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Author: Ferguson, S.
Results
1996 / IEEE / 0-7803-3068-4
By: Ferguson, S.; Jun-Dong Park; Jones, W.L.; Alhumaidi, S.M.; Yueh, S.H.; Thursby, M.H.;
By: Ferguson, S.; Jun-Dong Park; Jones, W.L.; Alhumaidi, S.M.; Yueh, S.H.; Thursby, M.H.;
1999 / IEEE / 0-7803-5135-5
By: Taylor, M.R.S.; Thayne, I.G.; Cameron, N.I.; Holland, M.; Stanley, C.R.; Ferguson, S.; McLelland, H.; Edgar, D.L.; Beaumont, S.P.;
By: Taylor, M.R.S.; Thayne, I.G.; Cameron, N.I.; Holland, M.; Stanley, C.R.; Ferguson, S.; McLelland, H.; Edgar, D.L.; Beaumont, S.P.;
2000 / IEEE / 0-7803-5968-2
By: Stanley, C.R.; Elgaid, K.; Ferguson, S.; McLelland, H.; Edgar, D.L.; Lodhi, T.; Thayne, I.G.;
By: Stanley, C.R.; Elgaid, K.; Ferguson, S.; McLelland, H.; Edgar, D.L.; Lodhi, T.; Thayne, I.G.;
2000 / IEEE / 0-7803-6550-X
By: Williamson, F.; Hampson, J.; McLelland, H.; Edger, D.L.; Ternent, G.; Ferguson, S.; Fobelets, K.; Thayne, I.G.; Wilkinson, C.D.W.; Kaya, S.;
By: Williamson, F.; Hampson, J.; McLelland, H.; Edger, D.L.; Ternent, G.; Ferguson, S.; Fobelets, K.; Thayne, I.G.; Wilkinson, C.D.W.; Kaya, S.;
2001 / IEEE / 0-7803-6659-X
By: Emmons, D.H.; Cooper, F.L.; Kraus, P.R.; Spates, J.J.; McClain, R.D.; Ferguson, S.;
By: Emmons, D.H.; Cooper, F.L.; Kraus, P.R.; Spates, J.J.; McClain, R.D.; Ferguson, S.;
2002 / IEEE / 0-7803-7618-8
By: McEwan, F.; Ferguson, S.; McLelland, H.; Elgaid, K.; Thayne, I.; Edgar, D.; Chong, H.; Burns, G.; Ross, A.;
By: McEwan, F.; Ferguson, S.; McLelland, H.; Elgaid, K.; Thayne, I.; Edgar, D.; Chong, H.; Burns, G.; Ross, A.;
2003 / IEEE / 0-7803-7888-1
By: Ferguson, S.; Lapidoth, M.; Baumler, W.; Shafirstein, G.; Waner, M.; North, P.E.;
By: Ferguson, S.; Lapidoth, M.; Baumler, W.; Shafirstein, G.; Waner, M.; North, P.E.;
2004 / IEEE / 1-58053-992-0
By: Stanley, C.R.; Wilkinson, C.D.W.; Zhou, H.; Thorns, S.; Moran, D.; Boyd, E.; Cao, X.; Ferguson, S.; McLelland, H.; Elgaid, K.; Thayrie, I.G.;
By: Stanley, C.R.; Wilkinson, C.D.W.; Zhou, H.; Thorns, S.; Moran, D.; Boyd, E.; Cao, X.; Ferguson, S.; McLelland, H.; Elgaid, K.; Thayrie, I.G.;
1999 / IEEE
By: Edgar, D.L.; Beaumont, S.P.; Stanley, C.R.; Taylor, M.R.S.; Thayne, I.G.; Holland, M.; Cameron, N.I.; Ferguson, S.; McLelland, H.;
By: Edgar, D.L.; Beaumont, S.P.; Stanley, C.R.; Taylor, M.R.S.; Thayne, I.G.; Holland, M.; Cameron, N.I.; Ferguson, S.; McLelland, H.;
1999 / IEEE
By: Edgar, D.L.; Beaumont, S.P.; Taylor, M.R.S.; Thayne, I.G.; Doherty, F.; Ross, A.; Ferguson, S.; Williamson, F.; Elgaid, K.;
By: Edgar, D.L.; Beaumont, S.P.; Taylor, M.R.S.; Thayne, I.G.; Doherty, F.; Ross, A.; Ferguson, S.; Williamson, F.; Elgaid, K.;
2000 / IEEE
By: Collier, R.J.; Edgar, D.L.; Thayne, I.G.; Doherty, F.; Ross, A.; Williamson, F.; Ferguson, S.; McLelland, H.; Elgaid, K.; Li, D.; Jastrebski, A.K.; Yip, J.;
By: Collier, R.J.; Edgar, D.L.; Thayne, I.G.; Doherty, F.; Ross, A.; Williamson, F.; Ferguson, S.; McLelland, H.; Elgaid, K.; Li, D.; Jastrebski, A.K.; Yip, J.;
2010 / IEEE / 978-1-61284-981-2
By: Whitmire, C.; Clarke, M.E.; Singh, H.; Ferguson, S.; Rooney, J.; Taylor, J.; Anderson, J.; Fruh, E.;
By: Whitmire, C.; Clarke, M.E.; Singh, H.; Ferguson, S.; Rooney, J.; Taylor, J.; Anderson, J.; Fruh, E.;