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Author: Lam, R.
Results
1995 / IEEE / 0-7803-2934-1
By: Lam, R.; Haberichter, W.; Dawson, J.; Norem, J.; Spencer, J.; Yang, X.-F.; Reed, L.;
By: Lam, R.; Haberichter, W.; Dawson, J.; Norem, J.; Spencer, J.; Yang, X.-F.; Reed, L.;
1997 / IEEE / 0-7803-3612-7
By: Estlin, T.; Hill, R.W., Jr.; Wang, X.; Govindjee, A.; Griesel, M.A.; Chien, S.A.; Fayyad, K.V.; Lam, R.;
By: Estlin, T.; Hill, R.W., Jr.; Wang, X.; Govindjee, A.; Griesel, M.A.; Chien, S.A.; Fayyad, K.V.; Lam, R.;
1999 / IEEE / 0-7695-0509-0
By: Hanka, R.; Lam, R.; Ip, H.H.S.; Cheung, K.K.T.; Fuller, G.; Tang, L.H.Y.;
By: Hanka, R.; Lam, R.; Ip, H.H.S.; Cheung, K.K.T.; Fuller, G.; Tang, L.H.Y.;
2002 / IEEE / 0-7803-7454-1
By: Ehrlich, D.; Mitnik-Gankin, L.; Timp, W.; Streechon, P.; Srivastava, A.; Novotny, M.; O'Neil, T.; Carey, L.; Mckenna, B.; Matsudaira, P.; Lam, R.; Koutny, L.; El-Difrawy, S.; Desmarais, S.; Chiou, J.;
By: Ehrlich, D.; Mitnik-Gankin, L.; Timp, W.; Streechon, P.; Srivastava, A.; Novotny, M.; O'Neil, T.; Carey, L.; Mckenna, B.; Matsudaira, P.; Lam, R.; Koutny, L.; El-Difrawy, S.; Desmarais, S.; Chiou, J.;
2006 / IEEE / 1-4244-0016-3
By: Alam, M.; Lam, R.; Alemu, A.; Williams, L.; Imazumi, M.; Yamaguchi, M.; Gapud, A.; Gou, J.; Freundlich, A.; Khan, A.;
By: Alam, M.; Lam, R.; Alemu, A.; Williams, L.; Imazumi, M.; Yamaguchi, M.; Gapud, A.; Gou, J.; Freundlich, A.; Khan, A.;
2007 / IEEE / 1-4244-0524-6
By: Spiers, G.; Palacios, P.; Montgomery, J.; Meras, P.; Maize, E.; Lam, R.; Wilson, M.; Goldberg, H.; Aung, M.; Alexander, J.; Liebe, C.C.; Johnson, A.;
By: Spiers, G.; Palacios, P.; Montgomery, J.; Meras, P.; Maize, E.; Lam, R.; Wilson, M.; Goldberg, H.; Aung, M.; Alexander, J.; Liebe, C.C.; Johnson, A.;
2007 / IEEE / 978-1-4244-1109-2
By: Tsang, K.F.; Ko, K.T.; Sun, Y.T.; Lam, R.; Tung, H.Y.; Lee, L.T.;
By: Tsang, K.F.; Ko, K.T.; Sun, Y.T.; Lam, R.; Tung, H.Y.; Lee, L.T.;
2007 / IEEE / 978-1-4244-1305-8
By: Bagchi, S.; Deleris, L.A.; Buckley, S.; Lam, R.; Katircioglu, K.; Kapoor, S.;
By: Bagchi, S.; Deleris, L.A.; Buckley, S.; Lam, R.; Katircioglu, K.; Kapoor, S.;
2008 / IEEE / 978-1-4244-1487-1
By: Chapsky, J.; Bartman, R.K.; Abramovici, A.; Liebe, C.C.; Lam, R.; Coste, K.; Chapsky, L.;
By: Chapsky, J.; Bartman, R.K.; Abramovici, A.; Liebe, C.C.; Lam, R.; Coste, K.; Chapsky, L.;
2008 / IEEE / 978-1-4244-1532-8
By: Cornell, M.; Jun-Wei Chen; Seng, W.; Ma, S.; Williams, R.; Blattner, R.; Lam, R.; Chan, W.; Disney, D.;
By: Cornell, M.; Jun-Wei Chen; Seng, W.; Ma, S.; Williams, R.; Blattner, R.; Lam, R.; Chan, W.; Disney, D.;
2007 / IEEE / 978-1-4244-0607-4
By: Maynard, H.D.; Kuan Wang; Forbes, J.G.; Huang, A.; Lam, R.; Chih-Ming Ho; Kolodziej, C.M.; Christman, K.L.; Brough, B.; Tak Sing Wong;
By: Maynard, H.D.; Kuan Wang; Forbes, J.G.; Huang, A.; Lam, R.; Chih-Ming Ho; Kolodziej, C.M.; Christman, K.L.; Brough, B.; Tak Sing Wong;
2009 / IEEE / 978-1-4244-3525-8
By: Chan, W.; Disney, D.; Williams, R.K.; Jun-Wei Chen; Lam, R.; Seng, W.; Ma, S.; Blattner, R.;
By: Chan, W.; Disney, D.; Williams, R.K.; Jun-Wei Chen; Lam, R.; Seng, W.; Ma, S.; Blattner, R.;
2010 / IEEE / 978-1-4244-6918-5
By: Shaban, K.; Kathirgamanathan, S.; Allison, M.; Lam, R.; Younes, A.;
By: Shaban, K.; Kathirgamanathan, S.; Allison, M.; Lam, R.; Younes, A.;
2010 / IEEE / 978-1-4244-7032-7
By: Cheng, S.; Jiaqi Zou; Lam, R.; Fang Wei; Na Li; Dean Ho; Lu, S.;
By: Cheng, S.; Jiaqi Zou; Lam, R.; Fang Wei; Na Li; Dean Ho; Lu, S.;
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