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Author: Rodriguez, B.
Results
2012 / IEEE
By: Kolen'ko, Y.V.; Banobre-Lopez, M.; Rodriguez, C.; Rivas, J.; Freitas, P.; Rodriguez, B.;
By: Kolen'ko, Y.V.; Banobre-Lopez, M.; Rodriguez, C.; Rivas, J.; Freitas, P.; Rodriguez, B.;
2011 / IEEE / 978-1-4673-0490-0
By: Murphy, M.; Kuo, C.; Frankhouser, D.; Hok-Hei Tam; Rodriguez, B.; Bundschuh, R.; Yan, P.; Marcucci, G.; Blum, W.; Trimarchi, M.; Curfman, J.; Schwind, S.; Ball, B.; Parikh, D.;
By: Murphy, M.; Kuo, C.; Frankhouser, D.; Hok-Hei Tam; Rodriguez, B.; Bundschuh, R.; Yan, P.; Marcucci, G.; Blum, W.; Trimarchi, M.; Curfman, J.; Schwind, S.; Ball, B.; Parikh, D.;
2015 / IEEE
By: Compton-Young, L.; McCauley-Bush, P.; Rabelo, L.; Meza, K.; Ferraras, A.; Rodriguez, B.; Kelarestani, M.; Miranda, D.; Millan, A.;
By: Compton-Young, L.; McCauley-Bush, P.; Rabelo, L.; Meza, K.; Ferraras, A.; Rodriguez, B.; Kelarestani, M.; Miranda, D.; Millan, A.;
A proven embedded DRAM compiler for deep submicron logic processes and system-on-a-chip ASIC designs
1998 / IEEE / 0-7803-4980-6By: Tsang, T.; Crafts, H.; Haag, G.; Rodriguez, B.;
1998 / IEEE / 0-7803-5200-9
By: Ferrero, J.M.; Saiz, J.; Torres, V.; Trenor, B.; Rodriguez, B.; Ferrero, J.M., Jr; Thakor, N.V.;
By: Ferrero, J.M.; Saiz, J.; Torres, V.; Trenor, B.; Rodriguez, B.; Ferrero, J.M., Jr; Thakor, N.V.;
1998 / IEEE / 0-7803-5200-9
By: Saiz, J.; Rodriguez, B.; Ferrero, J.M., Jr; Trenor, B.; Thakor, N.K.; Ferrero, J.M.;
By: Saiz, J.; Rodriguez, B.; Ferrero, J.M., Jr; Trenor, B.; Thakor, N.K.; Ferrero, J.M.;
1998 / IEEE / 0-7803-5200-9
By: Thakor, N.V.; Ferrero, J.M.; Trenor, B.; Ferrero, J.M., Jr; Rodriguez, B.;
By: Thakor, N.V.; Ferrero, J.M.; Trenor, B.; Ferrero, J.M., Jr; Rodriguez, B.;
1998 / IEEE / 0-7803-5164-9
By: Trenor, B.; Thakor, N.V.; Ferrero, J.M.; Saiz, J.; Rodriguez, B.; Ferrero, J.M., Jr.;
By: Trenor, B.; Thakor, N.V.; Ferrero, J.M.; Saiz, J.; Rodriguez, B.; Ferrero, J.M., Jr.;
1998 / IEEE / 0-7803-5164-9
By: Saiz, J.; Ferrero, J.M.; Trenor, B.; Ferrero, J.M., Jr.; Rodriguez, B.; Thakori, N.V.;
By: Saiz, J.; Ferrero, J.M.; Trenor, B.; Ferrero, J.M., Jr.; Rodriguez, B.; Thakori, N.V.;
2002 / IEEE / 0-7803-7554-8
By: Rodriguez, B.; Martinez-Navedo, T.; O'Neill-Carrillo, E.; Oliveras, V.; Mendez, A.;
By: Rodriguez, B.; Martinez-Navedo, T.; O'Neill-Carrillo, E.; Oliveras, V.; Mendez, A.;
2003 / IEEE / 0-7803-7579-3
By: Rodriguez, B.; Vazquez, P.M.; Strays, M.M.R.F.; Jensen, E.W.; Litvan, H.;
By: Rodriguez, B.; Vazquez, P.M.; Strays, M.M.R.F.; Jensen, E.W.; Litvan, H.;
2003 / IEEE / 0-7803-7789-3
By: Trayanova, N.; Ferrero, J.M., Jr.; Tice, B.; Eason, J.C.; Rodriguez, B.;
By: Trayanova, N.; Ferrero, J.M., Jr.; Tice, B.; Eason, J.C.; Rodriguez, B.;
2006 / IEEE / 1-4244-0032-5
By: Rodriguez, B.; Maharaj, T.; Gavaghan, D.J.; Trayanova, N.A.; Blake, R.;
By: Rodriguez, B.; Maharaj, T.; Gavaghan, D.J.; Trayanova, N.A.; Blake, R.;
2006 / IEEE / 978-1-4244-2532-7
By: Maharaj, T.; Gavaghan, D.J.; Trayanova, N.A.; Blake, R.; Rodriguez, B.;
By: Maharaj, T.; Gavaghan, D.J.; Trayanova, N.A.; Blake, R.; Rodriguez, B.;
2008 / IEEE / 978-1-4244-2399-6
By: Tonina, A.; Wendler, K.; Zhang, N.F.; Elmquist, R.E.; Jarrett, D.G.; Rodriguez, B.; Hernandez, F.; Porfiri, M.; Inglis, D.; Slomovitz, D.; Faverio, C.; Izquierdo, D.; Schechter, H.; Femandes, J.;
By: Tonina, A.; Wendler, K.; Zhang, N.F.; Elmquist, R.E.; Jarrett, D.G.; Rodriguez, B.; Hernandez, F.; Porfiri, M.; Inglis, D.; Slomovitz, D.; Faverio, C.; Izquierdo, D.; Schechter, H.; Femandes, J.;
2008 / IEEE / 978-1-4244-3706-1
By: Bernabeu, M.O.; Rodriguez, B.; Grau, V.; Gavaghan, D.J.; Pitt-Francis, J.; Bishop, M.J.;
By: Bernabeu, M.O.; Rodriguez, B.; Grau, V.; Gavaghan, D.J.; Pitt-Francis, J.; Bishop, M.J.;
2009 / IEEE / 978-1-4244-7282-6
By: Tan, J.; Peachey, T.; Garic, S.; Enticott, C.; Bethwaite, B.; Abramson, D.; Rodriguez, B.; Pitt-Francis, J.; Corrias, A.; Bernabeu, M.O.; Gavaghan, D.;
By: Tan, J.; Peachey, T.; Garic, S.; Enticott, C.; Bethwaite, B.; Abramson, D.; Rodriguez, B.; Pitt-Francis, J.; Corrias, A.; Bernabeu, M.O.; Gavaghan, D.;
2010 / IEEE / 978-1-4244-5853-0
By: Singh, N.; Kale, R.; Graziano, J.; McKosky, R.; Nasipuri, A.; Alasti, H.; Van der Zel, L.; Conrad, J.M.; Cox, R.; Rodriguez, B.;
By: Singh, N.; Kale, R.; Graziano, J.; McKosky, R.; Nasipuri, A.; Alasti, H.; Van der Zel, L.; Conrad, J.M.; Cox, R.; Rodriguez, B.;
2010 / IEEE / 978-1-4244-5853-0
By: Puthran, P.; Alasti, H.; Nasipuri, A.; Graziano, J.; Cox, R.; McKosky, R.; Rodriguez, B.; Van der Zel, L.; Conrad, J.;
By: Puthran, P.; Alasti, H.; Nasipuri, A.; Graziano, J.; Cox, R.; McKosky, R.; Rodriguez, B.; Van der Zel, L.; Conrad, J.;
2010 / IEEE / 978-1-4244-4123-5
By: Kohl, P.; Gavaghan, D.; Schneider, J.E.; Hales, P.; Rodriguez, B.; Grau, V.; Bordas, R.; Burton, R.A.B.;
By: Kohl, P.; Gavaghan, D.; Schneider, J.E.; Hales, P.; Rodriguez, B.; Grau, V.; Bordas, R.; Burton, R.A.B.;
2010 / IEEE / 978-1-4244-4123-5
By: Walmsley, J.; Burrage, K.; Rodriguez, B.; Bollensdorff, C.; Bahoshy, M.; Mirams, G.;
By: Walmsley, J.; Burrage, K.; Rodriguez, B.; Bollensdorff, C.; Bahoshy, M.; Mirams, G.;
A new ECG biomarker for drug toxicity: A combined signal processing and computational modeling study
2010 / IEEE / 978-1-4244-4123-5By: Rodriguez, B.; Xiao Jie; Pueyo, E.;
Human and rabbit inter-species comparison of ionic mechanisms of arrhythmic risk: A simulation study
2010 / IEEE / 978-1-4244-4123-5By: Rodriguez, B.; Trenor, B.; Carbonell, B.; Romero, L.; Ferrero, J.M.; Saiz, J.;
2010 / IEEE / 978-1-4244-4123-5
By: Rodriguez, B.; Ferrero, J.M.; Corrias, A.; Gomis-Tena, J.; Gonzalez, R.; Saiz, J.;
By: Rodriguez, B.; Ferrero, J.M.; Corrias, A.; Gomis-Tena, J.; Gonzalez, R.; Saiz, J.;
2010 / IEEE / 978-1-4244-8389-1
By: Rodriguez, B.; Van der Zel, L.; Conrad, J.; Cox, R.; Nasipuri, A.; McKosky, R.;
By: Rodriguez, B.; Van der Zel, L.; Conrad, J.; Cox, R.; Nasipuri, A.; McKosky, R.;
Gender and age based differences in risk of proarrhythmia by dofetilide: A computational model study
2010 / IEEE / 978-1-4244-7319-9By: Ferrero, J.M.; Corrias, A.; Gomis-Tena, J.; Gonzalez, R.; Saiz, J.; Rodriguez, B.;