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Author: Ali, A.
Results
2011 / IEEE
By: Madan, H.; Ali, A.; Datta, S.; Lindemuth, J.; Agrawal, A.; Bennett, B.R.; Boos, J.B.; Misra, R.; Ramirez, I.;
By: Madan, H.; Ali, A.; Datta, S.; Lindemuth, J.; Agrawal, A.; Bennett, B.R.; Boos, J.B.; Misra, R.; Ramirez, I.;
2011 / IEEE / 978-1-4577-1564-8
By: Saghir, M.A.R.; Ali, A.; Abbani, N.; Hajj, H.; Awad, M.; Al Otoom, D.; Akkary, H.; Artail, H.; Sharafeddine, M.; Jomaa, M.;
By: Saghir, M.A.R.; Ali, A.; Abbani, N.; Hajj, H.; Awad, M.; Al Otoom, D.; Akkary, H.; Artail, H.; Sharafeddine, M.; Jomaa, M.;
2011 / IEEE / 978-1-4577-1642-3
By: Tawi, F.M.T.; Sagiruddin, M.A.; Ali, A.; Ariffin, R.; Ishak, N.H.;
By: Tawi, F.M.T.; Sagiruddin, M.A.; Ali, A.; Ariffin, R.; Ishak, N.H.;
2012 / IEEE / 978-1-55752-935-1
By: Ruprecht, C.; Ali, A.; Jing Xu; Rosenkranz, W.; Leibrich, J.; Jiani Zhao; von Hoyningen-Huene, J.;
By: Ruprecht, C.; Ali, A.; Jing Xu; Rosenkranz, W.; Leibrich, J.; Jiani Zhao; von Hoyningen-Huene, J.;
2012 / IEEE / 978-1-4673-0747-5
By: Romanous, B.; Jomaa, M.; Ali, A.; Hajj, H.; Sharafeddine, M.; Awad, M.; Artail, H.; Akkary, H.; Saghir, M.A.R.;
By: Romanous, B.; Jomaa, M.; Ali, A.; Hajj, H.; Sharafeddine, M.; Awad, M.; Artail, H.; Akkary, H.; Saghir, M.A.R.;
2014 / IEEE
By: Hassan, A.H.; Mostafa, H.; Refky, M.; Ismail, M.W.; Hassoubh, M.; Ali, A.; Mohammed, N.; Ali, M.;
By: Hassan, A.H.; Mostafa, H.; Refky, M.; Ismail, M.W.; Hassoubh, M.; Ali, A.; Mohammed, N.; Ali, M.;
1996 / IEEE / 0-7803-3073-0
By: Hull, C.; Joo Leong Tham; Koullias, I.; Walley, J.; Chu, R.; Carr, F.; Ali, A.;
By: Hull, C.; Joo Leong Tham; Koullias, I.; Walley, J.; Chu, R.; Carr, F.; Ali, A.;
1998 / IEEE / 0-7803-4233X
By: Ergun, Y.; Sari, H.; Mills, S.J.; McEntee, N.; Ali, A.; Balkan, N.; Sokmen, I.;
By: Ergun, Y.; Sari, H.; Mills, S.J.; McEntee, N.; Ali, A.; Balkan, N.; Sokmen, I.;
1999 / IEEE / 0-7803-5403-6
By: Ali, A.; Laaksonen, T.; Lavangkul, S.; Rao, S.S.P.; Nam Luu; Friedmann, J.B.;
By: Ali, A.; Laaksonen, T.; Lavangkul, S.; Rao, S.S.P.; Nam Luu; Friedmann, J.B.;
2003 / IEEE / 977-05-2010-1
By: Salah, A.; Habib, S.E.-D.; Hussein, A.; Ali, A.; Ezeldin, A.; Adel, A.;
By: Salah, A.; Habib, S.E.-D.; Hussein, A.; Ali, A.; Ezeldin, A.; Adel, A.;
2004 / IEEE / 0-7695-2167-3
By: Steenberg, C.; Thomas, M.; Azim, T.; Anjum, A.; Newman, H.; Waqas ur Rehman; Ali, A.; Haider, R.; Bunn, J.;
By: Steenberg, C.; Thomas, M.; Azim, T.; Anjum, A.; Newman, H.; Waqas ur Rehman; Ali, A.; Haider, R.; Bunn, J.;
2004 / IEEE / 0-7803-8325-7
By: Ikram, A.; Azim, T.; Thomas, M.; Bunn, J.J.; Newman, H.B.; Steenberg, C.; Anjum, A.; Ali, A.;
By: Ikram, A.; Azim, T.; Thomas, M.; Bunn, J.J.; Newman, H.B.; Steenberg, C.; Anjum, A.; Ali, A.;