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Author: Kiss, T.

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Noncontact Characterization of In-Plane Distribution of Critical Current Desity in Multifilamentary Coated Conductor
2012 / IEEE
By: Lee, S.; Chikumoto, N.; Machi, T.; Kiss, T.; Inoue, M.; Tanabe, K.; Higashikawa, K.; Okamoto, H.; Shiohara, K.; Izumi, T.;
Annotating Spatial Interpretations of German Prepositions
2011 / IEEE / 978-1-4577-1648-5
By: Stadtfeld, T.; Roch, C.; Muller, A.; Kiss, T.;
Modular performance simulations of clouds
2011 / IEEE / 978-1-4577-2109-0
By: Altevogt, P.; Denzel, W.; Kiss, T.;
Scientific Workflow Makespan Reduction through Cloud Augmented Desktop Grids
2011 / IEEE / 978-1-4673-0090-2
By: Acs, S.; Greenwell, P.; Kiss, T.; Terstyanszky, G.Z.; Winter, S.; Reynolds, C.J.; Kacsuk, P.;
Distributed computing and modeling & simulation: Speeding up simulations and creating large models
2011 / IEEE / 978-1-4577-2109-0
By: Farkas, D.; Kiss, T.; Mustafee, N.; Turner, S.J.; Kite, S.; Ghorbani, M.; Taylor, S.J.E.; Strassburger, S.;
Current Transport Properties of TFA-MOD Processed Long-Length mboxYmathrmxmboxGd1mbox-mathrmxmboxBa2mboxCu3mboxO mathrmy Coated Conductor Doped With mboxBaZrO3 Artificial Pinning Centers
2015 / IEEE
By: Inoue, M.; Kiss, T.; Izumi, T.; Yoshizumi, M.; Watanabe, K.; Awaji, S.; Tanaka, K.; Koizumi, T.; Takahashi, Y.; Kimura, K.; Higashikawa, K.; Imamura, K.; Hasegawa, T.;
Development of REBCO Coated Conductors by TFA-MOD Method With High Properties in Magnetic Fields
2015 / IEEE
By: Shiohara, Y.; Izumi, T.; Yoshizumi, M.; Kiss, T.; Inoue, M.; Kimura, K.; Hasegawa, T.; Koizumi, T.; Takahashi, Y.; Nakamura, T.; Hironaga, R.; Higashikawa, K.;
Influence of Internal Magnetic Field Distribution on Critical Currents in a Single and Assembled Bi-2223 Tapes
2015 / IEEE
By: Furukawa, K.; Kiss, T.; Tomita, M.; Sato, K.; Hayashi, K.; Higashikawa, K.; Kobayashi, S.; Kikuchi, M.; Inoue, M.; Imado, K.; Nakashima, T.;
Editorial: Science Gateways Applying Clouds, Grids and HPC
2014 / IEEE
By: Kiss, T.; Gesing, S.; Pierantoni, G.;
Operating CMOS after a Si-MBE process: a precondition for future three-dimensional circuits
1990 / IEEE
By: Kuisl, M.; Konig, U.; Kiss, T.; Fischer, G.; Schaffler, F.;
Flux creep characteristics in the presence of a pinning distribution for Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub 7-/spl delta// superconducting thin films
1995 / IEEE
By: Matsumoto, Y.; Kuroda, K.; Takeo, H.; Nakamura, T.; Kiss, T.; Irie, F.;
Prosody, empty categories and parsing-a success story
1996 / IEEE / 0-7803-3555-4
By: Kiss, T.; Geissler, S.; Feldhaus, A.; Batliner, A.; Noth, E.; Kompe, R.;
Transport characteristics and flux dynamics in high T/sub c/ superconductors under the influence of pin fluctuation
1997 / IEEE
By: Nakamura, T.; Kiss, T.; Irie, F.; Yamafuji, K.; Takeo, M.;
Residual surface resistance of YBa/sub 2/Cu/sub 3/O/sub x/ thin films-weakly coupled grain model
1997 / IEEE
By: Wang, Z.; Shimakage, H.; Kiss, T.; Nagasawa, K.; Yoshida, K.;
A step-function approximation of frequency changes
1994 / IEEE / 0-7803-1791-2
By: Kiss, T.; Jansky, J.; Adam, P.;
Quench characteristics in HTSC devices
1999 / IEEE
By: Inoue, M.; Kiss, T.; Irie, E.; Okamoto, H.; Ogata, K.; Takeo, M.; Ilyin, Yu.; Vysotsky, V.S.; Hasegawa, K.;
Quench propagation in large area YBCO films
1999 / IEEE
By: Schneider, J.; Hochmuth, H.; Lorenz, M.; Takeo, M.; Woerdenweber, R.; Ilyin, Yu.A.; Kiss, T.; Vysotsky, V.S.;
Evaluation of E-J characteristics for Bi-2223 wires
1999 / IEEE
By: Hasegawa, K.; Kiss, T.; Irie, F.; Okamoto, H.; Kanazawa, M.; Inoue, M.;
Theoretical study on vortex glass-liquid transition in pinned superconductors
1999 / IEEE
By: Kiss, T.; Matsushita, T.;
Cascaded homodyning for local phase-space sampling
1999 / IEEE / 1-55752-576-X
By: Adam, P.; Janszky, J.; Kiss, T.; Kis, Z.; Vogel, W.; Wallentowitz, S.;
Transport properties of multifilamentary Ag-sheathed Bi-2223 tapes under the influence of strain
2001 / IEEE
By: Kiss, T.; ten Kate, H.H.J.; ten Haken, B.; van Eck, H.;
Anisotropic current transport properties and their scaling in multifilamentry Bi-2223 Ag-sheathed tapes
2001 / IEEE
By: Okamoto, H.; Kiss, T.;
Construction of the magnetic phase diagram in small-volume HTS by an OFC magnetometer
2001 / IEEE
By: Kiss, T.; Gevorgyan, S.G.; Funaki, K.; Matsushita, T.; Takeo, M.; Ohyama, T.; Inoue, M.;
Percolative transition and scaling of transport E-J characteristics in YBCO coated IBAD tape
2003 / IEEE
By: Kakimoto, K.; Iijima, Y.; Matsushita, T.; Takeo, M.; Ishimaru, M.; Kuga, T.; Saitoh, T.; Inoue, M.; Kiss, T.; Shiohara, Y.; Egashira, S.; Watanabe, K.; Awaji, S.;
Complicated shape of the superconductive transition curve revealed by a sensitive OFC-magnetometer
2003 / IEEE
By: Kiss, T.; Gevorgyan, S.; Takeo, M.; Mito, T.; Matsushita, T.; Eltsev, Yu.; Egashira, S.; Gevorgyan, V.; Movsisyan, A.; Shirinyan, H.;
Prediction of E-J characteristics in Bi-2223/Ag tapes at low temperature and high magnetic field
2003 / IEEE
By: Imamura, K.; Inoue, M.; Nishimura, S.; Kiss, T.; Okamoto, H.; Kanazawa, M.; Takeo, M.;
GEMLCA: grid execution management for legacy code architecture design
2004 / IEEE / 0-7695-2199-1
By: Delaitre, T.; Winter, S.C.; Terstyanszky, G.Z.; Kiss, T.; Kacsuk, P.; Goyeneche, A.;
High-level grid application environment to use legacy codes as OGSA grid services
2004 / IEEE / 0-7695-2256-4
By: Kacsuk, P.; Boczko, T.; Farkas, Z.; Kiss, T.; Delaitre, T.; Goyeneche, A.;
Security mechanisms for legacy code applications in GT3 environment
2005 / IEEE / 0-7695-2280-7
By: Goyeneche, A.; Delaitre, T.; Terstyanszky, G.; Kacsuk, P.; Winter, S.C.; Sajadah, K.; Kiss, T.;
AC loss properties of YBCO superconducting tapes exposed to external AC magnetic field
2005 / IEEE
By: Nigo, M.; Iwakuma, M.; Shiohara, Y.; Yamada, Y.; Kiss, T.; Saitoh, T.; Iijima, Y.; Funaki, K.; Inoue, D.;
High magnetic field properties of critical current density in Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub 7-/spl delta// coated conductor fabricated by improved TFA-MOD process
2005 / IEEE
By: Inoue, M.; Kiss, T.; Tsuda, Y.; Sawa, H.; Takeo, M.; Awaji, S.; Shiohara, Y.; Iijima, Y.; Kakimoto, K.; Saitoh, T.; Matsuda, J.; Tokunaga, Y.; Izumi, T.; Watanabe, K.;
Low temperature scanning laser microscopy of YBCO coated IBAD tapes
2005 / IEEE
By: Izumi, T.; Yasunaga, M.; Inoue, M.; Kiss, T.; Shiohara, Y.; Tokutomi, H.; Tokunaga, Y.; Saitoh, T.; Kakimoto, K.; Iijima, Y.;
Legacy code support for production grids
2005 / IEEE / 0-7803-9492-5
By: Winter, S.; Delaittre, T.; Illes, S.; Kecskemeti, G.; Kacsuk, P.; Kiss, T.; Terstyanszky, G.; Sipos, G.;
Investigation of the approximation accuracy of the TP model transformation through the prototypical aeroelastic wing and the TORA system
2005 / IEEE / 0-7803-9474-7
By: Kiss, T.; Petres, Z.;
The ALICE data-acquisition system
2005 / IEEE / 0-7803-9221-3
By: Carena, F.; Carena, W.; Anticic, T.; Vergara, S.; Vascotto, A.; Vyvre, P.V.; Soos, C.; Schossmaier, K.; Ozok, F.; Makhlyueva, I.; Marin, J.C.; Kiss, T.; Fuchs, U.; Divia, R.; Denes, E.; Cobanoglu, O.; Chapeland, S.;
Service-Oriented Production Grids and User Support
2006 / IEEE / 1-4244-0344-8
By: Kacsuk, P.; Winter, S.; Delaitre, T.; Kiss, T.; Terstyanszky, G.; Kecskemeti, G.;
SZTAKI Desktop Grid: a Modular and Scalable Way of Building Large Computing Grids
2007 / IEEE / 1-4244-0909-8
By: Marosi, A.C.; Kovacs, J.; Kornafeld, A.; Kacsuk, P.; Vida, G.; Balaton, Z.; Kiss, T.; Gombas, G.; Podhorszki, N.;
Conceptual Design of HTS Coil for SMES Using YBCO Coated Conductor
2007 / IEEE
By: Kiss, T.; Nagaya, S.; Hirano, N.; Shikimachi, K.; Nakamura, T.; Higashikawa, K.; Inoue, M.;
Current Transport Properties of 200 A-200 m-Class IBAD YBCO Coated Conductor Over Wide Range of Magnetic Field and Temperature
2007 / IEEE
By: Miyata, S.; Kiss, T.; Inoue, M.; Shiohara, Y.; Yamada, Y.; Mitsui, D.; Ibi, A.; Watanabe, K.; Awaji, S.; Fujiwara, T.; Nakamura, T.;
Visualizing Transport Properties in IBAD Based YBCO Coated Conductors by Multiple Analysis Techniques
2007 / IEEE
By: Koyanagi, S.; Hirayama, T.; Shoyama, T.; Inoue, M.; Kiss, T.; Shiohara, Y.; Mitsui, D.; Kato, T.; Yamada, Y.; Ibi, A.; Imamura, K.; Nakamura, T.;
Automatic Service Deployment Using Virtualisation
2008 / IEEE / 978-0-7695-3089-5
By: Terstyanszky, G.; Kacsuk, P.; Kecskemeti, G.; Delaitre, T.; Kiss, T.;
EDGeS: A Bridge between Desktop Grids and Service Grids
2008 / IEEE / 978-0-7695-3306-3
By: Balaton, Z.; Kiss, T.; Lodygensky, O.; Haiwu He; Fedak, G.; Araujo, F.; Emmen, A.; Cardenas-Montes, M.; Farkas, Z.; Terstyanszky, G.; Taylor, I.; Kelley, I.; Marosi, A.C.; Lovas, R.; Kacsuk, P.; Gombas, G.;
A general and scalable solution for heterogeneous workflow invocation and nesting
2008 / IEEE / 978-1-4244-2827-4
By: Terstyanszky, G.; Kiss, T.; Kukla, T.; Kacsuk, P.;
Coupled Analysis Method for High-Field Magnet Coil Using Coated Conductor Based on $J\hbox{-}E$ Characteristics as a Function of Temperature, Magnetic Field Vector and Mechanical Strain
2009 / IEEE
By: Higashikawa, K.; Kiss, T.; Inoue, M.; Imamura, K.; Shiohara, Y.; Awaji, S.; Watanabe, K.; Fukushima, H.; Yamada, Y.; Nakamura, T.;
The Use of Low Temperature Scanning Microscope for Estimating In-Plane Thermal Diffusivity in YBCO Thin Film
2009 / IEEE
By: Inoue, M.; Kiss, T.; Matsekh, A.; Shiohara, Y.; Izumi, T.; Sutoh, Y.; Yoshizumi, M.;
Observation of Current Distribution in High-$T_{\rm c}$ Superconducting Tape Using Scanning Hall-Probe Microscope
2009 / IEEE
By: Iijima, Y.; Kiss, T.; Abiru, K.; Honda, Y.; Kakimoto, K.; Inoue, M.; Shiohara, Y.; Nakao, K.; Saitoh, T.;
Development of Cu Substrate for Low Cost Coated Conductors
2009 / IEEE
By: Kashima, N.; Shima, K.; Doi, T.; Nagaya, S.; Watanabe, T.; Inoue, M.; Kiss, T.; Kubota, S.;
Commissioning and first experience of the ALICE Data Acquisition System
2009 / IEEE / 978-1-4244-4454-0
By: Chapeland, S.; Chibante Barroso, V.; Carena, W.; Carena, F.; Anticic, T.; Altini, V.; von Haller, B.; Vande Vyvre, P.; Soos, C.; Schossmaier, K.; Roukoutakis, F.; Makhlyueva, I.; Kiss, T.; Fuchs, U.; Divia, R.; Denes, E.; Costa, F.;
Current Limiting Phenomena in $\hbox{SmBa}_{2}\hbox{Cu}_{3}\hbox{O}_{7}$ Coated Conductors Observed by Laser-Induced Thermoelectric Imaging and Low-Temperature Laser Scanning Microscopy
2011 / IEEE
By: Kiss, T.; Inoue, M.; Matsekh, A.; Jo, W.; Kim, G.; Oh, S.S.; Ha, H.-S.;
Investigation of Three-Dimensional Current Distribution at Silver Diffusion Joint of RE-123 Coated Conductors Based on Magnetic Microscopy Combined With Finite Element Method
2011 / IEEE
By: Chikumoto, N.; Honda, Y.; Kiss, T.; Inoue, M.; Sakai, N.; Higashikawa, K.; Okamoto, H.; Izumi, T.;
Local Investigation of Spatial Homogeneity in 600 A/cm-w Class ${\hbox {GdBa}}_{2}{\hbox {Cu}}_{3}{\hbox {O}}_{7-\delta}$ PLD Coated Conductor
2011 / IEEE
By: Matsekh, A.; Inoue, M.; Kiss, T.; Iijima, Y.; Saitoh, T.; Izumi, T.;
In-Field Current Transport Properties of 600 A-Class ${\rm GdBa}_{2}{\rm Cu}_{3}{\rm O}_{7-\delta}$ Coated Conductor Utilizing IBAD Template
2011 / IEEE
By: Higashikawa, K.; Fuger, R.; Inoue, M.; Izumi, T.; Awaji, S.; Kiss, T.; Iijima, Y.; Watanabe, K.; Namba, M.; Saitoh, T.;
Transport Characterization of ${\rm GdBa}_{2}{\rm Cu}_{3}{\rm O}_{7-\delta}$ Coated Conductors Deposited by the In-Plume PLD Reel-to-Reel Technique
2011 / IEEE
By: Fuger, R.; Kiss, T.; Chikumoto, N.; Lee, S.; Izumi, T.;

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