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Author: Smith, B.J.
Results
2000 / IEEE
By: Huggins, J.E.; Levine, S.P.; Smith, B.J.; Elisevich, K.V.; Kushwaha, R.K.; BeMent, S.L.; Passaro, E.A.; Rohde, M.M.; Schuh, L.A.; Ross, D.A.;
By: Huggins, J.E.; Levine, S.P.; Smith, B.J.; Elisevich, K.V.; Kushwaha, R.K.; BeMent, S.L.; Passaro, E.A.; Rohde, M.M.; Schuh, L.A.; Ross, D.A.;
2004 / IEEE / 1-55752-778-4
By: Raymer, M.G.; Smith, B.J.; Walmsley, I.A.; Banaszek, K.; Killett, B.;
By: Raymer, M.G.; Smith, B.J.; Walmsley, I.A.; Banaszek, K.; Killett, B.;
2005 / IEEE / 1-55752-796-2
By: Raymer, M.G.; Nahlik, A.; Killett, B.; Smith, B.J.; Walmsley, I.A.; Banaszek, K.;
By: Raymer, M.G.; Nahlik, A.; Killett, B.; Smith, B.J.; Walmsley, I.A.; Banaszek, K.;
2008 / IEEE / 978-0-7695-3094-9
By: Ayyagari, A.; Battles, C.F.; Smith, B.J.; Uczekaj, S.A.; Ung, K.Y.;
By: Ayyagari, A.; Battles, C.F.; Smith, B.J.; Uczekaj, S.A.; Ung, K.Y.;
2008 / IEEE / 978-1-55752-859-9
By: Mosley, P.J.; Smith, B.J.; Puentes, G.; Lundeen, J.S.; Cohen, O.; Walmsley, I.A.;
By: Mosley, P.J.; Smith, B.J.; Puentes, G.; Lundeen, J.S.; Cohen, O.; Walmsley, I.A.;
2008 / IEEE / 978-1-55752-859-9
By: Smith, B.J.; Coldenstrodt-Ronge, H.B.; Branderhorst, M.; Lundeen, J.S.; Puentes, G.; Walmsley, I.A.;
By: Smith, B.J.; Coldenstrodt-Ronge, H.B.; Branderhorst, M.; Lundeen, J.S.; Puentes, G.; Walmsley, I.A.;
2008 / IEEE / 978-1-55752-859-9
By: Feito, A.; Coldenstrodt-Ronge, H.B.; Pregnell, K.L.; Lundeen, J.S.; Smith, B.J.; Walmsley, I.A.; Plenio, M.; Eisert, J.; Silberhorn, C.;
By: Feito, A.; Coldenstrodt-Ronge, H.B.; Pregnell, K.L.; Lundeen, J.S.; Smith, B.J.; Walmsley, I.A.; Plenio, M.; Eisert, J.; Silberhorn, C.;
2009 / IEEE / 978-1-4244-4079-5
By: Gates, J.C.; Kundys, D.O.; Smith, P.G.R.; Walmsley, I.A.; Lundeen, J.S.; Smith, B.J.; Gawith, C.B.E.;
By: Gates, J.C.; Kundys, D.O.; Smith, P.G.R.; Walmsley, I.A.; Lundeen, J.S.; Smith, B.J.; Gawith, C.B.E.;
2009 / IEEE / 978-1-4244-4079-5
By: Kacprowicz, M.; Demkowicz-Dobrzanski, R.; Walmsley, I.A.; Lundeen, J.S.; Wasilewski, W.; Smith, B.J.; Dorner, U.; Banaszek, K.;
By: Kacprowicz, M.; Demkowicz-Dobrzanski, R.; Walmsley, I.A.; Lundeen, J.S.; Wasilewski, W.; Smith, B.J.; Dorner, U.; Banaszek, K.;
2009 / IEEE / 978-1-55752-869-8
By: Mosley, P.J.; Datta, A.; Feito, A.; Puentes, G.; Lundeen, J.S.; Eisert, J.; Smith, B.J.; Coldenstrodt-Ronge, H.B.; Walmsley, I.A.; Plenio, M.;
By: Mosley, P.J.; Datta, A.; Feito, A.; Puentes, G.; Lundeen, J.S.; Eisert, J.; Smith, B.J.; Coldenstrodt-Ronge, H.B.; Walmsley, I.A.; Plenio, M.;
2009 / IEEE / 978-1-55752-869-8
By: Mahou, P.; Smith, B.J.; Walmsley, I.A.; Lundeen, J.S.; Cohen, O.;
By: Mahou, P.; Smith, B.J.; Walmsley, I.A.; Lundeen, J.S.; Cohen, O.;
2009 / IEEE / 978-1-4244-3829-7
By: Lundeen, J.S.; Ralph, T.C.; Worsley, A.P.; Coldenstrodt-Ronge, H.B.; Walmsley, I.A.; Plenio, M.B.; Eisert, J.; Feito, A.; Thomas-Peter, N.; Puentes, G.; Smith, B.J.; Mosley, P.J.; Silberhorn, C.; Pregnell, K.L.;
By: Lundeen, J.S.; Ralph, T.C.; Worsley, A.P.; Coldenstrodt-Ronge, H.B.; Walmsley, I.A.; Plenio, M.B.; Eisert, J.; Feito, A.; Thomas-Peter, N.; Puentes, G.; Smith, B.J.; Mosley, P.J.; Silberhorn, C.; Pregnell, K.L.;
2010 / IEEE / 978-1-55752-890-2
By: Noriega, F.; Cohen, O.; Puentes, G.; Coldenstrodt-Ronge, H.B.; Yang, X.; Walmsley, I.A.; Smith, B.J.; Lundeen, J.S.;
By: Noriega, F.; Cohen, O.; Puentes, G.; Coldenstrodt-Ronge, H.B.; Yang, X.; Walmsley, I.A.; Smith, B.J.; Lundeen, J.S.;
2010 / IEEE / 978-1-55752-890-2
By: Lundeen, J.S.; Puentes, G.; Smith, B.J.; Nunn, J.; Walmsley, I.A.;
By: Lundeen, J.S.; Puentes, G.; Smith, B.J.; Nunn, J.; Walmsley, I.A.;
2010 / IEEE / 978-1-55752-890-2
By: Walmsley, I.A.; Smith, P.; Kundys, D.; Smith, B.J.; Thomas-Peter, N.;
By: Walmsley, I.A.; Smith, P.; Kundys, D.; Smith, B.J.; Thomas-Peter, N.;
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