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Topic: Transition-edge Sensor
Results
2003 / IEEE
By: Lee, A.T.; Lanting, T.M.; Clarke, J.; Labov, S.E.; Miyazaki, T.; Richards, P.L.; Ullom, J.N.; Spieler, H.; Cunningham, M.F.; Jongsoo Yoon;
By: Lee, A.T.; Lanting, T.M.; Clarke, J.; Labov, S.E.; Miyazaki, T.; Richards, P.L.; Ullom, J.N.; Spieler, H.; Cunningham, M.F.; Jongsoo Yoon;
2003 / IEEE
By: de Korte, P.A.J.; Beyer, J.; Irwin, K.D.; Vale, L.R.; Hilton, G.C.; MacIntosh, M.; Nam, S.W.; Reintsema, C.D.;
By: de Korte, P.A.J.; Beyer, J.; Irwin, K.D.; Vale, L.R.; Hilton, G.C.; MacIntosh, M.; Nam, S.W.; Reintsema, C.D.;
2009 / IEEE
By: Crites, A.T.; Bleem, L.; McMahon, J.; Downes, T.P.; Chang, C.L.; Divan, R.; Meyer, S.S.; Pearson, J.E.; Datesman, A.M.; Novosad, V.; Gensheng Wang; Yefremenko, V.; Carlstrom, J.E.;
By: Crites, A.T.; Bleem, L.; McMahon, J.; Downes, T.P.; Chang, C.L.; Divan, R.; Meyer, S.S.; Pearson, J.E.; Datesman, A.M.; Novosad, V.; Gensheng Wang; Yefremenko, V.; Carlstrom, J.E.;
2009 / IEEE
By: Kelley, R.L.; Finkbeiner, F.M.; Figueroa-Feliciano, E.; Eckart, M.E.; Chervenak, J.A.; Brown, A.-D.; Kilbourne, C.A.; Bandler, S.R.; Smith, S.J.; Sadleir, J.E.; Brekosky, R.P.; Porter, F.S.;
By: Kelley, R.L.; Finkbeiner, F.M.; Figueroa-Feliciano, E.; Eckart, M.E.; Chervenak, J.A.; Brown, A.-D.; Kilbourne, C.A.; Bandler, S.R.; Smith, S.J.; Sadleir, J.E.; Brekosky, R.P.; Porter, F.S.;
2009 / IEEE
By: Chang, C.L.; Logan, D.W.; Novosad, V.; Pearson, J.E.; Yefremenko, V.G.; Gensheng Wang; Perera, T.A.; Downes, T.P.; Datesman, A.M.; Carlstrom, J.E.; McMahon, J.J.; Crites, A.T.; Divan, R.; Bleem, L.E.; Wilson, G.W.; Meyer, S.S.;
By: Chang, C.L.; Logan, D.W.; Novosad, V.; Pearson, J.E.; Yefremenko, V.G.; Gensheng Wang; Perera, T.A.; Downes, T.P.; Datesman, A.M.; Carlstrom, J.E.; McMahon, J.J.; Crites, A.T.; Divan, R.; Bleem, L.E.; Wilson, G.W.; Meyer, S.S.;
2011 / IEEE
By: Ezoe, Y.; Tanaka, K.; Morooka, T.; Mitsuda, K.; Sekiya, N.; Yoshitake, H.; Ohashi, T.; Abe, Y.; Oishi, S.; Ishisaki, Y.;
By: Ezoe, Y.; Tanaka, K.; Morooka, T.; Mitsuda, K.; Sekiya, N.; Yoshitake, H.; Ohashi, T.; Abe, Y.; Oishi, S.; Ishisaki, Y.;
2011 / IEEE
By: George, E.M.; Lueker, M.; Holzapfel, W.L.; Irwin, K.D.; Yoon, K.W.; Ullom, J.N.; Shirokoff, E.; Niemack, M.D.; Lowell, P.; Hubmayr, J.; Cho, H.-M.; Schmidt, D.R.; O'Neil, G.C.;
By: George, E.M.; Lueker, M.; Holzapfel, W.L.; Irwin, K.D.; Yoon, K.W.; Ullom, J.N.; Shirokoff, E.; Niemack, M.D.; Lowell, P.; Hubmayr, J.; Cho, H.-M.; Schmidt, D.R.; O'Neil, G.C.;
2011 / IEEE
By: van Leeuwen, B.; van der Kuur, J.; de Korte, P.; Kiviranta, M.; Rui Hou; Hoevers, H.; Lindeman, M.; Bruijn, M.; Boersma, D.; Beyer, J.; den Hartog, R.H.; Gottardi, L.; Nieuwenhuizen, A.;
By: van Leeuwen, B.; van der Kuur, J.; de Korte, P.; Kiviranta, M.; Rui Hou; Hoevers, H.; Lindeman, M.; Bruijn, M.; Boersma, D.; Beyer, J.; den Hartog, R.H.; Gottardi, L.; Nieuwenhuizen, A.;
Analytical solutions for the design and evaluation of absorber-coupled waveguide bolometer detectors
2011 / IEEE / 978-1-61284-757-3By: Novosad, V.; Gensheng Wang; Yefremenko, V.; Weikle, R.; Bleem, L.; McMahon, J.; Chang, C.; Carlstrom, J.; Meyer, S.; Datesman, A.; Mehl, J.; Crites, A.;
2008 / Springer Science+Business Media / 0022-2291
By: T. Yoshino; K. Mukai; Y. Ezoe; N. Yamasaki; K. Mitsuda; H. Kurabayashi; Y. Ishisaki; T. Takano; R. Maeda;
By: T. Yoshino; K. Mukai; Y. Ezoe; N. Yamasaki; K. Mitsuda; H. Kurabayashi; Y. Ishisaki; T. Takano; R. Maeda;
2008 / Springer Science+Business Media / 0022-2291
By: Fumiakira Mori; Yasuhiro Minamikawa; Tomoya Uruga; Hajime Tanida; Hidenori Toyokawa; Hiroyuki Takahashi; Masashi Ohno; Nobuyuki Zen; R. Thushara Damayanthi; Steven Leman;
By: Fumiakira Mori; Yasuhiro Minamikawa; Tomoya Uruga; Hajime Tanida; Hidenori Toyokawa; Hiroyuki Takahashi; Masashi Ohno; Nobuyuki Zen; R. Thushara Damayanthi; Steven Leman;
2008 / Springer Science+Business Media / 0022-2291
By: M. Kenyon; P. Day; C. Bradford; J. Bock; H. Leduc;
By: M. Kenyon; P. Day; C. Bradford; J. Bock; H. Leduc;
2008 / Springer Science+Business Media / 0022-2291
By: C. Kilbourne; S. Bandler; S. Smith; F. Porter; R. Kelley; N. Iyomoto; F. Finkbeiner; E. Figueroa-Feliciano; J. Chervenak; A.-D. Brown;
By: C. Kilbourne; S. Bandler; S. Smith; F. Porter; R. Kelley; N. Iyomoto; F. Finkbeiner; E. Figueroa-Feliciano; J. Chervenak; A.-D. Brown;
2008 / Springer Science+Business Media / 0022-2291
By: W. Doriese; J. Ullom; F. Porter; J. King; L. Brown; K. Boyce; C. Kilbourne; M. Rabin; C. Rudy; J. Beall; W. Duncan; L. Ferreira; G. Hilton; R. Horansky; K. Irwin; J. Mates; C. Reintsema; D. Schmidt; L. Vale; Y. Xu; B. Zink; M. Bacrania; A. Hoover;
By: W. Doriese; J. Ullom; F. Porter; J. King; L. Brown; K. Boyce; C. Kilbourne; M. Rabin; C. Rudy; J. Beall; W. Duncan; L. Ferreira; G. Hilton; R. Horansky; K. Irwin; J. Mates; C. Reintsema; D. Schmidt; L. Vale; Y. Xu; B. Zink; M. Bacrania; A. Hoover;