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Author: Lakin, K.M.
Results
2001 / IEEE / 0-7803-7028-7
By: Birdsall, S.A.; Pham, T.; Lakin, K.M.; Driscoll, M.M.; Donovan, J.B.; Dever, P.B.;
By: Birdsall, S.A.; Pham, T.; Lakin, K.M.; Driscoll, M.M.; Donovan, J.B.; Dever, P.B.;
2002 / IEEE
By: Ballato, A.; Owens, J.M.; Morgan, D.P.; Weigel, R.; Ruppel, C.C.W.; Hashimoto, K.; Lakin, K.M.;
By: Ballato, A.; Owens, J.M.; Morgan, D.P.; Weigel, R.; Ruppel, C.C.W.; Hashimoto, K.; Lakin, K.M.;
2002 / IEEE
By: Lakin, K.M.; Driscoll, M.M.; Donovan, J.B.; Dever, P.B.; Birdsall, S.A.; Pham, T.H.;
By: Lakin, K.M.; Driscoll, M.M.; Donovan, J.B.; Dever, P.B.; Birdsall, S.A.; Pham, T.H.;
2002 / IEEE / 0-7803-7239-5
By: Lakin, K.M.; Andrus, C.W.; McCarron, K.T.; McDonald, J.P.; Belsick, J.R.;
By: Lakin, K.M.; Andrus, C.W.; McCarron, K.T.; McDonald, J.P.; Belsick, J.R.;
1969 / IEEE
By: Adkins, L.R.; Alsup, J.M.; Winslow, D.K.; Whitehouse, H.J.; Ash, E.A.; Auld, B.A.; Bertoni, H.L.; Carr, P.H.; Chu, R.S.; Collins, J.H.; Court, I.N.; De La Rue, R.M.; Dobrov, W.I.; Gerard, H.M.; Hance, H.V.; Hickernell, F.S.; Hughes, A.J.; Humphryes, R.F.; Ingebrigtsen, K.A.; Kirchner, E.K.; Lakin, K.M.; Oliner, A.A.; Reeder, T.M.; Rupprecht, G.; Schmidt, R.V.; Shaw, H.J.; Smith, A.B.; Smith, W.R.; Squire, W.D.; Steinberg, R.F.; Stern, E.; Tamir, T.; Tonning, A.; Voltmer, F.W.; Waldron, R.A.;
By: Adkins, L.R.; Alsup, J.M.; Winslow, D.K.; Whitehouse, H.J.; Ash, E.A.; Auld, B.A.; Bertoni, H.L.; Carr, P.H.; Chu, R.S.; Collins, J.H.; Court, I.N.; De La Rue, R.M.; Dobrov, W.I.; Gerard, H.M.; Hance, H.V.; Hickernell, F.S.; Hughes, A.J.; Humphryes, R.F.; Ingebrigtsen, K.A.; Kirchner, E.K.; Lakin, K.M.; Oliner, A.A.; Reeder, T.M.; Rupprecht, G.; Schmidt, R.V.; Shaw, H.J.; Smith, A.B.; Smith, W.R.; Squire, W.D.; Steinberg, R.F.; Stern, E.; Tamir, T.; Tonning, A.; Voltmer, F.W.; Waldron, R.A.;
1974 / IEEE
By: Acevedo, J.; Atia, A.E., Jr.; Williams, A.E.; Umeno, M.; Bell, H.C., Jr.; Boyd, C.R.; Chrepta, M.M.; Gupta, C.D.; Giarola, A.J.; Gray, K.W.; Hardy, W.N.; Helszajn, J.; Itoh, T.; Jacobs, H.; Kawasaki, K.; Krueger, W.F.; Kumagai, N.; Lakin, K.M.; Larsen, L.E.; Love, A.W.; Matsuhara, M.; Matsurnoto, A.; Mittra, R.; Moore, R.A.; Nagai, N.; Rahmat-Samii, Y.; Rhodes, J.D.;
By: Acevedo, J.; Atia, A.E., Jr.; Williams, A.E.; Umeno, M.; Bell, H.C., Jr.; Boyd, C.R.; Chrepta, M.M.; Gupta, C.D.; Giarola, A.J.; Gray, K.W.; Hardy, W.N.; Helszajn, J.; Itoh, T.; Jacobs, H.; Kawasaki, K.; Krueger, W.F.; Kumagai, N.; Lakin, K.M.; Larsen, L.E.; Love, A.W.; Matsuhara, M.; Matsurnoto, A.; Mittra, R.; Moore, R.A.; Nagai, N.; Rahmat-Samii, Y.; Rhodes, J.D.;
1974 / IEEE
By: El-Sayed, O.L.; Fong, T.T.; Gerson, T.J.; Shung-Wu Lee; Mih, D.W.T.; Nadan, J.S.; Lakin, K.M.; Tarr, R.M.; Peterson, D.F.;
By: El-Sayed, O.L.; Fong, T.T.; Gerson, T.J.; Shung-Wu Lee; Mih, D.W.T.; Nadan, J.S.; Lakin, K.M.; Tarr, R.M.; Peterson, D.F.;
2004 / IEEE / 0-7803-8412-1
By: Lakin, K.M.; Thornhill, W.H.; McCarron, K.T.; Belsick, J.R.; Andrus, C.W.;
By: Lakin, K.M.; Thornhill, W.H.; McCarron, K.T.; Belsick, J.R.; Andrus, C.W.;
1987 / IEEE
By: McCarron, K.T.; Lakin, K.M.; Burns, S.G.; Braymen, S.D.; Kline, G.R.; Burkland, W.A.; Landin, A.R.; Ketcham, R.S.;
By: McCarron, K.T.; Lakin, K.M.; Burns, S.G.; Braymen, S.D.; Kline, G.R.; Burkland, W.A.; Landin, A.R.; Ketcham, R.S.;
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