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Author: Shpak, V.G.
Results
2004 / IEEE / 978-5-87911-088-3
By: Shpak, V.G.; Rostov, V.V.; Mesyats, G.A.; Korovin, S.D.; Yalandin, M.I.;
By: Shpak, V.G.; Rostov, V.V.; Mesyats, G.A.; Korovin, S.D.; Yalandin, M.I.;
2011 / IEEE / 978-1-61284-329-2
By: Shpak, V.G.; Yalandin, M.I.; Sharypov, K.A.; Rukin, S.N.; Shunailov, S.A.; Klimov, A.I.; Rostov, V.V.; Ul'masculov, M.R.;
By: Shpak, V.G.; Yalandin, M.I.; Sharypov, K.A.; Rukin, S.N.; Shunailov, S.A.; Klimov, A.I.; Rostov, V.V.; Ul'masculov, M.R.;
2011 / IEEE / 978-1-61284-329-2
By: Zybin, K.P.; Mesyats, G.A.; Gurevich, A.V.; Yalandin, M.I.; Shunailov, S.A.; Shpak, V.G.; Reutova, A.G.;
By: Zybin, K.P.; Mesyats, G.A.; Gurevich, A.V.; Yalandin, M.I.; Shunailov, S.A.; Shpak, V.G.; Reutova, A.G.;
High-voltage picosecond reflectometry in investigations of dynamic characteristics of discharge gaps
2011 / IEEE / 978-1-4577-0631-8By: Ul'masculov, M.R.; Reutova, A.G.; Shunailov, S.A.; Shpak, V.G.; Sharypov, K.A.; Yalandin, M.I.;
HIGH-POWER REPETITIVE MILLIMETER RANGE BACK-WAVE OSCILLATORS WITH NANOSECOND RELATIVISTIC ELECTRON B
1993 / IEEE / 0-7803-1415-8By: Yalandin, M.I.; Shunailov, S.A.; Shpak, V.G.; Smirnov, G.T.;
1997 / IEEE / 0-7803-4213-5
By: Ronald, K.; Cross, A.W.; Phelps, A.D.R.; Yalandin, M.I.; He, W.; Sokovnin, S.Yu.; Shunailov, S.A.; Shpak, V.G.; Oulmascoulov, M.R.;
By: Ronald, K.; Cross, A.W.; Phelps, A.D.R.; Yalandin, M.I.; He, W.; Sokovnin, S.Yu.; Shunailov, S.A.; Shpak, V.G.; Oulmascoulov, M.R.;
1999 / IEEE
By: Shpak, V.G.; Cross, A.W.; Sergeev, A.S.; Phelps, A.D.R.; Yalandin, M.I.; Zotova, I.V.; Ginzburg, N.S.; Tarakanov, V.P.;
By: Shpak, V.G.; Cross, A.W.; Sergeev, A.S.; Phelps, A.D.R.; Yalandin, M.I.; Zotova, I.V.; Ginzburg, N.S.; Tarakanov, V.P.;
1999 / IEEE / 5-7422-0083-8
By: Zotova, I.V.; Sergeev, A.S.; Ginzburg, N.S.; Tarakanov, V.P.; Shpak, V.G.; Wiggins, S.M.; Cross, A.W.; Phelps, A.D.R.; Yalandin, M.I.;
By: Zotova, I.V.; Sergeev, A.S.; Ginzburg, N.S.; Tarakanov, V.P.; Shpak, V.G.; Wiggins, S.M.; Cross, A.W.; Phelps, A.D.R.; Yalandin, M.I.;
1998 / IEEE / 0-7803-4287-9
By: Phelps, A.D.R.; Cross, A.W.; Peskov, N.Yu.; Sergeev, A.S.; Zotova, I.V.; Novozhilova, Yu.N.; Ginzburg, N.S.; Tarakanov, V.P.; Ulmaskulov, M.R.; Shunailov, S.A.; Yalandin, M.I.; Shpak, V.G.; Ronald, K.; He, W.; Wiggins, S.M.;
By: Phelps, A.D.R.; Cross, A.W.; Peskov, N.Yu.; Sergeev, A.S.; Zotova, I.V.; Novozhilova, Yu.N.; Ginzburg, N.S.; Tarakanov, V.P.; Ulmaskulov, M.R.; Shunailov, S.A.; Yalandin, M.I.; Shpak, V.G.; Ronald, K.; He, W.; Wiggins, S.M.;
1998 / IEEE / 0-306-46206-0
By: Zotova, L.V.; Novozhilova, N.Yu.; Tarakanov, V.P.; Ulmaskulov, M.R.; Shunailov, S.A.; Yalandin, M.I.; Shpak, V.G.; Ginzburg, N.S.; Wiggins, S.M.; Ronald, K.; He, W.; Cross, W.; Phelps, A.D.R.; Sergeev, A.S.;
By: Zotova, L.V.; Novozhilova, N.Yu.; Tarakanov, V.P.; Ulmaskulov, M.R.; Shunailov, S.A.; Yalandin, M.I.; Shpak, V.G.; Ginzburg, N.S.; Wiggins, S.M.; Ronald, K.; He, W.; Cross, W.; Phelps, A.D.R.; Sergeev, A.S.;
1998 / IEEE / 0-7803-4287-9
By: Cross, A.W.; Phelps, A.D.R.; Sergeev, A.S.; Novozhilova, Yu.V.; Zotova, I.V.; Wiggins, S.M.; Ulmaskulov, M.R.; Shunailov, S.A.; Ginzburg, N.S.; Yalandin, M.I.; Shpak, V.G.;
By: Cross, A.W.; Phelps, A.D.R.; Sergeev, A.S.; Novozhilova, Yu.V.; Zotova, I.V.; Wiggins, S.M.; Ulmaskulov, M.R.; Shunailov, S.A.; Ginzburg, N.S.; Yalandin, M.I.; Shpak, V.G.;
1999 / IEEE / 0-7803-5498-2
By: Shpak, V.G.; Yalandin, M.I.; Ronald, K.; Wiggins, S.M.; Cross, A.W.; Phelps, A.D.R.; Sergeev, A.S.; Novozhilova, N.Yu.; Zotova, I.V.; Ginzburg, N.S.; Oulmaskoulov, M.R.; Shunailov, S.A.;
By: Shpak, V.G.; Yalandin, M.I.; Ronald, K.; Wiggins, S.M.; Cross, A.W.; Phelps, A.D.R.; Sergeev, A.S.; Novozhilova, N.Yu.; Zotova, I.V.; Ginzburg, N.S.; Oulmaskoulov, M.R.; Shunailov, S.A.;
2000 / IEEE
By: Ginzburg, N.S.; Oulmaskoulov, M.R.; Shunailov, S.A.; Shpak, V.G.; Yalandin, M.I.; Ronald, K.; Zotova, I.V.; Cross, A.W.; Wiggins, M.; Phelps, A.D.R.; Sergeev, A.S.; Novozhilova, Y.V.;
By: Ginzburg, N.S.; Oulmaskoulov, M.R.; Shunailov, S.A.; Shpak, V.G.; Yalandin, M.I.; Ronald, K.; Zotova, I.V.; Cross, A.W.; Wiggins, M.; Phelps, A.D.R.; Sergeev, A.S.; Novozhilova, Y.V.;
2001 / IEEE / 0-7803-7141-0
By: Yalandin, M.I.; Lyubutin, S.K.; Oulmascoulov, M.R.; Slovikovsky, A.B.G.; Shpak, V.G.; Shunailov, S.A.; Rukin, S.N.;
By: Yalandin, M.I.; Lyubutin, S.K.; Oulmascoulov, M.R.; Slovikovsky, A.B.G.; Shpak, V.G.; Shunailov, S.A.; Rukin, S.N.;
2001 / IEEE / 0-7803-7120-8
By: Shpak, V.G.; Rukin, S.N.; Oulmascoulov, M.R.; Lyubutin, S.K.; Yalandin, M.I.; Slovikovsky, B.G.; Shunailov, S.A.;
By: Shpak, V.G.; Rukin, S.N.; Oulmascoulov, M.R.; Lyubutin, S.K.; Yalandin, M.I.; Slovikovsky, B.G.; Shunailov, S.A.;
2002 / IEEE
By: Yalandin, M.I.; Shunailov, S.A.; Shpak, V.G.; Ulmaskulov, M.R.; Rostov, V.V.; Korovin, S.D.; Klimov, A.I.;
By: Yalandin, M.I.; Shunailov, S.A.; Shpak, V.G.; Ulmaskulov, M.R.; Rostov, V.V.; Korovin, S.D.; Klimov, A.I.;
2002 / IEEE
By: Rukin, S.N.; Oulmascoulov, M.R.; Lyubutin, S.K.; Yalandin, M.I.; Slovikovsky, B.G.; Shunailov, S.A.; Shpak, V.G.;
By: Rukin, S.N.; Oulmascoulov, M.R.; Lyubutin, S.K.; Yalandin, M.I.; Slovikovsky, B.G.; Shunailov, S.A.; Shpak, V.G.;
2002 / IEEE / 0-7803-7540-8
By: Lyubutin, S.K.; Yalandin, M.I.; Slovikovsky, B.G.; Shunailov, S.A.; Shpak, V.G.; Rukin, S.N.;
By: Lyubutin, S.K.; Yalandin, M.I.; Slovikovsky, B.G.; Shunailov, S.A.; Shpak, V.G.; Rukin, S.N.;
2004 / IEEE
By: Shpak, V.G.; Rostov, V.V.; Pegel, I.V.; Mesyats, G.A.; Korovin, S.D.; Eltchaninov, A.A.; Yalandin, M.I.;
By: Shpak, V.G.; Rostov, V.V.; Pegel, I.V.; Mesyats, G.A.; Korovin, S.D.; Eltchaninov, A.A.; Yalandin, M.I.;
2004 / IEEE / 0-7803-8461-X
By: Rostov, V.V.; Yalandin, M.I.; Shunailov, S.A.; Shpak, V.G.; Korovin, S.D.; Murzakaev, A.M.; Mesyats, G.A.; Lilvinov, E.A.;
By: Rostov, V.V.; Yalandin, M.I.; Shunailov, S.A.; Shpak, V.G.; Korovin, S.D.; Murzakaev, A.M.; Mesyats, G.A.; Lilvinov, E.A.;
2004 / IEEE / 0-7803-8586-1
By: Slovikovsky, B.G.; Shunailov, S.A.; Shpak, V.G.; Sharypov, K.A.; Uhnaskulov, M.R.; Luybutin, S.K.; Rukin, S.N.; Yalandin, M.I.;
By: Slovikovsky, B.G.; Shunailov, S.A.; Shpak, V.G.; Sharypov, K.A.; Uhnaskulov, M.R.; Luybutin, S.K.; Rukin, S.N.; Yalandin, M.I.;
2005 / IEEE
By: Ulmaskulov, M.R.; Slovikovsky, B.G.; Sharypov, K.A.; Shunailov, S.A.; Shpak, V.G.; Yalandin, M.I.; Rukin, S.N.; Luybutin, S.K.; Rostov, V.V.; Korovin, S.D.;
By: Ulmaskulov, M.R.; Slovikovsky, B.G.; Sharypov, K.A.; Shunailov, S.A.; Shpak, V.G.; Yalandin, M.I.; Rukin, S.N.; Luybutin, S.K.; Rostov, V.V.; Korovin, S.D.;
2006 / IEEE
By: Mesyats, G.A.; Litvinov, E.A.; Korovin, S.D.; Yalandin, M.I.; Shpak, V.G.; Rukin, S.N.; Rostov, V.V.;
By: Mesyats, G.A.; Litvinov, E.A.; Korovin, S.D.; Yalandin, M.I.; Shpak, V.G.; Rukin, S.N.; Rostov, V.V.;
2007 / IEEE / 978-1-4244-0915-0
By: Yalandin, M.I.; Mesyats, G.A.; Klimov, A.I.; Elchaninov, A.A.; Gubanov, V.P.; Grishin, D.M.; Rostov, V.V.; Ulmasculov, M.R.; Timoshenkov, S.P.; Slovikovsky, B.G.; Shunailov, S.A.; Shpak, V.G.; Sharypov, K.A.; Rukin, S.N.; Luybutin, S.K.;
By: Yalandin, M.I.; Mesyats, G.A.; Klimov, A.I.; Elchaninov, A.A.; Gubanov, V.P.; Grishin, D.M.; Rostov, V.V.; Ulmasculov, M.R.; Timoshenkov, S.P.; Slovikovsky, B.G.; Shunailov, S.A.; Shpak, V.G.; Sharypov, K.A.; Rukin, S.N.; Luybutin, S.K.;
2007 / IEEE / 978-1-4244-0915-0
By: Sharypov, K.A.; Yalandin, M.I.; Mesyats, G.A.; Rostov, V.V.; Ulmasculov, M.R.; Shunailov, S.A.; Shpak, V.G.;
By: Sharypov, K.A.; Yalandin, M.I.; Mesyats, G.A.; Rostov, V.V.; Ulmasculov, M.R.; Shunailov, S.A.; Shpak, V.G.;
2007 / IEEE / 978-1-4244-0915-0
By: Sharypov, K.A.; Yalandin, M.I.; Mesyats, G.A.; Shunailov, S.A.; Shpak, V.G.;
By: Sharypov, K.A.; Yalandin, M.I.; Mesyats, G.A.; Shunailov, S.A.; Shpak, V.G.;
2007 / IEEE / 978-1-4244-0915-0
By: Afanas'ev, K.V.; Yalandin, M.I.; Shpak, V.G.; Mesyats, G.A.; Klimov, A.I.; Eltchaninov, A.A.; Bykov, N.M.;
By: Afanas'ev, K.V.; Yalandin, M.I.; Shpak, V.G.; Mesyats, G.A.; Klimov, A.I.; Eltchaninov, A.A.; Bykov, N.M.;
2008 / IEEE
By: Shunailov, S.A.; Shpak, V.G.; Sharypov, K.A.; Rostov, V.V.; Mesyats, G.A.; Yalandin, M.I.; Ulmaskulov, M.R.;
By: Shunailov, S.A.; Shpak, V.G.; Sharypov, K.A.; Rostov, V.V.; Mesyats, G.A.; Yalandin, M.I.; Ulmaskulov, M.R.;
2008 / IEEE / 978-1-4244-1534-2
By: Mesyats, G.A.; Rostov, V.V.; Zhakov, S.V.; Yermakov, A.E.; Yalandin, M.I.; Sharypov, K.A.; Shunailov, S.A.; Shpak, V.G.; Ulmasculov, M.R.;
By: Mesyats, G.A.; Rostov, V.V.; Zhakov, S.V.; Yermakov, A.E.; Yalandin, M.I.; Sharypov, K.A.; Shunailov, S.A.; Shpak, V.G.; Ulmasculov, M.R.;
2008 / IEEE / 978-1-4244-1534-2
By: Sharypov, K.A.; Yalandin, M.I.; Mesyats, G.A.; Shunailov, S.A.; Shpak, V.G.;
By: Sharypov, K.A.; Yalandin, M.I.; Mesyats, G.A.; Shunailov, S.A.; Shpak, V.G.;
2008 / IEEE / 978-1-4244-1534-2
By: Rostov, V.V.; Shunailov, S.A.; Shpak, V.G.; Rukin, S.N.; Yalandin, M.I.; Mesyats, G.A.;
By: Rostov, V.V.; Shunailov, S.A.; Shpak, V.G.; Rukin, S.N.; Yalandin, M.I.; Mesyats, G.A.;
2010 / IEEE
By: Sharypov, K.A.; Reutova, A.G.; Yalandin, M.I.; Mesyats, G.A.; Shpak, V.G.; Rostov, V.V.; Ul'masculov, M.R.; Shunailov, S.A.;
By: Sharypov, K.A.; Reutova, A.G.; Yalandin, M.I.; Mesyats, G.A.; Shpak, V.G.; Rostov, V.V.; Ul'masculov, M.R.; Shunailov, S.A.;
2010 / IEEE
By: Shpak, V.G.; Sharypov, K.A.; Reutova, A.G.; Yalandin, M.I.; Mesyats, G.A.; Ul'masculov, M.R.; Shunailov, S.A.;
By: Shpak, V.G.; Sharypov, K.A.; Reutova, A.G.; Yalandin, M.I.; Mesyats, G.A.; Ul'masculov, M.R.; Shunailov, S.A.;
Registration of initial stage of air breakdown in the fields of subgigawatt Ka-band microwave pulses
2009 / IEEE / 978-1-4244-4064-1By: Shpak, V.G.; Sharypov, K.A.; Reutova, A.G.; Yalandin, M.I.; Mesyats, G.A.; Ul'masculov, M.R.; Shunailov, S.A.;