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Author: O'Neil, P.A.
Electrical integrity of state-of-the-art 0.13 /spl mu/m SOI CMOS devices and circuits transferred for three-dimensional (3D) integrated circuit (IC) fabrication2002 / IEEE / 0-7803-7462-2
By: Frank, D.J.; Singh, D.V.; Shi, L.; Newport, M.R.; Yu, R.; Ieong, M.; Topol, A.W.; Guarini, K.W.; Haensch, W.E.; Purushothaman, S.; Pogge, H.B.; Tempest, S.L.; O'Neil, P.A.; Boyd, D.C.; Nitta, S.V.; Cohen, G.M.;