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Author: Galluzzi, G.
Damage control at the SnO/sub 2//Si interface in optoelectronic amorphous silicon devices: an Auger and electrical study1989 / IEEE
By: Della, S.D.; Conte, G.; Grillo, G.; Vittori, V.; Tomaciello, R.; Gramaccioni, C.; Galluzzi, G.;