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Author: Schmuckle, F.J.
Results
1995 / IEEE / 0-7803-2581-8
By: Heinrich, W.; Schmuckle, F.J.; Rheinfelder, C.; Gerdes, J.; Strohm, K.; Luy, J.-F.; Doerner, R.; Schaffler, F.;
By: Heinrich, W.; Schmuckle, F.J.; Rheinfelder, C.; Gerdes, J.; Strohm, K.; Luy, J.-F.; Doerner, R.; Schaffler, F.;
1996 / IEEE / 0-7803-3360-8
By: Luy, J.-F.; Schmuckle, F.J.; Gerdes, J.; Beisswanger, F.; Strohm, K.; Rheinfelder, C.; Heinrich, W.;
By: Luy, J.-F.; Schmuckle, F.J.; Gerdes, J.; Beisswanger, F.; Strohm, K.; Rheinfelder, C.; Heinrich, W.;
1996 / IEEE / 0-7803-3246-6
By: Beisswanger, F.; Strohm, K.; Rheinfelder, C.; Heinrich, W.; Luy, J.-F.; Schmuckle, F.J.; Gerdes, J.;
By: Beisswanger, F.; Strohm, K.; Rheinfelder, C.; Heinrich, W.; Luy, J.-F.; Schmuckle, F.J.; Gerdes, J.;
1996 / IEEE
By: Beisswanger, F.; Rheinfelder, C.N.; Heinrich, W.; Luy, J.F.; Strohm, K.M.; Schmuckle, F.J.; Gerdes, J.;
By: Beisswanger, F.; Rheinfelder, C.N.; Heinrich, W.; Luy, J.F.; Strohm, K.M.; Schmuckle, F.J.; Gerdes, J.;
2001 / IEEE / 0-930815-64-5
By: Schmuckle, F.J.; Wolf, J.; Reichl, H.; Heinrich, W.; Kasap, T.; Petter, D.;
By: Schmuckle, F.J.; Wolf, J.; Reichl, H.; Heinrich, W.; Kasap, T.; Petter, D.;
2001 / IEEE / 0-7803-6538-0
By: Schmuckle, F.J.; Spinnler, M.; Butz, J.; Heinrich, W.; Jentzsch, A.;
By: Schmuckle, F.J.; Spinnler, M.; Butz, J.; Heinrich, W.; Jentzsch, A.;
2002 / IEEE / 0-7803-7239-5
By: Schauwecker, B.; Schmuckle, F.J.; Strohm, K.M.; Heinrich, W.; Luy, J.-F.;
By: Schauwecker, B.; Schmuckle, F.J.; Strohm, K.M.; Heinrich, W.; Luy, J.-F.;
2002 / IEEE / 0-7803-7239-5
By: Riepe, K.; Oppermann, H.; Jentzsch, A.; Schmuckle, F.J.; Heinrich, W.;
By: Riepe, K.; Oppermann, H.; Jentzsch, A.; Schmuckle, F.J.; Heinrich, W.;
2003 / IEEE / 0-7803-7695-1
By: Heinrich, W.; Luy, J.-F.; Yaglioglu, O.; Schmuckle, F.J.; Strohm, K.M.;
By: Heinrich, W.; Luy, J.-F.; Yaglioglu, O.; Schmuckle, F.J.; Strohm, K.M.;
2003 / IEEE / 0-7803-7695-1
By: Schmuckle, F.J.; Jentzsch, A.; Gassler, C.; Marschall, P.; Geiger, D.; Heinrich, W.;
By: Schmuckle, F.J.; Jentzsch, A.; Gassler, C.; Marschall, P.; Geiger, D.; Heinrich, W.;
2004 / IEEE / 0-7803-8331-1
By: Kunze, M.; Adam, K.; Ferling, D.; Heinrich, W.; Schmuckle, F.J.; Talukder, P.;
By: Kunze, M.; Adam, K.; Ferling, D.; Heinrich, W.; Schmuckle, F.J.; Talukder, P.;
2005 / IEEE / 0-7803-8845-3
By: Schmuckle, F.J.; Heinrich, W.; Riepe, K.; Topper, M.; Engelmann, G.; Oppermann, H.; Klein, M.; Hutter, M.; Lenk, F.;
By: Schmuckle, F.J.; Heinrich, W.; Riepe, K.; Topper, M.; Engelmann, G.; Oppermann, H.; Klein, M.; Hutter, M.; Lenk, F.;
2006 / IEEE / 0-7803-9541-7
By: Schmuckle, F.J.; Meliani, C.; Neuner, M.; Talukder, P.K.; Heinrich, W.;
By: Schmuckle, F.J.; Meliani, C.; Neuner, M.; Talukder, P.K.; Heinrich, W.;
2007 / IEEE / 1-4244-0687-0
By: Heinrich, W.; Rostewitz, M.; Hirche, K.; Gross, W.; Schmuckle, F.J.;
By: Heinrich, W.; Rostewitz, M.; Hirche, K.; Gross, W.; Schmuckle, F.J.;