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Author: Critchley, A.
Results
2004 / IEEE / 978-5-87911-088-3
By: O'Malley, J.; McLean, J.; Hamlett, A.; Critchley, A.; Crotch, I.; Phillips, M.; Cooper, G.; Aedy, C.; Sinclair, M.; Threadgold, J.; Quillin, S.;
By: O'Malley, J.; McLean, J.; Hamlett, A.; Critchley, A.; Crotch, I.; Phillips, M.; Cooper, G.; Aedy, C.; Sinclair, M.; Threadgold, J.; Quillin, S.;
2004 / IEEE / 0-7803-8334-6
By: Cooper, G.; McLean, J.; Guarrigues, A.; Delbos, C.; Bayol, F.; Toury, M.; Nicot, G.; Tailleur, Y.; Rosol, R.; Prat, M.; Nicolas, R.; Merle, E.; Magnin, L.; Horde, Y.; Vermare, C.; Sinclair, M.; Critchley, A.;
By: Cooper, G.; McLean, J.; Guarrigues, A.; Delbos, C.; Bayol, F.; Toury, M.; Nicot, G.; Tailleur, Y.; Rosol, R.; Prat, M.; Nicolas, R.; Merle, E.; Magnin, L.; Horde, Y.; Vermare, C.; Sinclair, M.; Critchley, A.;
2004 / IEEE / 0-7803-8334-6
By: Threadgold, J.; Crotch, I.; Critchley, A.; Young, F.C.; Weber, B.V.; Stephanakis, S.J.; Hinshelwood, D.; Strasburg, S.; Ponce, D.M.; Mosher, D.; Cooperstein, G.; Swanekamp, S.B.;
By: Threadgold, J.; Crotch, I.; Critchley, A.; Young, F.C.; Weber, B.V.; Stephanakis, S.J.; Hinshelwood, D.; Strasburg, S.; Ponce, D.M.; Mosher, D.; Cooperstein, G.; Swanekamp, S.B.;
2005 / IEEE
By: Critchley, A.; Young, F.C.; Weber, B.V.; Stephanakis, S.J.; Swanekamp, S.B.; Strasburg, S.D.; Crotch, I.; Mosher, D.; Cooperstein, G.; Hinshelwood, D.; Ponce, D.M.; Threadgold, J.;
By: Critchley, A.; Young, F.C.; Weber, B.V.; Stephanakis, S.J.; Swanekamp, S.B.; Strasburg, S.D.; Crotch, I.; Mosher, D.; Cooperstein, G.; Hinshelwood, D.; Ponce, D.M.; Threadgold, J.;
2006 / IEEE / 1-4244-0125-9
By: Threadgold, J.; Lutz, S.; Oliver, B.V.; Portillo, S.; Droemer, D.; Jones, A.; Critchley, A.; Rose, D.V.;
By: Threadgold, J.; Lutz, S.; Oliver, B.V.; Portillo, S.; Droemer, D.; Jones, A.; Critchley, A.; Rose, D.V.;
2005 / IEEE / 0-7803-9189-6
By: Critchley, A.; Fettig, Z.; Johnston, M.; Hahn, K.; Threadgold, J.; Hinshelwood, D.D.; Ponce, D.M.; Weber, B.V.;
By: Critchley, A.; Fettig, Z.; Johnston, M.; Hahn, K.; Threadgold, J.; Hinshelwood, D.D.; Ponce, D.M.; Weber, B.V.;
2005 / IEEE / 0-7803-9189-6
By: Portillo, S.; Rose, D.; Crotch, I.; Jones, A.; Critchley, A.; Threadgold, J.;
By: Portillo, S.; Rose, D.; Crotch, I.; Jones, A.; Critchley, A.; Threadgold, J.;
2007 / IEEE / 978-1-4244-0915-0
By: Martin, P.; McBarron, W.; Critchley, A.; Weber, B.V.; Hinshelwood, D.D.; Jackson, S.L.; Threadgold, J.;
By: Martin, P.; McBarron, W.; Critchley, A.; Weber, B.V.; Hinshelwood, D.D.; Jackson, S.L.; Threadgold, J.;
2008 / IEEE / 978-1-4244-1929-6
By: Welch, D.R.; Rose, D.V.; Portillo, S.; Oliver, B.V.; Johnston, M.D.; Critchley, A.; Heathcote, A.; Stambulchik, E.; Bernshtam, V.; Mehlhorn, T.A.; Klodzh, E.; Maron, Y.; Droemer, D.; Bruner, N.;
By: Welch, D.R.; Rose, D.V.; Portillo, S.; Oliver, B.V.; Johnston, M.D.; Critchley, A.; Heathcote, A.; Stambulchik, E.; Bernshtam, V.; Mehlhorn, T.A.; Klodzh, E.; Maron, Y.; Droemer, D.; Bruner, N.;
2009 / IEEE / 978-1-4244-2617-1
By: Johnston, M.D.; Webb, T.; Molina, I.; Leckbee, J.J.; Cordova, S.R.; Oliver, B.V.; Hahn, K.; Threadgold, J.; Jones, A.; Heathcoat, A.; Crotch, I.; Critchley, A.; Clough, S.; Ziska, D.; Portillo, S.; Welch, D.R.; Rose, D.V.;
By: Johnston, M.D.; Webb, T.; Molina, I.; Leckbee, J.J.; Cordova, S.R.; Oliver, B.V.; Hahn, K.; Threadgold, J.; Jones, A.; Heathcoat, A.; Crotch, I.; Critchley, A.; Clough, S.; Ziska, D.; Portillo, S.; Welch, D.R.; Rose, D.V.;
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