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Author: Scheuermann, M.
Results
2011 / IEEE / 978-1-4503-0636-2
By: Puri, R.; Kursun, E.; Carpenter, G.; Burns, J.; Scheuermann, M.; Warnock, J.;
By: Puri, R.; Kursun, E.; Carpenter, G.; Burns, J.; Scheuermann, M.; Warnock, J.;
2012 / IEEE / 978-1-4673-0351-4
By: Knickerbocker, J.; Webb, B.; Rose, K.; Scheuermann, M.; Jian-Qiang Lu; Putnam, C.; Xiaoxiong Gu; Zheng Xu;
By: Knickerbocker, J.; Webb, B.; Rose, K.; Scheuermann, M.; Jian-Qiang Lu; Putnam, C.; Xiaoxiong Gu; Zheng Xu;
2012 / IEEE / 978-1-4673-1965-2
By: Webb, B.C.; Rose, K.; Scheuermann, M.; Xiaoxiong Gu; Zheng Xu; Jian-Qiang Lu; Knickerbocker, J.U.;
By: Webb, B.C.; Rose, K.; Scheuermann, M.; Xiaoxiong Gu; Zheng Xu; Jian-Qiang Lu; Knickerbocker, J.U.;
2012 / IEEE / 978-1-4673-1965-2
By: Rose, K.; Scheuermann, M.; Xiaoxiong Gu; Zheng Xu; Jian-Qiang Lu; Knickerbocker, J.U.; Webb, B.C.;
By: Rose, K.; Scheuermann, M.; Xiaoxiong Gu; Zheng Xu; Jian-Qiang Lu; Knickerbocker, J.U.; Webb, B.C.;
A high-speed silicon metal-semiconductor-metal photodetector fully integrable with (Bi)CMOS circuits
1991 / IEEE / 0-7803-0243-5By: Bassous, E.; Iyer, S.S.; Halbout, J.-M.; Ritter, M.; Kesan, V.P.; Scheuermann, M.;
2001 / IEEE / 0-7803-6608-5
By: Anderson, C.J.; Zoric, B.; Weitzel, S.; Weiss, R.; Wagoner, J.; Schmidt, S.; Scheuermann, M.; Runyon, S.; Restle, P.J.; Plum, G.; McCredie, B.; Pong-Fei Lu; LeBlanc, J.; Krauter, B.; Harvey, P.; Dudley, P.; DiLullo, J.; Clabes, J.; Chu, S.; Carter, C.; Tendier, J.M.; Nussbaum, G.; Warnock, J.; Keaty, J.M.; Petrovick, J.;
By: Anderson, C.J.; Zoric, B.; Weitzel, S.; Weiss, R.; Wagoner, J.; Schmidt, S.; Scheuermann, M.; Runyon, S.; Restle, P.J.; Plum, G.; McCredie, B.; Pong-Fei Lu; LeBlanc, J.; Krauter, B.; Harvey, P.; Dudley, P.; DiLullo, J.; Clabes, J.; Chu, S.; Carter, C.; Tendier, J.M.; Nussbaum, G.; Warnock, J.; Keaty, J.M.; Petrovick, J.;
2011 / IEEE
By: Goren, D.; Gordin, R.; Tyberg, C.; Xiaoxiong Gu; Fei Liu; Young, A.; Scheuermann, M.; Elad, D.; Shlafman, S.;
By: Goren, D.; Gordin, R.; Tyberg, C.; Xiaoxiong Gu; Fei Liu; Young, A.; Scheuermann, M.; Elad, D.; Shlafman, S.;