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Topic: Three-phase System
Results
2011 / IEEE / 978-90-75815-14-6
By: Heldwein, M.L.; Mussa, S.A.; Jappe, T.K.; Castillo, A.; Caballero, D.R.;
By: Heldwein, M.L.; Mussa, S.A.; Jappe, T.K.; Castillo, A.; Caballero, D.R.;
Power Hardware-in-the-Loop Testing of an Air Coil Superconducting Fault Current Limiter Demonstrator
2015 / IEEEBy: Edrington, C.; Paran, S.; Fleming, F.; Steurer, M.; Langston, J.; Naeckel, O.; Noe, M.;
2001 / IEEE / 0-7803-7067-8
By: da Silva, E.R.C.; Lima, A.M.N.; Pinheiro, R.F.; Correa, M.B.R.; Jacobina, C.B.;
By: da Silva, E.R.C.; Lima, A.M.N.; Pinheiro, R.F.; Correa, M.B.R.; Jacobina, C.B.;
2001 / IEEE / 0-7803-7139-9
By: Belmans, R.J.M.; Driesen, J.J.L.; De Brabandere, K.M.H.A.; Macken, K.J.P.;
By: Belmans, R.J.M.; Driesen, J.J.L.; De Brabandere, K.M.H.A.; Macken, K.J.P.;
2005 / IEEE
By: Tae-Hyun Sung; Ok-Bae Hyun; Byoung-Sung Han; Dong-Chul Chung; Sung-Hun Lim; Hyo-Sang Choi; Jong-Sun Hwang;
By: Tae-Hyun Sung; Ok-Bae Hyun; Byoung-Sung Han; Dong-Chul Chung; Sung-Hun Lim; Hyo-Sang Choi; Jong-Sun Hwang;
2007 / IEEE / 978-1-4244-0812-2
By: Lee, S.; Birenbaum, L.; Ten-Ami, Y.; Czarkowski, D.; Zabar, Z.; Sulawa, T.; Bury, W.E.;
By: Lee, S.; Birenbaum, L.; Ten-Ami, Y.; Czarkowski, D.; Zabar, Z.; Sulawa, T.; Bury, W.E.;
2007 / IEEE / 978-92-75815-10-8
By: Torrealday, J.R.; Oyarbide, E.; Rodriguez, M.A.; Aurtenechea, S.;
By: Torrealday, J.R.; Oyarbide, E.; Rodriguez, M.A.; Aurtenechea, S.;
2007 / IEEE / 978-92-75815-10-8
By: Naouar, M.W.; Abdellatif, M.; Monmasson, E.; Slama-Belkhodja, I.;
By: Naouar, M.W.; Abdellatif, M.; Monmasson, E.; Slama-Belkhodja, I.;
2007 / IEEE / 978-92-75815-10-8
By: Arias, A.; Zaragoza, J.; Ceballos, S.; Robles, E.; Pou, J.; Ibanez, P.;
By: Arias, A.; Zaragoza, J.; Ceballos, S.; Robles, E.; Pou, J.; Ibanez, P.;
2008 / IEEE / 978-1-4244-1767-4
By: Guzman, J.I.; Moran, L.A.; Espinoza, J.R.; Baier, C.R.; Muoz, J.A.;
By: Guzman, J.I.; Moran, L.A.; Espinoza, J.R.; Baier, C.R.; Muoz, J.A.;
2009 / IEEE / 978-1-4244-4432-8
By: del Toro Garcia, X.; Roncero-Sanchez, P.; Batlle, V.F.; Parreo, A.;
By: del Toro Garcia, X.; Roncero-Sanchez, P.; Batlle, V.F.; Parreo, A.;
2009 / IEEE / 978-1-4244-4432-8
By: Naoussi, S.; Braun, F.; Kom, M.; Kom, C.-H.; Blonde, J.-P.; Berviller, H.;
By: Naoussi, S.; Braun, F.; Kom, M.; Kom, C.-H.; Blonde, J.-P.; Berviller, H.;
2009 / IEEE / 978-1-4244-2234-0
By: Cziker, A.; Chindris, M.; Chicco, G.; Toader, C.; Postolache, P.;
By: Cziker, A.; Chindris, M.; Chicco, G.; Toader, C.; Postolache, P.;