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Author: Dadap, J.I.
Results
1996 / IEEE / 0-7803-3175-3
By: Aktsipetrov, O.A.; Beek, M.T.; Anderson, M.H.; Hu, X.F.; Dadap, J.I.; Ekerdt, J.G.; Russell, N.M.;
By: Aktsipetrov, O.A.; Beek, M.T.; Anderson, M.H.; Hu, X.F.; Dadap, J.I.; Ekerdt, J.G.; Russell, N.M.;
1996 / IEEE / 0-7803-3171-0
By: Anderson, M.H.; Aktsipetrov, O.A.; Lowell, J.K.; Downer, M.C.; Fedyamin, A.A.; Hu, X.F.; Dadap, J.I.; Melnikov, A.V.;
By: Anderson, M.H.; Aktsipetrov, O.A.; Lowell, J.K.; Downer, M.C.; Fedyamin, A.A.; Hu, X.F.; Dadap, J.I.; Melnikov, A.V.;
1997 / IEEE / 0-7803-4125-2
By: Downer, M.C.; Aktsipetrov, O.A.; Xu, Z.; Wilson, P.T.; Russell, N.M.; Mishina, E.D.; Lowell, J.K.; Lim, D.; Lee, Y.S.; Jiang, Y.; Hu, X.F.; Ekerdt, J.G.; Dadap, J.I.; Anderson, M.H.; ter Beek, M.;
By: Downer, M.C.; Aktsipetrov, O.A.; Xu, Z.; Wilson, P.T.; Russell, N.M.; Mishina, E.D.; Lowell, J.K.; Lim, D.; Lee, Y.S.; Jiang, Y.; Hu, X.F.; Ekerdt, J.G.; Dadap, J.I.; Anderson, M.H.; ter Beek, M.;
1998 / IEEE / 1-55752-541-2
By: Anderson, M.H.; Aktsipetrov, O.A.; Rubtsov, A.N.; Mishina, E.D.; Melnikov, A.V.; Wilson, P.T.; Downer, M.C.; Dadap, J.I.; Fedyanin, A.A.; Hu, X.F.; ter Beek, M.;
By: Anderson, M.H.; Aktsipetrov, O.A.; Rubtsov, A.N.; Mishina, E.D.; Melnikov, A.V.; Wilson, P.T.; Downer, M.C.; Dadap, J.I.; Fedyanin, A.A.; Hu, X.F.; ter Beek, M.;
1999 / IEEE / 1-55752-576-X
By: Shan, J.; Dadap, J.I.; Yotk, N.; Heinz, T.F.; Nahata, A.; Weling, A.S.;
By: Shan, J.; Dadap, J.I.; Yotk, N.; Heinz, T.F.; Nahata, A.; Weling, A.S.;
1996 / IEEE / 1-55752-444-0
By: Lowell, J.K.; Downer, M.C.; Anderson, M.H.; Hu, X.F.; Dadap, J.I.; Aktsipetrov, O.A.;
By: Lowell, J.K.; Downer, M.C.; Anderson, M.H.; Hu, X.F.; Dadap, J.I.; Aktsipetrov, O.A.;
1996 / IEEE / 1-55752-444-0
By: Ekerdt, J.G.; Russell, N.M.; Hu, X.F.; Dadap, J.I.; Aktsipetrov, O.A.; Downer, M.C.;
By: Ekerdt, J.G.; Russell, N.M.; Hu, X.F.; Dadap, J.I.; Aktsipetrov, O.A.; Downer, M.C.;
2003 / IEEE
By: Chu, P.B.; Brener, I.; Dadap, J.I.; Walker, J.A.; Lin, L.Y.; Goldstein, E.L.; Zhong, W.; Wu, C.; Tsai, M.; Tong, D.; Rodriguez, R.; Peale, D.R.; Park, S.; Lee, S.S.; Johnson, J.J.; Harel, R.; Gibson, R.; Doran, R.; Chou, M.; Chau, T.; Bonadeo, N.; Bergman, K.; Lee, C.D.; Pu, C.;
By: Chu, P.B.; Brener, I.; Dadap, J.I.; Walker, J.A.; Lin, L.Y.; Goldstein, E.L.; Zhong, W.; Wu, C.; Tsai, M.; Tong, D.; Rodriguez, R.; Peale, D.R.; Park, S.; Lee, S.S.; Johnson, J.J.; Harel, R.; Gibson, R.; Doran, R.; Chou, M.; Chau, T.; Bonadeo, N.; Bergman, K.; Lee, C.D.; Pu, C.;
2003 / IEEE / 0-7803-7766-4
By: Walker, J.A.; Lin, L.; Goldstein, E.; Gibson, R.; Zhong, W.; Chau, T.; Bonadeo, N.; Bergman, K.; Doran, R.; Chou, M.; Tong, D.; Park, S.; Johnson, J.; Rodriguez, R.; Lee, S.; Wu, C.; Harel, R.; Peale, D.; Pu, C.; Tsai, M.; Brener, I.; Lee, C.D.; Dadap, J.I.; Chu, P.B.;
By: Walker, J.A.; Lin, L.; Goldstein, E.; Gibson, R.; Zhong, W.; Chau, T.; Bonadeo, N.; Bergman, K.; Doran, R.; Chou, M.; Tong, D.; Park, S.; Johnson, J.; Rodriguez, R.; Lee, S.; Wu, C.; Harel, R.; Peale, D.; Pu, C.; Tsai, M.; Brener, I.; Lee, C.D.; Dadap, J.I.; Chu, P.B.;
2005 / IEEE
By: Chu, P.B.; Walker, J.A.; Chuan Pu; Shi-Sheng Lee; Dadap, J.I.; Sangtae Park; Bergman, K.; Bonadeo, N.H.; Chau, T.; Ming Chou; Doran, R.A.; Gibson, R.; Harel, R.; Johnson, J.J.; Lee, C.D.; Peale, D.R.; Bo Tang; Tong, D.T.K.; Ming-Ju Tsai; Qi Wu; Zhong, W.; Goldstein, E.L.; Lin, L.Y.; Brener, I.;
By: Chu, P.B.; Walker, J.A.; Chuan Pu; Shi-Sheng Lee; Dadap, J.I.; Sangtae Park; Bergman, K.; Bonadeo, N.H.; Chau, T.; Ming Chou; Doran, R.A.; Gibson, R.; Harel, R.; Johnson, J.J.; Lee, C.D.; Peale, D.R.; Bo Tang; Tong, D.T.K.; Ming-Ju Tsai; Qi Wu; Zhong, W.; Goldstein, E.L.; Lin, L.Y.; Brener, I.;
2005 / IEEE / 1-55752-795-4
By: Osgood, R.M., Jr.; Dadap, J.I.; Espinola, R.L.; Vlasov, Y.A.; McNab, S.J.;
By: Osgood, R.M., Jr.; Dadap, J.I.; Espinola, R.L.; Vlasov, Y.A.; McNab, S.J.;
2006 / IEEE / 1-4244-0096-1
By: Chen, X.; Hsieh, I.-W.; Vlasov, Y.; McNab, S.J.; Osgood, R.M.; Panoiu, N.C.; Dadap, J.I.;
By: Chen, X.; Hsieh, I.-W.; Vlasov, Y.; McNab, S.J.; Osgood, R.M.; Panoiu, N.C.; Dadap, J.I.;
2006 / IEEE / 0-7803-9556-5
By: McNab, S.J.; Dadap, J.I.; Chen, X.; Hsieh, I.-W.; Dulkeith, E.F.; Osgood, R.; Panoiu, N.; Vlasov, Y.;
By: McNab, S.J.; Dadap, J.I.; Chen, X.; Hsieh, I.-W.; Dulkeith, E.F.; Osgood, R.; Panoiu, N.; Vlasov, Y.;
2008 / IEEE / 978-1-4244-1594-6
By: Vlasov, Y.A.; Green, W.M.; Fengnian Xia; Cheng-Yun Chou; Panoiu, N.C.; Osgood, R.M.; Dadap, J.I.; Xiaoping Liu; Xiaogang Chen; I-Wei Hsieh;
By: Vlasov, Y.A.; Green, W.M.; Fengnian Xia; Cheng-Yun Chou; Panoiu, N.C.; Osgood, R.M.; Dadap, J.I.; Xiaoping Liu; Xiaogang Chen; I-Wei Hsieh;
2008 / IEEE
By: Bergman, K.; Osgood, R.M.; Vlasov, Y.A.; Sekaric, L.; Green, W.M.J.; Fengnian Xia; Lee, B.G.; Cheng-Yun Chou; I-Wei Hsieh; Xiaoping Liu; Biberman, A.; Xiaogang Chen; Dadap, J.I.;
By: Bergman, K.; Osgood, R.M.; Vlasov, Y.A.; Sekaric, L.; Green, W.M.J.; Fengnian Xia; Lee, B.G.; Cheng-Yun Chou; I-Wei Hsieh; Xiaoping Liu; Biberman, A.; Xiaogang Chen; Dadap, J.I.;
2007 / IEEE / 978-1-55752-834-6
By: Panoiu, N.C.; Dadap, J.I.; Xiaogang Chen; I-Wei Hsieh; Osgood, R.M.;
By: Panoiu, N.C.; Dadap, J.I.; Xiaogang Chen; I-Wei Hsieh; Osgood, R.M.;
2008 / IEEE / 978-1-55752-859-9
By: Vlasov, Yu.A.; Fengnian Xia; Green, W.M.; Osgood, R.M.; Panoiu, N.C.; Xiaoping Liu; Dadap, J.I.; Takekoshi, M.; Xiaogang Chen; I-Wei Hsieh;
By: Vlasov, Yu.A.; Fengnian Xia; Green, W.M.; Osgood, R.M.; Panoiu, N.C.; Xiaoping Liu; Dadap, J.I.; Takekoshi, M.; Xiaogang Chen; I-Wei Hsieh;
2008 / IEEE / 978-1-55752-859-9
By: Osgood, R.M.; Dadap, J.I.; Djukic, D.; Ofan, A.; Gaathon, O.; Bakhru, H.; Bakhru, S.;
By: Osgood, R.M.; Dadap, J.I.; Djukic, D.; Ofan, A.; Gaathon, O.; Bakhru, H.; Bakhru, S.;
2006 / IEEE / 978-1-55752-813-1
By: Hsieh, I.-W.; Vlasov, Y.A.; McNab, S.J.; Osgood, R.M.; Panoiu, N.C.; Dadap, J.I.; Chen, X.-G.;
By: Hsieh, I.-W.; Vlasov, Y.A.; McNab, S.J.; Osgood, R.M.; Panoiu, N.C.; Dadap, J.I.; Chen, X.-G.;
2009 / IEEE / 978-1-55752-869-8
By: Osgood, R.M.; Dadap, J.I.; Driscoll, J.B.; Xiaoping Liu; Green, W.M.J.; Vlasov, Y.A.;
By: Osgood, R.M.; Dadap, J.I.; Driscoll, J.B.; Xiaoping Liu; Green, W.M.J.; Vlasov, Y.A.;
2010 / IEEE
By: Astar, W.; Osgood, R.M.; Carter, G.M.; Vlasov, Y.A.; Driscoll, J.B.; Green, W.M.J.; Dadap, J.I.; Xiaoping Liu;
By: Astar, W.; Osgood, R.M.; Carter, G.M.; Vlasov, Y.A.; Driscoll, J.B.; Green, W.M.J.; Dadap, J.I.; Xiaoping Liu;
2010 / IEEE
By: Osgood, R.M.; Carter, G.M.; Vlasov, Y.A.; Green, W.M.J.; Driscoll, J.B.; Dadap, J.I.; Xiaoping Liu; Astar, W.;
By: Osgood, R.M.; Carter, G.M.; Vlasov, Y.A.; Green, W.M.J.; Driscoll, J.B.; Dadap, J.I.; Xiaoping Liu; Astar, W.;
2010 / IEEE
By: Liu, X.; Driscoll, J.B.; Astar, W.; Osgood, R.M.; Carter, G.M.; Vlasov, Y.; Green, W.M.J.; Dadap, J.I.;
By: Liu, X.; Driscoll, J.B.; Astar, W.; Osgood, R.M.; Carter, G.M.; Vlasov, Y.; Green, W.M.J.; Dadap, J.I.;
2010 / IEEE / 978-1-55752-890-2
By: Driscoll, J.B.; Osgood, R.M.; Panoiu, N.C.; Dadap, J.I.; Grote, R.R.; Xiaoping Liu; Lidor, R.;
By: Driscoll, J.B.; Osgood, R.M.; Panoiu, N.C.; Dadap, J.I.; Grote, R.R.; Xiaoping Liu; Lidor, R.;
2010 / IEEE / 978-1-55752-890-2
By: Grote, R.R.; Liu, X.; Astar, W.; Driscoll, J.B.; Dadap, J.I.; Carter, G.M.; Osgood, R.M.; Vlasov, Y.A.; Green, W.M.J.;
By: Grote, R.R.; Liu, X.; Astar, W.; Driscoll, J.B.; Dadap, J.I.; Carter, G.M.; Osgood, R.M.; Vlasov, Y.A.; Green, W.M.J.;
2010 / IEEE / 978-1-55752-890-2
By: Yilmaz, M.; Knox, K.; Zhaofeng Hao; Dadap, J.I.; Johnson, P.D.; Osgood, R.M.; Zaki, N.;
By: Yilmaz, M.; Knox, K.; Zhaofeng Hao; Dadap, J.I.; Johnson, P.D.; Osgood, R.M.; Zaki, N.;
2011 / IEEE / 978-1-55752-911-4
By: Driscoll, J.B.; Osgood, R.M.; Panoiu, N.C.; Dadap, J.I.; Xiaoping Liu; Grote, R.R.;
By: Driscoll, J.B.; Osgood, R.M.; Panoiu, N.C.; Dadap, J.I.; Xiaoping Liu; Grote, R.R.;
2011 / IEEE / 978-1-55752-911-4
By: Knox, K.R.; Petrovic, M.; Kralj, M.; Dadap, J.I.; Bhandari, R.; Osgood, R.M.; Zaki, N.; Po-Chun Yen;
By: Knox, K.R.; Petrovic, M.; Kralj, M.; Dadap, J.I.; Bhandari, R.; Osgood, R.M.; Zaki, N.; Po-Chun Yen;