Your Search Results

Use materials by this author in your textbook!

AcademicPub holds over eight million pieces of educational content – such as case studies and journal articles – for you to mix-and-match your way.

Experience the freedom of customizing your course pack with AcademicPub!
Not an educator but still interested in using this content? No problem! Visit our provider's page to contact the publisher and get permission directly.

Author: Soo-Young Oh

Results

Temperature dependence of the first-order metal-insulator transition in VO2 and programmable critical temperature sensor
2007 / American Institute of Physics
By: Bong-Jun Kim; Yong Wook Lee; Byung-Gyu Chae; Sun Jin Yun; Soo-Young Oh; Hyun-Tak Kim; Yong-Sik Lim;
Physical and technological limitations and their optimization in submicron ULSI interconnect
1991 / IEEE / 0-87942-673-X
By: Keh-Jeng Chang; Soo-Young Oh; Moll, J.L.;
HIVE: an express and accurate interconnect capacitance extractor for submicron multilevel conductor systems
1991 / IEEE / 0-87942-673-X
By: Keh-Jeng Chang; Lee, K.; Soo-Young Oh;
2001 needs for multi-level interconnect technology
1995 / IEEE
By: Keh-Jeng Chang; Soo-Young Oh;
Fast generation of statistically-based worst-case modeling of on-chip interconnect
1997 / IEEE / 0-8186-8206-X
By: Rahmat, K.; Nakagawa, O.S.; Kanevsky, V.; Chang, N.; Soo-Young Oh;
Rapid characterization and modeling of pattern-dependent variation in chemical-mechanical polishing
1998 / IEEE
By: Stine, B.E.; Soo-Young Oh; Nakagawa, O.S.; Harwoo, C.R.; Divecha, R.R.; Hetherington, D.L.; Chung, J.E.; Boning, D.S.; Ouma, D.O.;
Interconnect scaling: signal integrity and performance in future high-speed CMOS designs
1998 / IEEE / 0-7803-4770-6
By: Chenming Hu; Sylvester, D.; Soo-Young Oh; Nakagawa, O.S.;
Nondestructive Multilevel Interconnect Parameter Characterization For High-performance Manufacturable VLSI Technologies
1993 / IEEE
By: Keh-Jeng Chang; Soo-Young Oh; Norman H. Chang; Mui, L.; Shiesen Peng; Raje, P.; Konrad Young;
Interconnect modeling for VLSIs
1999 / IEEE / 4-930813-98-0
By: Jeong-Taek Kong; Won-Young Jung; Soo-Young Oh; Keun-Ho Lee;
Interconnect modeling in deep submicron design
1999 / IEEE / 0-7803-5727-2
By: Jeong-Taek Kong; Won-Young Jung; Soo-Young Oh; Keun-Ho Lee;
An indirect extraction of interconnect technology parameters for efficient statistical interconnect modeling and its applications
2000 / IEEE / 0-7803-5896-1
By: Joo-Hee Lee; Soo-Young Oh; Won-Young Jung; Jeong-Taek Kong; Young-Kwan Park; Jong-Bae Lee; Jin-Kyu Park; Keun-Ho Lee;
Transient Analysis of MOS Transistors
1980 / IEEE
By: Dutton, R.W.; Ward, D.E.; Soo-Young Oh;
Transient analysis of MOS transistors
1980 / IEEE
By: Ward, D.E.; Soo-Young Oh; Dutton, R.W.;
A simplified two-dimensional numerical analysis of MOS devices—DC case
1980 / IEEE
By: Dutton, R.W.; Soo-Young Oh;
A simple and accurate method to measure the threshold voltage of an enhancement-mode MOSFET
1982 / IEEE
By: Soo-Young Oh; Hee-Gook Lee; Fuller, G.;
Two-dimensional oxidation
1983 / IEEE
By: Daeje Chin; Soo-Young Oh; Shih-Ming Hu; Dutton, R.W.; Moll, J.L.;
A general solution method for two-dimensional nonplanar oxidation
1983 / IEEE
By: Soo-Young Oh; Daeje Chin; Dutton, R.W.;
IIB-4 analysis of the channel inversion layer capacitance in the very thin-gate IGFET
1983 / IEEE
By: Soo-Young Oh; Suk-Gi Choi; Sodini, C.G.; Moll, J.L.;
IT SoC: Enabler of the Ubiquitous Society
2006 / IEEE / 0-7803-9734-7
By: Soo-Young Oh;

Return To Top