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Author: David, C.
Results
2011 / IEEE / 978-3-8007-3356-9
By: Girard, J.C.; Fain, B.; Wang, Z.Z.; Sagnes, I.; Beaudoin, G.; Robert-Philip, I.; Elvira, D.; Beveratos, A.; Largeau, L.; Patriarche, G.; David, C.;
By: Girard, J.C.; Fain, B.; Wang, Z.Z.; Sagnes, I.; Beaudoin, G.; Robert-Philip, I.; Elvira, D.; Beveratos, A.; Largeau, L.; Patriarche, G.; David, C.;
1992 / IEEE / 0-7803-0526-4
By: David, C.; Zumkley, S.; Wingen, G.; Jager, D.; Ralston, J.D.; Larkins, E.C.;
By: David, C.; Zumkley, S.; Wingen, G.; Jager, D.; Ralston, J.D.; Larkins, E.C.;
2006 / IEEE / 0-7803-9576-X
By: Bunk, O.; Pfeiffer, F.; Groso, A.; Stampanoni, M.; David, C.; Diaz, A.; Weitkamp, T.;
By: Bunk, O.; Pfeiffer, F.; Groso, A.; Stampanoni, M.; David, C.; Diaz, A.; Weitkamp, T.;
2006 / IEEE / 1-4244-0109-7
By: Tanasoiu, C.; Miclea, C.; David, C.; Miclea, C.T.; Trupina, L.; Cioangher, M.; Amarande, L.;
By: Tanasoiu, C.; Miclea, C.; David, C.; Miclea, C.T.; Trupina, L.; Cioangher, M.; Amarande, L.;
2008 / IEEE / 978-0-7695-3139-7
By: Mamoun, F.; Jean-Paul, B.; Jean-Francois, R.; Dave, T.; David, C.;
By: Mamoun, F.; Jean-Paul, B.; Jean-Francois, R.; Dave, T.; David, C.;
2007 / IEEE / 978-1-4244-0847-4
By: Gheorghiu, A.; Miclea, C.F.; Spanulescu, I.; Tanasoiu, C.; Miclea, C.; Amarande, L.; Miclea, C.T.; David, C.; Trupina, L.; Cioangher, M.;
By: Gheorghiu, A.; Miclea, C.F.; Spanulescu, I.; Tanasoiu, C.; Miclea, C.; Amarande, L.; Miclea, C.T.; David, C.; Trupina, L.; Cioangher, M.;
2009 / IEEE / 978-1-4244-4256-0
By: Boedt, F.; Delprat, D.; Maleville, C.; Girard, C.; David, C.; Landru, D.; Alami-Idrissi, A.; Reynaud, P.;
By: Boedt, F.; Delprat, D.; Maleville, C.; Girard, C.; David, C.; Landru, D.; Alami-Idrissi, A.; Reynaud, P.;
2009 / IEEE / 978-981-08-3694-8
By: Solak, H.; Saidani, M.; Sarkar, S.S.; van der Veen, J.F.; David, C.;
By: Solak, H.; Saidani, M.; Sarkar, S.S.; van der Veen, J.F.; David, C.;
2010 / IEEE / 978-1-4244-5892-9
By: Schlatmann, R.; Papathanasiou, N.; Neumann, A.; David, C.; Calnan, S.; Rech, B.;
By: Schlatmann, R.; Papathanasiou, N.; Neumann, A.; David, C.; Calnan, S.; Rech, B.;
2011 / IEEE / 978-1-4577-0532-8
By: Robert-Philip, I.; Wang, Z.Z.; Sagnes, I.; Beveratos, A.; Maksymov, I.S.; Besbes, M.; Hugonin, J.P.; Lalanne, P.; Abram, I.; David, C.; Girard, J.C.; Le Gratiet, L.; Beaudoin, G.; Fain, B.; Larque, M.; Hostein, R.; Braive, R.; Elvira, D.;
By: Robert-Philip, I.; Wang, Z.Z.; Sagnes, I.; Beveratos, A.; Maksymov, I.S.; Besbes, M.; Hugonin, J.P.; Lalanne, P.; Abram, I.; David, C.; Girard, J.C.; Le Gratiet, L.; Beaudoin, G.; Fain, B.; Larque, M.; Hostein, R.; Braive, R.; Elvira, D.;
2011 / IEEE / 978-1-55752-911-4
By: Hugonin, J.P.; Besbes, M.; Maksymov, I.S.; Beveratos, A.; Sagnes, I.; Abram, I.; Robert-Philip, I.; Wang, Z.Z.; David, C.; Girard, J.C.; Le Gratiet, L.; Beaudoin, G.; Fain, B.; Larque, M.; Hostein, R.; Braive, R.; Elvira, D.; Lalanne, P.;
By: Hugonin, J.P.; Besbes, M.; Maksymov, I.S.; Beveratos, A.; Sagnes, I.; Abram, I.; Robert-Philip, I.; Wang, Z.Z.; David, C.; Girard, J.C.; Le Gratiet, L.; Beaudoin, G.; Fain, B.; Larque, M.; Hostein, R.; Braive, R.; Elvira, D.; Lalanne, P.;