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Author: Onel, Y.
Results
1992 / IEEE / 0-7803-0884-0
By: Brown, D.; Carey, R.; Young, K.; Smirnov, A.; Shmakov, K.; Savin, A.; Rennich, M.; Placil, F.; Kamyshkov, Y.; Cohn, H.; Elder, C.; Ayer, F.; Wigmans, R.; Kroeger, R.; Bugg, W.; Reidy, J.; Moore, B.; Miller, R.; Bromberg, C.; Sandro, J.; Onel, Y.; Langland, J.; Akchurin, N.; Winn, D.R.; Wall, D.; Segall, K.; Dye, S.; Hazen, E.; Higby, D.; Miller, J.; Sulak, L.; Sullivan, J.; Worstell, W.; Brower, W.; Paar, H.; Kefford, D.; Pisani, R.;
By: Brown, D.; Carey, R.; Young, K.; Smirnov, A.; Shmakov, K.; Savin, A.; Rennich, M.; Placil, F.; Kamyshkov, Y.; Cohn, H.; Elder, C.; Ayer, F.; Wigmans, R.; Kroeger, R.; Bugg, W.; Reidy, J.; Moore, B.; Miller, R.; Bromberg, C.; Sandro, J.; Onel, Y.; Langland, J.; Akchurin, N.; Winn, D.R.; Wall, D.; Segall, K.; Dye, S.; Hazen, E.; Higby, D.; Miller, J.; Sulak, L.; Sullivan, J.; Worstell, W.; Brower, W.; Paar, H.; Kefford, D.; Pisani, R.;
1993 / IEEE / 0-7803-1203-1
By: Hall, J.; Kreiser, H.; Conte, M.; Bravar, A.; Badano, L.; Akchnrin, N.; Rossmanith, R.; Rinckel, T.; Pusterla, M.; Pisent, A.; Penzo, A.; Onel, Y.; Olchowski, F.; McPherson, J.;
By: Hall, J.; Kreiser, H.; Conte, M.; Bravar, A.; Badano, L.; Akchnrin, N.; Rossmanith, R.; Rinckel, T.; Pusterla, M.; Pisent, A.; Penzo, A.; Onel, Y.; Olchowski, F.; McPherson, J.;
1998 / IEEE / 0-7803-5021-9
By: Adams, M.; Akchurin, N.; Marchant, J.; Wayne, M.; Tschirhart, R.; Ruchti, R.; Ronzhin, A.; Rivetta, C.; Reidy, J.; Reichanadter, M.; Onel, Y.; Lu, Q.; Los, S.; Johnson, K.; Heering, A.; Harrison, N.; Hansen, S.; Hagopian, V.; Freeman, J.; Elias, J.; Cushman, P.; Chung, M.; Booke, M.; Binkley, M.; Baumbaugh, B.; Baumbaugh, A.;
By: Adams, M.; Akchurin, N.; Marchant, J.; Wayne, M.; Tschirhart, R.; Ruchti, R.; Ronzhin, A.; Rivetta, C.; Reidy, J.; Reichanadter, M.; Onel, Y.; Lu, Q.; Los, S.; Johnson, K.; Heering, A.; Harrison, N.; Hansen, S.; Hagopian, V.; Freeman, J.; Elias, J.; Cushman, P.; Chung, M.; Booke, M.; Binkley, M.; Baumbaugh, B.; Baumbaugh, A.;
2004 / IEEE
By: Gulmez, E.; Akgun, U.; Ayan, A.S.; Anderson, E.W.; Miller, M.; Winn, D.; Schmidt, I.; Onel, Y.;
By: Gulmez, E.; Akgun, U.; Ayan, A.S.; Anderson, E.W.; Miller, M.; Winn, D.; Schmidt, I.; Onel, Y.;
2004 / IEEE / 0-7803-8248-X
By: Gulmez, E.; Winn, D.; Schmidt, I.; Onel, Y.; Olson, J.; Anderson, E.W.; Akgun, U.; Mestvirishvili, A.; Duru, F.; Bruecken, P.; Ayan, A.S.; Miller, M.;
By: Gulmez, E.; Winn, D.; Schmidt, I.; Onel, Y.; Olson, J.; Anderson, E.W.; Akgun, U.; Mestvirishvili, A.; Duru, F.; Bruecken, P.; Ayan, A.S.; Miller, M.;
2006 / IEEE
By: Onel, Y.; Ayan, A.S.; Bruecken, P.; Akgun, U.; Schmidt, I.; Duru, F.; Mestvirishvili, A.; Gulmez, E.; Albayrak, E.A.; Olson, J.;
By: Onel, Y.; Ayan, A.S.; Bruecken, P.; Akgun, U.; Schmidt, I.; Duru, F.; Mestvirishvili, A.; Gulmez, E.; Albayrak, E.A.; Olson, J.;
2008 / IEEE / 978-1-4244-2714-7
By: Akgun, U.; Bilki, B.; Yetkin, T.; Winn, D.; Wetzel, J.; Sonmez, N.; Sanders, D.; Ozok, F.; Onel, Y.; Mestvirishvili, A.; Moeller, A.; Duru, F.; Cremaldi, L.; Albayrak, E. A.; Bruecken, P.; Cankocak, K.; Clarida, W.;
By: Akgun, U.; Bilki, B.; Yetkin, T.; Winn, D.; Wetzel, J.; Sonmez, N.; Sanders, D.; Ozok, F.; Onel, Y.; Mestvirishvili, A.; Moeller, A.; Duru, F.; Cremaldi, L.; Albayrak, E. A.; Bruecken, P.; Cankocak, K.; Clarida, W.;
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