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Author: San-Lein Wu

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Low-Frequency Noise Characteristics of GaN Schottky Barrier Photodetectors Prepared With Nickel Annealing
2012 / IEEE
By: Shih-Ming Wang; Sheng-Joue Young; Bohr-Ran Huang; Shoou-Jinn Chang; Chih-Hung Hsiao; Tse-Pu Chen; Chun-Bo Yang; San-Lein Wu;
Influences of surface reconstruction on the atomic-layer-deposited HfO2/Al2O3/n-InAs metal-oxide-semiconductor capacitors
2011 / American Institute of Physics
By: Hau-Yu Lin; San-Lein Wu; Chao-Ching Cheng; Chih-Hsin Ko; Clement H. Wann; You-Ru Lin; Shoou-Jinn Chang; Tai-Bor Wu;
Effects of Mechanical Uniaxial Stress on SiGe HBT Characteristics
2006 / IEEE / 1-4244-0461-4
By: Tzu-Juei Wang; Tang, D.D.; Wen-Chin Lee; San-Lein Wu; Chih-Hsin Ko; Shoou-Jinn Chang; Ping-Chun Yeh; John Yeh; Hung-Wei Chen;
The Effects of Mechanical Uniaxial Stress on Junction Leakage in Nanoscale CMOSFETs
2008 / IEEE
By: Ta-Ming Kuan; San-Lein Wu; Shoou-Jinn Chang; Chih-Hsin Ko; Tzu-Juei Wang; Wen-Chin Lee;
Investigation of Metallized Source/Drain Extension for High-Performance Strained NMOSFETs
2008 / IEEE
By: Tzu-Juei Wang; Wen-Chin Lee; Ta-Ming Kuan; San-Lein Wu; Shoou-Jinn Chang; Hong-Nien Lin; Chih-Hsin Ko;
Enhancement of CMOSFETs Performance by Utilizing SACVD-Based Shallow Trench Isolation for the 40-nm Node and Beyond
2011 / IEEE
By: Shoou-Jinn Chang; San-Lein Wu; Yao-Tsung Huang; Cheng, O.; Cheng-Tung Huang; Cheng-Wen Kuo; Tzu-Juei Wang; Chin-Kai Hung;
Origin of Stress Memorization Mechanism in Strained-Si nMOSFETs Using a Low-Cost Stress-Memorization Technique
2011 / IEEE
By: Yao-Chin Cheng; Ya-Ting Chen; Cheng-Wen Kuo; Shoou-Jinn Chang; San-Lein Wu; Yao-Tsung Huang; Cheng, O.;
InGaN Metal-Semiconductor-Metal Photodetectors With Aluminum Nitride Cap Layers
2011 / IEEE
By: Shoou-Jinn Chang; Ping-Chuan Chang; Kai-Hsuan Lee; San-Lein Wu;

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