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Author: Nusinovich, G.
Results
1995 / IEEE / 0-7803-2669-5
By: Vlasov, A.; Bromborsky, A.; Nusinovich, G.; Miller, S.; Antonsen, T., Jr.; Levush, B.;
By: Vlasov, A.; Bromborsky, A.; Nusinovich, G.; Miller, S.; Antonsen, T., Jr.; Levush, B.;
1995 / IEEE / 0-7803-2669-5
By: Kreischer, K.; Hogge, J.-P.; Dumbrajs, O.; Nusinovich, G.; Read, M.E.;
By: Kreischer, K.; Hogge, J.-P.; Dumbrajs, O.; Nusinovich, G.; Read, M.E.;
1995 / IEEE / 0-7803-2669-5
By: Levush, B.; Ludeking, L.; Vlasov, A.; Schlezinger, C.; Antonsen, T., Jr; Bromborsky, A.; Nusinovich, G.; Miller, S.;
By: Levush, B.; Ludeking, L.; Vlasov, A.; Schlezinger, C.; Antonsen, T., Jr; Bromborsky, A.; Nusinovich, G.; Miller, S.;
1994 / IEEE / 0-7803-2006-9
By: Granatstein, V.L.; Destler, W.W.; Kobayashi, S.; Miller, S.; Weaver, J.; Nusinovich, G.; Levush, B.; Rodgers, J.; Antonsen, T.M., Jr.; Carmel, Y.;
By: Granatstein, V.L.; Destler, W.W.; Kobayashi, S.; Miller, S.; Weaver, J.; Nusinovich, G.; Levush, B.; Rodgers, J.; Antonsen, T.M., Jr.; Carmel, Y.;
1994 / IEEE / 0-7803-2006-9
By: Levush, B.; Antonsen, T.M., Jr.; Carmel, Y.; Granatstein, V.L.; Destler, W.W.; Nusinovich, G.;
By: Levush, B.; Antonsen, T.M., Jr.; Carmel, Y.; Granatstein, V.L.; Destler, W.W.; Nusinovich, G.;
1993 / IEEE / 0-7803-1360-7
By: Vlasov, A.; Antonsen, T.M., Jr.; Bromborsky, A.; Levush, B.; Miller, S.; Nusinovich, G.;
By: Vlasov, A.; Antonsen, T.M., Jr.; Bromborsky, A.; Levush, B.; Miller, S.; Nusinovich, G.;
1997 / IEEE / 0-7803-3990-8
By: Chen, S.; Rodgers, J.; Guo, H.; Granatstein, V.I.; Walter, M.; Nusinovich, G.;
By: Chen, S.; Rodgers, J.; Guo, H.; Granatstein, V.I.; Walter, M.; Nusinovich, G.;
1998 / IEEE / 0-7803-4792-7
By: Zhao, J.; Nusinovich, G.; Rodgers, J.; Walter, M.; Guo, H.; Granatstein, V.L.;
By: Zhao, J.; Nusinovich, G.; Rodgers, J.; Walter, M.; Guo, H.; Granatstein, V.L.;
1999 / IEEE / 0-7803-5573-3
By: Reiser, M.; Granatstein, V.; Nusinovich, G.; Castle, M.; Lawson, W.; Yovchev, I.;
By: Reiser, M.; Granatstein, V.; Nusinovich, G.; Castle, M.; Lawson, W.; Yovchev, I.;
1999 / IEEE / 0-7803-5224-6
By: Yovchev, I.; Nusinovich, G.; Granatstein, V.; Hogan, B.; Castle, M.; Lawson, W.;
By: Yovchev, I.; Nusinovich, G.; Granatstein, V.; Hogan, B.; Castle, M.; Lawson, W.;
2000 / IEEE / 0-7803-6513-5
By: Nusinovich, G.; Hogan, B.; Gouveia, S.; Granatstein, V.L.; Reiser, M.; Castle, M.; Lawson, W.; Spassovsky, I.;
By: Nusinovich, G.; Hogan, B.; Gouveia, S.; Granatstein, V.L.; Reiser, M.; Castle, M.; Lawson, W.; Spassovsky, I.;
2002 / IEEE / 0-7803-7423-1
By: Falce, L.; Borchard, P.; Miram, G.; Ives, L.; Lawson, W.; Gunther, K.; Read, M.; Granatstein, V.; Nusinovich, G.;
By: Falce, L.; Borchard, P.; Miram, G.; Ives, L.; Lawson, W.; Gunther, K.; Read, M.; Granatstein, V.; Nusinovich, G.;
2003 / IEEE / 0-7803-7699-4
By: Granatstein, V.; Nusinovich, G.; Lawson, W.; Falce, L.; Gunther, K.; Miram, G.; Ives, L.; Read, M.; Borchard, P.;
By: Granatstein, V.; Nusinovich, G.; Lawson, W.; Falce, L.; Gunther, K.; Miram, G.; Ives, L.; Read, M.; Borchard, P.;
2003 / IEEE / 0-7803-7738-9
By: Granatstein, V.L.; Lawson, W.; Nusinovich, G.; Miram, G.; Ives, R.L.; Read, M.E.;
By: Granatstein, V.L.; Lawson, W.; Nusinovich, G.; Miram, G.; Ives, R.L.; Read, M.E.;
2004 / IEEE / 0-7803-8490-3
By: Nusinovich, G.; Lawson, W.; Falce, L.; Borchard, P.; Granatstein, V.; Ives, R.L.; Read, M.E.; Miram, G.; Gunther, K.;
By: Nusinovich, G.; Lawson, W.; Falce, L.; Borchard, P.; Granatstein, V.; Ives, R.L.; Read, M.E.; Miram, G.; Gunther, K.;
2004 / IEEE / 0-7803-8490-3
By: Ives, R.L.; Jackson, R.; Miram, G.; Neilson, J.; Read, M.; Song, L.; Nusinovich, G.; Jabotinski, V.;
By: Ives, R.L.; Jackson, R.; Miram, G.; Neilson, J.; Read, M.; Song, L.; Nusinovich, G.; Jabotinski, V.;
2005 / IEEE / 0-7803-9300-7
By: Antonsen, T.; Granatstein, V.; Ran Chang; Rodgers, J.; Nusinovich, G.; Carmel, Y.;
By: Antonsen, T.; Granatstein, V.; Ran Chang; Rodgers, J.; Nusinovich, G.; Carmel, Y.;
2005 / IEEE / 0-7803-9300-7
By: Shkvarunets, A.; Rodgers, J.; Antonsen, T.; Nusinovich, G.; Carmel, Y.;
By: Shkvarunets, A.; Rodgers, J.; Antonsen, T.; Nusinovich, G.; Carmel, Y.;
2007 / IEEE / 978-1-4244-0915-0
By: Monica, A.H.; Osiander, R.; Papadakis, S.J.; Han, D.; Nusinovich, G.; Antonsen, T.M.; Yu, J.;
By: Monica, A.H.; Osiander, R.; Papadakis, S.J.; Han, D.; Nusinovich, G.; Antonsen, T.M.; Yu, J.;
2008 / IEEE / 978-1-4244-1715-5
By: Borchard, P.; Nusinovich, G.; Neilson, J.; Read, M.E.; Ives, R.L.;
By: Borchard, P.; Nusinovich, G.; Neilson, J.; Read, M.E.; Ives, R.L.;
2008 / IEEE / 978-1-4244-2119-0
By: Nusinovich, G.; Neilson, J.; Read, M.; Ives, R.L.; Borchard, P.;
By: Nusinovich, G.; Neilson, J.; Read, M.; Ives, R.L.; Borchard, P.;