Your Search Results
Use materials by this author in your textbook!
AcademicPub holds over eight million pieces of educational content such as case studies and journal articles for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Author: Das, S.
Results
2012 / IEEE
By: Razavi, P.; Yu, R.; Ferain, I.; Das, S.; Shayesteh, M.; Colinge, J.-P.; Duffy, R.; Kranti, A.;
By: Razavi, P.; Yu, R.; Ferain, I.; Das, S.; Shayesteh, M.; Colinge, J.-P.; Duffy, R.; Kranti, A.;
2012 / IEEE
By: Saidin, N.; Harun, S.W.; Shahabuddin, N.S.; Paul, M.C.; Halder, A.; Damanhuri, S.S.A.; Bhadra, S.K.; Pal, M.; Das, S.; Ahmad, H.;
By: Saidin, N.; Harun, S.W.; Shahabuddin, N.S.; Paul, M.C.; Halder, A.; Damanhuri, S.S.A.; Bhadra, S.K.; Pal, M.; Das, S.; Ahmad, H.;
2012 / IEEE
By: Kokar, M.M.; Valin, P.; Lambert, D.A.; Blasch, E.P.; Llinas, J.; Shahbazian, E.; Chee Chong; Das, S.;
By: Kokar, M.M.; Valin, P.; Lambert, D.A.; Blasch, E.P.; Llinas, J.; Shahbazian, E.; Chee Chong; Das, S.;
2011 / IEEE / 978-1-4577-0395-9
By: Altinay, M.; Pluta, J.; Das, S.; Jung Wook Suh; Hongzhi Wang; Yushkevich, P.;
By: Altinay, M.; Pluta, J.; Das, S.; Jung Wook Suh; Hongzhi Wang; Yushkevich, P.;
2011 / IEEE / 978-1-4244-9563-4
By: Chattopadhyay, K.; Bhadra Chaudhuri, S.R.; Das, S.; Mukherjee, S.;
By: Chattopadhyay, K.; Bhadra Chaudhuri, S.R.; Das, S.; Mukherjee, S.;
2011 / IEEE / 978-1-4577-0681-3
By: Dutta, A.; Lin, F.J.; Chee, D.; Das, S.; Schulzrinne, H.; Yokota, H.; Komorita, S.; Makaya, C.;
By: Dutta, A.; Lin, F.J.; Chee, D.; Das, S.; Schulzrinne, H.; Yokota, H.; Komorita, S.; Makaya, C.;
2011 / IEEE / 978-1-61284-764-1
By: Pakhira, A.; Majumder, B.; Das, S.; Gupta, A.; Das, S.; Pan, I.;
By: Pakhira, A.; Majumder, B.; Das, S.; Gupta, A.; Das, S.; Pan, I.;
Exponential regression models for wind and lightning caused outages on overhead distribution feeders
2011 / IEEE / 978-1-4577-0419-2By: Pahwa, A.; Kankanala, P.; Das, S.;
2011 / IEEE / 978-1-4577-1589-1
By: Alcindor, D.; Murai, A.; Trutoiu, L.; Das, S.; Hodgins, J.; De la Torre, F.; Oh, M.;
By: Alcindor, D.; Murai, A.; Trutoiu, L.; Das, S.; Hodgins, J.; De la Torre, F.; Oh, M.;
2011 / IEEE / 978-1-4244-8327-3
By: Akashi, F.; Das, S.; Bongyong Song; Soliman, S.; Chevallier, C.;
By: Akashi, F.; Das, S.; Bongyong Song; Soliman, S.; Chevallier, C.;
2011 / IEEE / 978-1-4577-1613-3
By: Gately, M.; Das, S.; Dalvi, D.; Grasso, M.A.; Yesha, Y.; Korolev, V.;
By: Gately, M.; Das, S.; Dalvi, D.; Grasso, M.A.; Yesha, Y.; Korolev, V.;
2011 / IEEE / 978-1-4673-0102-2
By: Das, S.; Saha, R.N.; Aziz, A.K.M.F.; Ahmed, M.; Ishtiaque Ahmed, S.; Shahid Ferdous, H.; Sharmin, L.;
By: Das, S.; Saha, R.N.; Aziz, A.K.M.F.; Ahmed, M.; Ishtiaque Ahmed, S.; Shahid Ferdous, H.; Sharmin, L.;
2011 / IEEE / 978-1-4244-9289-3
By: Turner, K.; Chary, S.; Tamelier, J.; Israelachvili, J.; Das, S.; Jing Yu;
By: Turner, K.; Chary, S.; Tamelier, J.; Israelachvili, J.; Das, S.; Jing Yu;
Principal component analysis based compression scheme for power system steady state operational data
2011 / IEEE / 978-1-4673-0315-6By: Rao, P.S.N.; Das, S.;
Revisiting oustaloup's recursive filter for analog realization of fractional order differintegrators
2011 / IEEE / 978-1-4673-0136-7By: Das, S.; Kumar, A.; Saha, S.; Pan, I.; Das, S.; Gupta, A.;
2012 / IEEE / 978-1-4673-0192-3
By: Das, S.; Ferain, I.; Razavi, P.; Colinge, J.-P.; Akhavan, N.D.; Ran Yu;
By: Das, S.; Ferain, I.; Razavi, P.; Colinge, J.-P.; Akhavan, N.D.; Ran Yu;
2012 / IEEE / 978-1-4673-0192-3
By: Akhavan, N.D.; Razavi, P.; Ferain, I.; Georgiev, Y.; Colinge, C.A.; Das, S.; Ran Yu; Hobbs, R.; Colinge, J.;
By: Akhavan, N.D.; Razavi, P.; Ferain, I.; Georgiev, Y.; Colinge, C.A.; Das, S.; Ran Yu; Hobbs, R.; Colinge, J.;
2012 / IEEE / 978-0-7695-4747-3
By: Perry, M.; Sundara, S.; Das, S.; Yalamanchi, A.; Banerjee, J.; Srinivasan, J.;
By: Perry, M.; Sundara, S.; Das, S.; Yalamanchi, A.; Banerjee, J.; Srinivasan, J.;
2012 / IEEE / 978-0-7695-4747-3
By: Auradkar, A.; Zhang, J.; Botev, C.; Das, S.; De Maagd, D.; Feinberg, A.; Ganti, P.; Lei Gao; Ghosh, B.; Gopalakrishna, K.; Harris, B.; Koshy, J.; Krawez, K.; Kreps, J.; Shi Lu; Nagaraj, S.; Narkhede, N.; Pachev, S.; Perisic, I.; Lin Qiao; Quiggle, T.; Jun Rao; Schulman, B.; Sebastian, A.; Seeliger, O.; Silberstein, A.; Shkolnik, B.; Soman, C.; Sumbaly, R.; Surlaker, K.; Topiwala, S.; Tran, C.; Varadarajan, B.; Westerman, J.; White, Z.; Zhang, D.;
By: Auradkar, A.; Zhang, J.; Botev, C.; Das, S.; De Maagd, D.; Feinberg, A.; Ganti, P.; Lei Gao; Ghosh, B.; Gopalakrishna, K.; Harris, B.; Koshy, J.; Krawez, K.; Kreps, J.; Shi Lu; Nagaraj, S.; Narkhede, N.; Pachev, S.; Perisic, I.; Lin Qiao; Quiggle, T.; Jun Rao; Schulman, B.; Sebastian, A.; Seeliger, O.; Silberstein, A.; Shkolnik, B.; Soman, C.; Sumbaly, R.; Surlaker, K.; Topiwala, S.; Tran, C.; Varadarajan, B.; Westerman, J.; White, Z.; Zhang, D.;
2012 / IEEE / 978-1-4577-0295-2
By: Flocchini, P.; Das, S.; Yamashita, M.; Santoro, N.; Prencipe, G.;
By: Flocchini, P.; Das, S.; Yamashita, M.; Santoro, N.; Prencipe, G.;