By: Caffey, D.; Boggavarapu, D.; Patel, R.; Pleak, R.; Srinivasan, S.; Gupta, S.; He, X.;
1998 / IEEE / 0-7803-4223-2
By: Wilson, S.; He, X.; Srinivasan, S.; Garcia, A.; Gupta, S.; Patel, R.; Harrison, J.;
By: Wilson, S.; He, X.; Srinivasan, S.; Garcia, A.; Gupta, S.; Patel, R.; Harrison, J.;