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Author: Contarino, V.M.
Results
1995 / IEEE / 0-933957-14-9
By: Contarino, V.M.; Allocca, D.; Herczfeld, P.R.; Yost, T.; Mullen, L.;
By: Contarino, V.M.; Allocca, D.; Herczfeld, P.R.; Yost, T.; Mullen, L.;
1993 / IEEE / 0-7803-1288-0
By: Contarino, V.M.; Herczfeld, P.R.; Mullen, L.; Billmers, R.; Squicciarini, M.F.; Allocca, D.;
By: Contarino, V.M.; Herczfeld, P.R.; Mullen, L.; Billmers, R.; Squicciarini, M.F.; Allocca, D.;
1997 / IEEE / 0-7803-4125-2
By: Contarino, V.M.; Nabet, B.; Herczfeld, P.R.; Yost, T.A.; Culp, J.A.;
By: Contarino, V.M.; Nabet, B.; Herczfeld, P.R.; Yost, T.A.; Culp, J.A.;
1997 / IEEE / 0-7803-4178-3
By: Herczfeld, P.R.; De Barros, L.E.M., Jr.; Vieira, A.J.C.; Contarino, V.M.;
By: Herczfeld, P.R.; De Barros, L.E.M., Jr.; Vieira, A.J.C.; Contarino, V.M.;
1997 / IEEE / 0-7803-4165-1
By: Yost, T.A.; Culp, J.A.; Contarino, V.M.; Nabet, B.; Herczfeld, P.R.;
By: Yost, T.A.; Culp, J.A.; Contarino, V.M.; Nabet, B.; Herczfeld, P.R.;
2000 / IEEE / 1-55752-634-6
By: Davis, J.; Concannon, B.M.; Mullen, L.L.; Laux, A.E.; Billmers, R.I.; Contarino, V.M.;
By: Davis, J.; Concannon, B.M.; Mullen, L.L.; Laux, A.E.; Billmers, R.I.; Contarino, V.M.;
2000 / IEEE / 1-55752-634-6
By: Holloway, T.; Ludbrook, G.; Mullen, L.; Contarino, V.M.; Allocca, D.;
By: Holloway, T.; Ludbrook, G.; Mullen, L.; Contarino, V.M.; Allocca, D.;
2001 / IEEE / 1-55752-662-1
By: Contarino, V.M.; Davis, J.P.; Concannon, B.M.; Mullen, L.J.; Laux, A.E.; Billmers, R.I.;
By: Contarino, V.M.; Davis, J.P.; Concannon, B.M.; Mullen, L.J.; Laux, A.E.; Billmers, R.I.;
1985 / IEEE
By: Contarino, V.M.; Daryoush, A.S.; Herczfield, P.R.; Khana, A.P.S.; Turski, Z.; Rosen, A.;
By: Contarino, V.M.; Daryoush, A.S.; Herczfield, P.R.; Khana, A.P.S.; Turski, Z.; Rosen, A.;
2004 / IEEE / 0-7803-8306-0
By: Podobna, Y.Y.; Petrosyuk, I.M.; Molchanov, P.A.; Contarino, V.M.; Asmolova, O.V.;
By: Podobna, Y.Y.; Petrosyuk, I.M.; Molchanov, P.A.; Contarino, V.M.; Asmolova, O.V.;
2005 / IEEE / 1-4244-0083-X
By: Petrosyuk, I.M.; Asmolova, O.V.; Contarino, V.M.; Molchanov, P.A.; Podobna, Y.Y.;
By: Petrosyuk, I.M.; Asmolova, O.V.; Contarino, V.M.; Molchanov, P.A.; Podobna, Y.Y.;
2006 / IEEE / 0-7803-9580-8
By: Concannon, B.M.; Contarino, V.M.; Molchanov, P.A.; Podobna, Y.Y.; Petrosyuk, I.M.; Asmolova, O.V.;
By: Concannon, B.M.; Contarino, V.M.; Molchanov, P.A.; Podobna, Y.Y.; Petrosyuk, I.M.; Asmolova, O.V.;
2006 / IEEE / 1-4244-0308-1
By: Asmolova, O.V.; Podobna, Y.Y.; Petrosyuk, I.M.; Molchanov, P.A.; Contarino, V.M.;
By: Asmolova, O.V.; Podobna, Y.Y.; Petrosyuk, I.M.; Molchanov, P.A.; Contarino, V.M.;
2006 / IEEE / 0-7803-9360-0
By: Molchanov, P.A.; Contarino, V.M.; Podobna, Y.Y.; Petrosyuk, I.M.; Asmolova, O.V.;
By: Molchanov, P.A.; Contarino, V.M.; Podobna, Y.Y.; Petrosyuk, I.M.; Asmolova, O.V.;
1985 / IEEE
By: Rosen, A.; Herczfeld, P.R.; Daryoush, A.S.; Ortiz, A.; Contarino, V.M.; Stabile, P.;
By: Rosen, A.; Herczfeld, P.R.; Daryoush, A.S.; Ortiz, A.; Contarino, V.M.; Stabile, P.;
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