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Author: Joshi, A.
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2012 / IEEE / 978-1-4577-0726-1
By: Joshi, A.; Pavithran, V.; Mithra, Z.; Krishnan, R.; Murali, H.; Ramani, V.;
By: Joshi, A.; Pavithran, V.; Mithra, Z.; Krishnan, R.; Murali, H.; Ramani, V.;
1996 / IEEE / 0-8186-7446-6
By: Atallah, M.; Joshi, A.; Houstis, E.N.; Elmagarmid, A.; Weerawarana, S.;
By: Atallah, M.; Joshi, A.; Houstis, E.N.; Elmagarmid, A.; Weerawarana, S.;
1990 / IEEE / 0-87942-550-4
By: Olsen, G.; Mason, S.; Erickson, G.; Ban, V.; Speer, F.; Gasparian, G.; Joshi, A.; Woodruff, K.; Linga, K.; Rodefeld, D.; Lange, M.;
By: Olsen, G.; Mason, S.; Erickson, G.; Ban, V.; Speer, F.; Gasparian, G.; Joshi, A.; Woodruff, K.; Linga, K.; Rodefeld, D.; Lange, M.;
1998 / IEEE / 0-7803-5021-9
By: Einsweiler, K.; Pengg, F.; Milgrome, O.; Marchesini, R.; Luo, L.; Kleinfelder, S.; Joshi, A.;
By: Einsweiler, K.; Pengg, F.; Milgrome, O.; Marchesini, R.; Luo, L.; Kleinfelder, S.; Joshi, A.;
1999 / IEEE
By: Luo, L.; Kleinfelder, S.; Joshi, A.; Einsweiler, K.; Pengg, F.; Milgrome, O.; Marchesini, R.;
By: Luo, L.; Kleinfelder, S.; Joshi, A.; Einsweiler, K.; Pengg, F.; Milgrome, O.; Marchesini, R.;
1999 / IEEE / 0-7803-5410-9
By: Matloubian, M.; Li-Ming Hwang; D'Souza, S.; Kempf, P.; Martin, S.; Bhattacharya, S.; Hong Wu; Joshi, A.; Sherman, P.;
By: Matloubian, M.; Li-Ming Hwang; D'Souza, S.; Kempf, P.; Martin, S.; Bhattacharya, S.; Hong Wu; Joshi, A.; Sherman, P.;
2000 / IEEE
By: Joshi, A.; Paolella, A.; Rosen, A.; Vieira, A.; Rosen, W.; Herczfeld, P.R.; Jemison, W.D.;
By: Joshi, A.; Paolella, A.; Rosen, A.; Vieira, A.; Rosen, W.; Herczfeld, P.R.; Jemison, W.D.;
State space simulation and accurate determination of fundamental impedance characteristics of a TCSC
2001 / IEEE / 0-7803-6672-7By: Joshi, A.; Ghosh, A.; Mishra, M.K.;
2002 / IEEE
By: Cost, R.S.; Tolia, S.; Youyong Zou; Perich, F.; Kagal, L.; Joshi, A.; Chen, H.; Soboroff, I.; Nicholas, C.; Yun Peng; Finin, T.;
By: Cost, R.S.; Tolia, S.; Youyong Zou; Perich, F.; Kagal, L.; Joshi, A.; Chen, H.; Soboroff, I.; Nicholas, C.; Yun Peng; Finin, T.;