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Author: Hall, D.C.
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Interferometric imaging technique for nondestructive evaluation of optoelectronic devices and wafers
1994 / IEEE / 0-7803-1470-0By: Hall, D.C.;
1997 / IEEE / 0-7803-3895-2
By: Hall, D.C.; Kolbas, R.M.; Zhang, T.; Muth, J.F.; Wu, H.; Wang, P.D.; Kou, L.;
By: Hall, D.C.; Kolbas, R.M.; Zhang, T.; Muth, J.F.; Wu, H.; Wang, P.D.; Kou, L.;
1999 / IEEE / 0-7803-5634-9
By: Kou, L.; Hall, D.C.; Luo, Y.; Jackson, J.H.; Steingart, L.; Hou, H.; Bium, O.;
By: Kou, L.; Hall, D.C.; Luo, Y.; Jackson, J.H.; Steingart, L.; Hou, H.; Bium, O.;
2002 / IEEE
By: Leigang Kou; Hall, D.C.; Strohhofer, C.; Dupuis, R.D.; Tong Zhang; Kolbas, R.M.; Heller, R.D., Jr.; Polman, A.;
By: Leigang Kou; Hall, D.C.; Strohhofer, C.; Dupuis, R.D.; Tong Zhang; Kolbas, R.M.; Heller, R.D., Jr.; Polman, A.;
2010 / IEEE / 978-1-55752-890-2
By: Moretti, T.; Xiangning Luo; Hall, D.C.; Wangqing Yuan; Seibert, C.S.; Sugg, A.R.;
By: Moretti, T.; Xiangning Luo; Hall, D.C.; Wangqing Yuan; Seibert, C.S.; Sugg, A.R.;