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Author: Min Yang
Results
2009 / American Institute of Physics
By: Weiming Zhu; Jinbo Wu; Xiuqing Gong; Min Yang; Weijia Wen; Limu Wang; Mengying Zhang;
By: Weiming Zhu; Jinbo Wu; Xiuqing Gong; Min Yang; Weijia Wen; Limu Wang; Mengying Zhang;
2014 / Lippincott Williams & Wilkins Journals
By: Lu Yin; Hui Li; Tianfeng Hua; Zhonghua Lu; Yao Zheng; Lijun Cao; Min Yang; Yun Sun;
By: Lu Yin; Hui Li; Tianfeng Hua; Zhonghua Lu; Yao Zheng; Lijun Cao; Min Yang; Yun Sun;
1999 / IEEE / 0-7803-5661-6
By: Tae-Kyung Yoo; Yoonho Choi; Sungwoo Kim; Jaehyung Yi; Min Yang; Chinkyo Kim;
By: Tae-Kyung Yoo; Yoonho Choi; Sungwoo Kim; Jaehyung Yi; Min Yang; Chinkyo Kim;
2002 / IEEE
By: Upham, A.; Ramac, S.C.; Ticknor, A.D.; Marsh, J.T.; Rabidoux, P.A.; Rodier, F.; Boyd, D.C.; Kuchta, D.M.; Welser, J.J.; Schaub, J.D.; Rogers, D.L.; Kern Rim; Min Yang; Qingyun Yang;
By: Upham, A.; Ramac, S.C.; Ticknor, A.D.; Marsh, J.T.; Rabidoux, P.A.; Rodier, F.; Boyd, D.C.; Kuchta, D.M.; Welser, J.J.; Schaub, J.D.; Rogers, D.L.; Kern Rim; Min Yang; Qingyun Yang;
2003 / IEEE
By: Chan, K.K.; Boyd, D.C.; Gluschenkov, O.; Meikei Ieong; Gusev, E.P.; Kozlowski, P.M.; Min Yang; Chou, A.I.; Jamison, P.C.; Sicina, R.M.; D'Emic, C.P.;
By: Chan, K.K.; Boyd, D.C.; Gluschenkov, O.; Meikei Ieong; Gusev, E.P.; Kozlowski, P.M.; Min Yang; Chou, A.I.; Jamison, P.C.; Sicina, R.M.; D'Emic, C.P.;
2004 / IEEE / 0-7803-8511-X
By: Dons, B.; Meikei Ieong; Huiling Shang; Min Yang; Ken Rim; Zhibin Ren; Kedzierski, J.;
By: Dons, B.; Meikei Ieong; Huiling Shang; Min Yang; Ken Rim; Zhibin Ren; Kedzierski, J.;
2005 / IEEE / 4-900784-00-1
By: Klymko, N.; Wildman, H.; Rovedo, N.; Fischetti, M.; Jinghong Li; Utomo, H.; Huajie Chen; Panda, S.; Holt, J.; Min Yang; Qiqing Ouyang; Chun-Yung Sung; Meikei Ieong; Ott, J.A.; Bryant, A.; Fried, D.M.; Costrini, G.; Kanarsky, T.;
By: Klymko, N.; Wildman, H.; Rovedo, N.; Fischetti, M.; Jinghong Li; Utomo, H.; Huajie Chen; Panda, S.; Holt, J.; Min Yang; Qiqing Ouyang; Chun-Yung Sung; Meikei Ieong; Ott, J.A.; Bryant, A.; Fried, D.M.; Costrini, G.; Kanarsky, T.;
2005 / IEEE / 0-7803-9081-4
By: Sufi Zafar; Min Yang; Huiling Shang; Doris, B.; Chan, V.; Leland Chang; Meikei Icong;
By: Sufi Zafar; Min Yang; Huiling Shang; Doris, B.; Chan, V.; Leland Chang; Meikei Icong;
2005 / IEEE / 0-7803-9023-7
By: Ken Rim; Chan, V.; Qiqing; Min Yang; Young Way Teh; Rajeev Malik; Sam Yang; Meikei Ieong;
By: Ken Rim; Chan, V.; Qiqing; Min Yang; Young Way Teh; Rajeev Malik; Sam Yang; Meikei Ieong;
2005 / IEEE / 0-7803-9382-1
By: Marutyan, K.R.; Min Yang; Baldwin, S.L.; Miller, J.G.; Holland, M.R.; Wallace, K.D.;
By: Marutyan, K.R.; Min Yang; Baldwin, S.L.; Miller, J.G.; Holland, M.R.; Wallace, K.D.;
2006 / IEEE
By: Min Yang; Meikei Ieong; Fischetti, M.V.; Burns, L.E.; Ott, J.A.; Chan, K.K.; Chan, V.W.C.; Chou, A.I.; Stathis, J.H.; Fried, D.M.; Shi, L.; Gusev, E.;
By: Min Yang; Meikei Ieong; Fischetti, M.V.; Burns, L.E.; Ott, J.A.; Chan, K.K.; Chan, V.W.C.; Chou, A.I.; Stathis, J.H.; Fried, D.M.; Shi, L.; Gusev, E.;
2007 / IEEE
By: Wallace, K.D.; Marutyan, K.R.; Min Yang; Baldwin, S.L.; Miller, J.G.; Holland, M.R.;
By: Wallace, K.D.; Marutyan, K.R.; Min Yang; Baldwin, S.L.; Miller, J.G.; Holland, M.R.;
2008 / IEEE / 978-1-4244-2108-4
By: Zheng Liu; Chengjun Zheng; Weixiang Li; Yan Li; Jufeng Dai; Min Yang;
By: Zheng Liu; Chengjun Zheng; Weixiang Li; Yan Li; Jufeng Dai; Min Yang;
2009 / IEEE / 978-1-4244-2902-8
By: Guo-dong Liu; Fu-Quan Ni; Min Yang; Xiu-yuan Lu; Shang-chuan Yang;
By: Guo-dong Liu; Fu-Quan Ni; Min Yang; Xiu-yuan Lu; Shang-chuan Yang;
2010 / IEEE / 978-1-4244-7958-0
By: Min Yang; Xuesheng Feng; Keping Liu; Changhong Jiang; Chonghe Tang;
By: Min Yang; Xuesheng Feng; Keping Liu; Changhong Jiang; Chonghe Tang;
2011 / IEEE
By: Schow, C.L.; Lee, B.G.; Vlasov, Y.A.; Kash, J.A.; Jahnes, C.V.; Van Campenhout, J.V.; Rylyakov, A.V.; Min Yang; Doany, F.E.; Assefa, S.; Green, W.M.J.; John, R.A.;
By: Schow, C.L.; Lee, B.G.; Vlasov, Y.A.; Kash, J.A.; Jahnes, C.V.; Van Campenhout, J.V.; Rylyakov, A.V.; Min Yang; Doany, F.E.; Assefa, S.; Green, W.M.J.; John, R.A.;
2011 / IEEE / 978-1-55752-906-0
By: Assefa, S.; Kash, J.A.; Min Yang; Green, W.M.J.; Vlasov, Y.A.; Van Campenhout, J.; Schow, C.L.; Doany, F.E.; Jahnes, C.V.; Lee, B.G.;
By: Assefa, S.; Kash, J.A.; Min Yang; Green, W.M.J.; Vlasov, Y.A.; Van Campenhout, J.; Schow, C.L.; Doany, F.E.; Jahnes, C.V.; Lee, B.G.;
2011 / Springer Science+Business Media / 0925-5710
By: Xin Sun; Jian Huang; Jie Jin; Min Yang; Hui Liu; Ting Ding;
By: Xin Sun; Jian Huang; Jie Jin; Min Yang; Hui Liu; Ting Ding;