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Topic: Windows
Results
2012 / IEEE
By: Charrier, J.; Yamamoto, A.; Anstett, D.; Bargueden, P.; Boussuge, T.; Bouty, A.; Dubois, O.; Durand, G.; Fazilleau, P.; Gibier, D.; Gournay, J.; Le Pouhalec, P.; Loiseau, D.; Lotrus, P.; Molinie, F.; Pinvidic, B.; Queinec, Y.; Zito, M.; Ogitsu, T.; Sasaki, K.; Kimura, N.; Kobayashi, T.; Makida, Y.; Nakamoto, T.; Ohhata, H.; Okamura, T.; Allard, J.;
By: Charrier, J.; Yamamoto, A.; Anstett, D.; Bargueden, P.; Boussuge, T.; Bouty, A.; Dubois, O.; Durand, G.; Fazilleau, P.; Gibier, D.; Gournay, J.; Le Pouhalec, P.; Loiseau, D.; Lotrus, P.; Molinie, F.; Pinvidic, B.; Queinec, Y.; Zito, M.; Ogitsu, T.; Sasaki, K.; Kimura, N.; Kobayashi, T.; Makida, Y.; Nakamoto, T.; Ohhata, H.; Okamura, T.; Allard, J.;
The application of intelligent remote monitoring platform under Windows on physical theory education
2011 / IEEE / 978-1-61284-774-0By: Wan-Feng Xia; Hua Tan; Rong Jiang;
2011 / IEEE / 978-1-4503-0445-0
By: Kivett, R.; Li, P.L.; Ko, A.J.; Murphy, B.; Nagappan, N.; Sung-eok Jeon; Zhiyuan Zhan;
By: Kivett, R.; Li, P.L.; Ko, A.J.; Murphy, B.; Nagappan, N.; Sung-eok Jeon; Zhiyuan Zhan;
2011 / IEEE / 978-1-4577-1732-1
By: Weihua Cao; Qianchuan Zhao; Hao Liu; Xiang Zhao; Ningjian Huang;
By: Weihua Cao; Qianchuan Zhao; Hao Liu; Xiang Zhao; Ningjian Huang;
2011 / IEEE / 978-1-4244-6051-9
By: Mostarshedi, S.; Richalot, E.; Wong, M.F.; Wiart, J.; Picon, O.;
By: Mostarshedi, S.; Richalot, E.; Wong, M.F.; Wiart, J.; Picon, O.;
2011 / IEEE / 978-1-4673-0047-6
By: Kwoczek, A.; Vagner, P.; Puskely, J.; Pokorny, M.; Lacik, J.; Raida, Z.;
By: Kwoczek, A.; Vagner, P.; Puskely, J.; Pokorny, M.; Lacik, J.; Raida, Z.;
2011 / IEEE / 978-1-4244-9965-6
By: Dixon, A.; Bose, R.; Farrell, D.J.; Chatten, A.J.; Poelking, C.; Barnham, K.W.J.; Mazzer, M.; Godel, K.C.;
By: Dixon, A.; Bose, R.; Farrell, D.J.; Chatten, A.J.; Poelking, C.; Barnham, K.W.J.; Mazzer, M.; Godel, K.C.;
2012 / IEEE / 978-1-4577-0920-3
By: Kanso, A.; Arnaud, E.; Noguera, R.; Dossou-yovo, C.; Beaudrouet, E.; Thevenot, M.; Passerieux, D.; Monediere, T.;
By: Kanso, A.; Arnaud, E.; Noguera, R.; Dossou-yovo, C.; Beaudrouet, E.; Thevenot, M.; Passerieux, D.; Monediere, T.;
2012 / IEEE / 978-1-4673-0426-9
By: Al Yacouby, A.M.; Khamidi, M.F.; Farhan, S.A.; Nuruddin, M.F.; Idrus, A.;
By: Al Yacouby, A.M.; Khamidi, M.F.; Farhan, S.A.; Nuruddin, M.F.; Idrus, A.;
2012 / IEEE / 978-1-908320-05-6
By: Savage, Nick; Olajide, Funminiyi; Shoniregun, Charles; Akmayeva, Galyna;
By: Savage, Nick; Olajide, Funminiyi; Shoniregun, Charles; Akmayeva, Galyna;
2014 / IEEE
By: Alghamedi, Ramzy; Vasiliev, Mikhail; Alameh, Kamal; Rosenberg, Victor; Nur-E-Alam, Mohammad;
By: Alghamedi, Ramzy; Vasiliev, Mikhail; Alameh, Kamal; Rosenberg, Victor; Nur-E-Alam, Mohammad;
2014 / IEEE
By: Channappayya, Sumohana; Jana, Soumya; Ready, Jayanth; Vupparaboina, Kiran Kumar; Tamboli, Roopak;
By: Channappayya, Sumohana; Jana, Soumya; Ready, Jayanth; Vupparaboina, Kiran Kumar; Tamboli, Roopak;
2014 / IEEE
By: Stevan, Sergio; Mauro, Max; Franco, Felipe; Torres, Weslley; Lugli, Alexandre Baratella;
By: Stevan, Sergio; Mauro, Max; Franco, Felipe; Torres, Weslley; Lugli, Alexandre Baratella;
2013 / IEEE
By: Pendell, Travis; Wagner, Matthew; Newill, Brett; Strharsky, Roger J.; Roushia, Blaine; Moening, Joseph P.; Weber, Paul J.; Holbrook, Ben; Hebrink, Tim;
By: Pendell, Travis; Wagner, Matthew; Newill, Brett; Strharsky, Roger J.; Roushia, Blaine; Moening, Joseph P.; Weber, Paul J.; Holbrook, Ben; Hebrink, Tim;
2013 / IEEE
By: Mahabaduge, H.; Paudel, N. R.; Stayancho, J. M.; Carter, C. W.; Plotnikov, V. V.; Compaan, A. D.; Grice, C. R.; Kwon, D.;
By: Mahabaduge, H.; Paudel, N. R.; Stayancho, J. M.; Carter, C. W.; Plotnikov, V. V.; Compaan, A. D.; Grice, C. R.; Kwon, D.;